Patents by Inventor Chih-Yu Tseng
Chih-Yu Tseng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240105775Abstract: A method for forming a semiconductor device structure is provided. The method includes forming a first source/drain structure and a second source/drain structure over and in a substrate. The method includes forming a first gate stack, a second gate stack, a third gate stack, and a fourth gate stack over the substrate. Each of the first gate stack or the second gate stack is wider than each of the third gate stack or the fourth gate stack. The method includes forming a first contact structure and a second contact structure over the first source/drain structure and the second source/drain structure respectively. A first average width of the first contact structure is substantially equal to a second average width of the second contact structure.Type: ApplicationFiled: February 9, 2023Publication date: March 28, 2024Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chung-Yu CHIANG, Hsiao-Han LIU, Yuan-Hung TSENG, Chih-Yung LIN
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Publication number: 20240096705Abstract: A semiconductor device includes a plurality of channel layers vertically separated from one another. The semiconductor device also includes an active gate structure comprising a lower portion and an upper portion. The lower portion wraps around each of the plurality of channel layers. The semiconductor device further includes a gate spacer extending along a sidewall of the upper portion of the active gate structure. The gate spacer has a bottom surface. Moreover, a dummy gate dielectric layer is disposed between the gate spacer and a topmost channel layer of plurality of channel layers. The dummy gate dielectric layer is in contact with a top surface of the topmost channel layer, the bottom surface of the gate spacer, and the sidewall of the gate structure.Type: ApplicationFiled: November 30, 2023Publication date: March 21, 2024Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Kuei-Yu Kao, Chen-Yui Yang, Hsien-Chung Huang, Chao-Cheng Chen, Shih-Yao Lin, Chih-Chung Chiu, Chih-Han Lin, Chen-Ping Chen, Ke-Chia Tseng, Ming-Ching Chang
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Publication number: 20240088182Abstract: In some embodiments, an image sensor is provided. The image sensor includes a photodetector disposed in a semiconductor substrate. A wave guide filter having a substantially planar upper surface is disposed over the photodetector. The wave guide filter includes a light filter disposed in a light filter grid structure. The light filter includes a first material that is translucent and has a first refractive index. The light filter grid structure includes a second material that is translucent and has a second refractive index less than the first refractive index.Type: ApplicationFiled: November 21, 2023Publication date: March 14, 2024Inventors: Cheng Yu Huang, Chun-Hao Chuang, Chien-Hsien Tseng, Kazuaki Hashimoto, Keng-Yu Chou, Wei-Chieh Chiang, Wen-Chien Yu, Ting-Cheng Chang, Wen-Hau Wu, Chih-Kung Chang
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Patent number: 11908796Abstract: A semiconductor device includes a substrate, a first metal layer, a dielectric layer, and a second metal layer. The substrate includes a dense region and an isolation region. The first metal layer is disposed over the substrate and includes a first metal pattern and a second metal pattern. The first metal pattern is located in the dense region. There is at least one slot in the first metal pattern. The second metal pattern is located in the isolation region. The dielectric layer is disposed on the first metal layer. The second metal layer is disposed on the dielectric layer.Type: GrantFiled: August 30, 2021Date of Patent: February 20, 2024Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chih-Yu Tseng, Wei-Lun Hu
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Patent number: 11791354Abstract: Disclosed is a CMOS image sensor with global shutters and a method for fabricating the CMOS image sensor. In one embodiment, a semiconductor device, includes: a light-sensing region; a charge-storage region; a light-shielding structure; and at least one via contact; wherein the charge-storage region is spatially configured adjacent to the light-sensing region in a lateral direction, wherein the light-shielding structure is configured over the charge-storage region in a vertical direction so as to prevent incident light leaking from the light-sensing region to the signal-processing region, wherein the light-shielding structure is configured in an interlayer dielectric (ILD) layer, and wherein the light-shielding structure is simultaneously formed with the at least one via contact.Type: GrantFiled: May 8, 2020Date of Patent: October 17, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chih-Yu Tseng, Ming-Hsien Chen
