Patents by Inventor Chih-Hsiang Liu

Chih-Hsiang Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220362975
    Abstract: A molding apparatus is configured for molding a semiconductor device and includes a lower mold and an upper mold. The lower mold is configured to carry the semiconductor device. The upper mold is disposed above the lower mold for receiving the semiconductor device and includes a mold part and a dynamic part. The mold part is configured to cover the upper surface of the semiconductor device. The dynamic part is disposed around a device receiving region of the upper mold and configured to move relatively to the mold part. A molding method and a molded semiconductor device are also provided.
    Type: Application
    Filed: July 29, 2022
    Publication date: November 17, 2022
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sheng-Feng Weng, Ching-Hua Hsieh, Chung-Shi Liu, Chih-Wei Lin, Sheng-Hsiang Chiu, Yao-Tong Lai, Chia-Min Lin
  • Patent number: 11474144
    Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.
    Type: Grant
    Filed: June 19, 2020
    Date of Patent: October 18, 2022
    Assignee: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chung-Lun Kuo, Chih-Hsiang Liu, Shie-Chang Jeng
  • Patent number: 11446851
    Abstract: A molding apparatus is configured for molding a semiconductor device and includes a lower mold and an upper mold. The lower mold is configured to carry the semiconductor device. The upper mold is disposed above the lower mold for receiving the semiconductor device and includes a mold part and a dynamic part. The mold part is configured to cover the upper surface of the semiconductor device. The dynamic part is disposed around a device receiving region of the upper mold and configured to move relatively to the mold part. A molding method and a molded semiconductor device are also provided.
    Type: Grant
    Filed: April 29, 2019
    Date of Patent: September 20, 2022
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sheng-Feng Weng, Ching-Hua Hsieh, Chung-Shi Liu, Chih-Wei Lin, Sheng-Hsiang Chiu, Yao-Tong Lai, Chia-Min Lin
  • Publication number: 20220285168
    Abstract: In a method of forming a groove pattern extending in a first axis in an underlying layer over a semiconductor substrate, a first opening is formed in the underlying layer, and the first opening is extended in the first axis by directional etching to form the groove pattern.
    Type: Application
    Filed: May 23, 2022
    Publication date: September 8, 2022
    Inventors: Ru-Gun LIU, Chih-Ming LAI, Wei-Liang LIN, Yung-Sung YEN, Ken-Hsien HSIEH, Chin-Hsiang LIN
  • Patent number: 11422357
    Abstract: An optical system is provided and includes a fixed assembly, a movable element and a driving module. The fixed assembly has a main axis. The movable element is movable relative to the fixed assembly, and the movable element is connected to a first optical element. The driving module is configured to drive the movable element to move relative to the fixed assembly.
    Type: Grant
    Filed: January 23, 2020
    Date of Patent: August 23, 2022
    Assignee: TDK TAIWAN CORP.
    Inventors: Chao-Chang Hu, Che-Wei Chang, Chih-Wen Chiang, Chen-Er Hsu, Fu-Yuan Wu, Shou-Jen Liu, Chih-Wei Weng, Mao-Kuo Hsu, Hsueh-Ju Lu, Che-Hsiang Chiu
  • Publication number: 20220256113
    Abstract: A video signal conversion device includes a frontend interface circuit, a FPGA video processor and a backend interface circuit. The frontend interface circuit receives a HDR video input signal from a video transmitting device. The FPGA video processor outputs a SDR first video output signal. A video receiving device receives the first video output signal and a HDR second video output signal from the FPGA video processor through the video bridge controller of the backend interface circuit by PCI-E.
    Type: Application
    Filed: April 26, 2022
    Publication date: August 11, 2022
    Inventors: Ssu-Ming Cheng, Hong-Wei Liu, Chen-Hsiang Wu, Shi-Jie Lin, Yen-Cheng Yao, Chih-Sheng Wang
  • Publication number: 20220255368
    Abstract: The present disclosure provides a wireless charging switching method, which includes steps as follows. After a proximity sensor disposed in the central area of a coil senses an object, it is determined whether a power bus voltage of a wireless power transceiver electrically connected to the coil has reached a predetermined voltage value during a predetermined period, so as to determine a receiver mode or a transmitter mode for the wireless power transceiver.
    Type: Application
    Filed: April 8, 2021
    Publication date: August 11, 2022
    Inventors: Ke-Yang LAI, Chih-Yung WANG, Huang-Wei CHEN, Yung-Hsiang LIU
  • Patent number: 11248903
    Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.
    Type: Grant
    Filed: December 17, 2019
    Date of Patent: February 15, 2022
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chia-Hung Cho, Po-Yi Chang, Yi-Sha Ku, Kai-Ping Chuang, Chih-Hsiang Liu, Fu-Cheng Yang
  • Publication number: 20210231570
    Abstract: An inspection apparatus for inspecting a light-emitting diode wafer is provided. The inspection apparatus includes a Z-axis translation stage, a sensing probe, a height measurement module, a carrier, an illumination light source, and a processing device. The sensing probe is integrated with the Z-axis translation stage. The Z-axis translation stage is adapted to drive the sensing probe to move in a Z axis. The sensing probe includes a photoelectric sensor, a beam splitter, and a photoelectric sensing structure. One of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam penetrating the beam splitter, and the other one of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam reflected by the beam splitter. The carrier is configured to carry the light-emitting diode wafer. The illumination light source is configured to emit an illumination beam to irradiate the light-emitting diode wafer.
