Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.

Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.

Abstract: A repeater includes an up-link circuit and a down-link circuit. The down-link circuit includes a receiver, a radio frequency circuit and a transmitter. The transmitter transmits the repeated second signals to the user equipment and includes an antenna array, a plurality of power amplifiers, a plurality of first phase shifters, a first memory unit, and a first control logic circuit. The antenna array includes a plurality of antenna elements arranged along a first direction, and the number of the plurality of antenna elements is at least four. The first memory unit is configured to store predetermined parameters associated with a predetermined radiation pattern. The first control logic circuit selects a first number of the power amplifiers and the first number of the first phase shifters, and sets normalized gains for the selected plurality of power amplifiers range from 0.7 to 1 unit.

Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.

Abstract: An antenna structure includes a holder and a first antenna assembly. The holder includes a first board, a second board, a third board, and a fourth board. The first board, the second board, the third board, and the fourth board are connected to each other to surround a surrounding space. The first antenna assembly includes a first antenna body and a second antenna body. The first antenna body and the second antenna body are disposed in the surrounding space. The first antenna body and the second antenna body respectively include a feeding portion, a conjoining portion, and a ground portion. The ground portion of the first antenna body is connected to the first board. The ground portion of the second antenna body is connected to the second board.

Abstract: A repeater includes an up-link circuit and a down-link circuit. The down-link circuit includes a receiver, a radio frequency circuit and a transmitter. The transmitter transmits the repeated second signals to the user equipment and includes an antenna array, a plurality of power amplifiers, a plurality of first phase shifters, a first memory unit, and a first control logic circuit. The antenna array includes a plurality of antenna elements arranged along a first direction, and the number of the plurality of antenna elements is at least four. The first memory unit is configured to store predetermined parameters associated with a predetermined radiation pattern. The first control logic circuit selects a first number of the power amplifiers and the first number of the first phase shifters, and sets normalized gains for the selected plurality of power amplifiers range from 0.7 to 1 unit.

Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.

Abstract: An antenna structure includes a holder and a first antenna assembly. The holder includes a first board, a second board, a third board, and a fourth board. The first board, the second board, the third board, and the fourth board are connected to each other to surround a surrounding space. The first antenna assembly includes a first antenna body and a second antenna body. The first antenna body and the second antenna body are disposed in the surrounding space. The first antenna body and the second antenna body respectively include a feeding portion, a conjoining portion, and a ground portion. The ground portion of the first antenna body is connected to the first board. The ground portion of the second antenna body is connected to the second board.

Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.

Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.

Abstract: The present invention provides an electronic charging cup assembly, including an electronic charging cup and charging cup holder. The electronic charging cup is provided with an embedded cell module and a button set, so that the cell module supplies sufficient power to the linear conducting strip covering the cup core. Since the cell module is a rechargeable cell structure, it is only required to place the electronic charging cup into the charging cup holder in the event of electric exhaustion of cell module, thereby achieving the purpose of additional power supply with improved applicability.

Abstract: The present invention provides a thermos bag, which includes a container bag and an built-in thermos device. The thermos device includes a frame, a conductive plate, a printed electrothermal plate, an automatic temperature control device, an insulating lining and a bottom plate as a cover unit. After placing it inside the container bag, with the fixation ring sleeve, foot mount and bolts, it is positioned between the thermos device and container bag. The thermos bag made of this structure provide provides the traveler with a thermos bag that is easy to assemble, easy to carry, energy saving and easy to take off for cleaning.

Abstract: A travel mug has an outer case, an inner case, a film heater, a temperature control device, and a power source connector. The inner case is fitted into the outer case in conjunction with a spacer, thereby resulting in formation of an air space insulation between the inner case and the outer case. The film heater is fastened to the bottom end of the inner case and is connected to an electrical receptacle of the outer case by a wire which is also connected with the temperature control device located in proximity of the film heater. The receptacle is connected to a power source by the power source connector.