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Publication number: 20230261087Abstract: A semiconductor device includes an active area with a source and a drain, a gate oxide disposed on a portion of the active area between the source and the drain, and a gate is disposed over the gate oxide. In a noise suppressing structure, edge oxide regions are disposed on the gate oxide with edges of the edge oxide regions coinciding with the active area edges, and the gate is disposed over the edge oxide regions. In another noise suppressing structure, first and second active area edge extensions of respective first and second active area edges increase a width in the transverse direction of the active area at the edge extensions to a width greater than a minimum width of the active area in the transverse direction. The gate does not completely cover the first and second active area edge extensions along the channel direction.Type: ApplicationFiled: February 15, 2022Publication date: August 17, 2023Inventors: Chih-Yu Tseng, Chung-Wen Weng
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Publication number: 20230065711Abstract: A semiconductor device includes a substrate, a first metal layer, a dielectric layer, and a second metal layer. The substrate includes a dense region and an isolation region. The first metal layer is disposed over the substrate and includes a first metal pattern and a second metal pattern. The first metal pattern is located in the dense region. There is at least one slot in the first metal pattern. The second metal pattern is located in the isolation region. The dielectric layer is disposed on the first metal layer. The second metal layer is disposed on the dielectric layer.Type: ApplicationFiled: August 30, 2021Publication date: March 2, 2023Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chih-Yu Tseng, Wei-Lun Hu
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Publication number: 20220384506Abstract: Disclosed is a CMOS image sensor with global shutters and a method for fabricating the CMOS image sensor. In one embodiment, a semiconductor device, includes: a light-sensing region; a charge-storage region; a light-shielding structure; and at least one via contact; wherein the charge-storage region is spatially configured adjacent to the light-sensing region in a lateral direction, wherein the light-shielding structure is configured over the charge-storage region in a vertical direction so as to prevent incident light leaking from the light-sensing region to the signal-processing region, wherein the light-shielding structure is configured in an interlayer dielectric (ILD) layer, and wherein the light-shielding structure is simultaneously formed with the at least one via contact.Type: ApplicationFiled: August 9, 2022Publication date: December 1, 2022Inventors: Chih-Yu TSENG, Ming-Hsien Chen
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Publication number: 20210351215Abstract: Disclosed is a CMOS image sensor with global shutters and a method for fabricating the CMOS image sensor. In one embodiment, a semiconductor device, includes: a light-sensing region; a charge-storage region; a light-shielding structure; and at least one via contact; wherein the charge-storage region is spatially configured adjacent to the light-sensing region in a lateral direction, wherein the light-shielding structure is configured over the charge-storage region in a vertical direction so as to prevent incident light leaking from the light-sensing region to the signal-processing region, wherein the light-shielding structure is configured in an interlayer dielectric (ILD) layer, and wherein the light-shielding structure is simultaneously formed with the at least one via contact.Type: ApplicationFiled: May 8, 2020Publication date: November 11, 2021Inventors: Chih-Yu TSENG, Ming-Hsien CHEN
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Patent number: 10157981Abstract: Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a substrate, a first conductive type well region in the substrate, and a second conductive type well region in the substrate. The first conductive type is different from the second conductive type. The first conductive type well region partially overlaps the second conductive type well region in an overlapping region. The semiconductor device structure also includes a source portion in the first conductive type well region and a drain portion in the second conductive type well region. The semiconductor device structure further includes a gate structure over the substrate and the overlapping region, and between the source portion and the drain portion. The semiconductor device structure further includes a first conductive type doping region in the first conductive type well region and the overlapping region.Type: GrantFiled: July 18, 2017Date of Patent: December 18, 2018Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Chih-Yu Tseng, Chia-Pin Hung, Ming-Hsien Chen