    Type: Application
    Filed: December 28, 2020
    Publication date: July 29, 2021
    Applicant: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chih-Hsiang Liu, Chung-Lun Kuo, Hsiang-Chun Wei, Yeou-Sung Lin, Chieh-Yi Lo
  • Publication number: 20210149337
    Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.
    Type: Application
    Filed: September 22, 2020
    Publication date: May 20, 2021
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hsiang-Chun WEI, Chung-Lun KUO, Chia-Hung CHO, Chun-Wei LO, Chih-Hsiang LIU
  • Patent number: 11002783
    Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.
    Type: Grant
    Filed: December 24, 2018
    Date of Patent: May 11, 2021
    Assignee: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chih-Hsiang Liu, Shie-Chang Jeng
  • Patent number: 11005559
    Abstract: A repeater includes an up-link circuit and a down-link circuit. The down-link circuit includes a receiver, a radio frequency circuit and a transmitter. The transmitter transmits the repeated second signals to the user equipment and includes an antenna array, a plurality of power amplifiers, a plurality of first phase shifters, a first memory unit, and a first control logic circuit. The antenna array includes a plurality of antenna elements arranged along a first direction, and the number of the plurality of antenna elements is at least four. The first memory unit is configured to store predetermined parameters associated with a predetermined radiation pattern. The first control logic circuit selects a first number of the power amplifiers and the first number of the first phase shifters, and sets normalized gains for the selected plurality of power amplifiers range from 0.7 to 1 unit.
    Type: Grant
    Filed: November 29, 2019
    Date of Patent: May 11, 2021
    Assignee: WISTRON NEWEB CORPORATION
    Inventors: Chih-Hsiang Liu, Tsun-Che Huang, Horen Chen
  • Publication number: 20210080252
    Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.
    Type: Application
    Filed: December 17, 2019
    Publication date: March 18, 2021
    Applicant: Industrial Technology Research Institute
    Inventors: Chia-Hung CHO, Po-Yi CHANG, Yi-Sha KU, Kai-Ping CHUANG, Chih-Hsiang LIU, Fu-Cheng YANG
  • Publication number: 20200371152
    Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.
    Type: Application
    Filed: June 19, 2020
    Publication date: November 26, 2020
    Applicant: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chung-Lun Kuo, Chih-Hsiang Liu, Shie-Chang Jeng
  • Patent number: 10847903
    Abstract: An antenna structure includes a holder and a first antenna assembly. The holder includes a first board, a second board, a third board, and a fourth board. The first board, the second board, the third board, and the fourth board are connected to each other to surround a surrounding space. The first antenna assembly includes a first antenna body and a second antenna body. The first antenna body and the second antenna body are disposed in the surrounding space. The first antenna body and the second antenna body respectively include a feeding portion, a conjoining portion, and a ground portion. The ground portion of the first antenna body is connected to the first board. The ground portion of the second antenna body is connected to the second board.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: November 24, 2020
    Assignee: WISTRON NEWEB CORPORATION
    Inventors: Tsun-Che Huang, Chih-Hsiang Liu
  • Publication number: 20200274610
    Abstract: A repeater includes an up-link circuit and a down-link circuit. The down-link circuit includes a receiver, a radio frequency circuit and a transmitter. The transmitter transmits the repeated second signals to the user equipment and includes an antenna array, a plurality of power amplifiers, a plurality of first phase shifters, a first memory unit, and a first control logic circuit. The antenna array includes a plurality of antenna elements arranged along a first direction, and the number of the plurality of antenna elements is at least four. The first memory unit is configured to store predetermined parameters associated with a predetermined radiation pattern. The first control logic circuit selects a first number of the power amplifiers and the first number of the first phase shifters, and sets normalized gains for the selected plurality of power amplifiers range from 0.7 to 1 unit.
    Type: Application
    Filed: November 29, 2019
    Publication date: August 27, 2020
    Inventors: CHIH-HSIANG LIU, TSUN-CHE HUANG, HOREN CHEN
  • Publication number: 20200200817
    Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.
    Type: Application
    Filed: December 24, 2018
    Publication date: June 25, 2020
    Applicant: Industrial Technology Research Institute
    Inventors: Yan-Rung Lin, Chih-Hsiang Liu, Shie-Chang Jeng
  • Publication number: 20200091621
    Abstract: An antenna structure includes a holder and a first antenna assembly. The holder includes a first board, a second board, a third board, and a fourth board. The first board, the second board, the third board, and the fourth board are connected to each other to surround a surrounding space. The first antenna assembly includes a first antenna body and a second antenna body. The first antenna body and the second antenna body are disposed in the surrounding space. The first antenna body and the second antenna body respectively include a feeding portion, a conjoining portion, and a ground portion. The ground portion of the first antenna body is connected to the first board. The ground portion of the second antenna body is connected to the second board.
    Type: Application
    Filed: July 19, 2019
    Publication date: March 19, 2020
    Inventors: TSUN-CHE HUANG, CHIH-HSIANG LIU
  • Patent number: 9752866
    Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: September 5, 2017
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hsiang-Chun Wei, Yi-Sha Ku, Chia-Hung Cho, Chieh-Yu Wu, Chun-Wei Lo, Chih-Hsiang Liu
  • Patent number: D956943
    Type: Grant
    Filed: April 16, 2020
    Date of Patent: July 5, 2022
    Assignee: DELTA ELECTRONICS, INC.
    Inventors: Yu-Hsiang Huang, Chih-Hua Lin, Yan-Lin Chen, Yuan-Chuan Liu