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Patent number: 9041155Abstract: A semiconductor structure includes a first capacitor and a second capacitor. The first capacitor includes a plurality of first units and each first unit includes a plurality of first finger electrodes. The second capacitor includes a plurality of second units and each second unit includes a plurality of second finger electrodes. The first units and the second units are alternately arranged to form an array. The semiconductor structure further includes a plurality of first connecting lines and a plurality of second connecting lines being parallel with each other. The first connecting lines are electrically connected to the first finger electrodes, and the second connecting lines are electrically connected to the second finger electrodes. The first finger electrodes and its adjacent first connecting lines form a straight line, and the second finger electrodes and its adjacent second connecting lines form another straight line.Type: GrantFiled: September 9, 2013Date of Patent: May 26, 2015Assignee: UNITED MICROELECTRONICS CORP.Inventors: Chao-Sheng Cheng, Kai-Ling Chiu, Chih-Yu Tseng
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Patent number: 8912844Abstract: The present invention provides a semiconductor structure, including a substrate, a first TSV, an inductor and a capacitor. The first TSV is disposed in the substrate and has a first signal. The inductor is disposed in the substrate. The capacitor is electrically connected to the inductor to form an LC circuit to bypass the noise from the first signal. The present invention further provides a method of reducing the signal noise in a semiconductor structure.Type: GrantFiled: October 9, 2012Date of Patent: December 16, 2014Assignee: United Microelectronics Corp.Inventors: Tzung-Lin Li, Chun-Chang Wu, Chih-Yu Tseng
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Patent number: 8716802Abstract: A semiconductor device structure including a substrate, a resistor, and a first gate structure is provided. The substrate includes a resistor region and a metal-oxide-semiconductor (MOS) transistor region. The resistor is disposed on the substrate within the resistor region. The resistor includes a first dielectric layer, a metal layer, a second dielectric layer, and a semiconductor layer sequentially stacked on the substrate. The first gate structure is disposed on the substrate within the MOS transistor region. The first gate structure includes the first dielectric layer, the metal layer, and the semiconductor layer sequentially stacked on the substrate.Type: GrantFiled: August 9, 2010Date of Patent: May 6, 2014Assignee: United Microelectronics Corp.Inventors: Kai-Ling Chiu, Chih-Yu Tseng, Victor Chiang Liang, You-Ren Liu, Chih-Chen Hsueh
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Publication number: 20140097890Abstract: The present invention provides a semiconductor structure, including a substrate, a first TSV, an inductor and a capacitor. The first TSV is disposed in the substrate and has a first signal. The inductor is disposed in the substrate. The capacitor is electrically connected to the inductor to form an LC circuit to bypass the noise from the first signal. The present invention further provides a method of reducing the signal noise in a semiconductor structure.Type: ApplicationFiled: October 9, 2012Publication date: April 10, 2014Applicant: UNITED MICROELECTRONICS CORP.Inventors: Tzung-Lin Li, Chun-Chang Wu, Chih-Yu Tseng
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Patent number: 8664705Abstract: A MOS capacitor includes a substrate, a p-type MOS (pMOS) transistor positioned on the substrate, and an n-type MOS (nMOS) transistor positioned on the substrate. More important, the pMOS transistor and the nMOS transistor are electrically connected in parallel. The MOS transistor further includes a deep n-well that encompassing the pMOS transistor and the nMOS transistor.Type: GrantFiled: May 29, 2012Date of Patent: March 4, 2014Assignee: United Microelectronics Corp.Inventors: Kai-Ling Chiu, Chao-Sheng Cheng, Chih-Yu Tseng, Yu-Jen Liu
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Patent number: 8637936Abstract: A resistor is disclosed. The resistor is disposed on a substrate, in which the resistor includes: a dielectric layer disposed on the substrate; a polysilicon structure disposed on the dielectric layer; two primary resistance structures disposed on the dielectric layer and at two ends of the polysilicon structure; and a plurality of secondary resistance structures disposed on the dielectric layer and interlaced with the polysilicon structures.Type: GrantFiled: September 25, 2009Date of Patent: January 28, 2014Assignee: United Microelectronics Corp.Inventors: Kai-Ling Chiu, Victor-Chiang Liang, Chih-Yu Tseng, Kun-Szu Tseng, Cheng-Wen Fan, Hsin-Kai Chiang, Chih-Chen Hsueh
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Publication number: 20140008762Abstract: A semiconductor structure includes a first capacitor and a second capacitor. The first capacitor includes a plurality of first units and each first unit includes a plurality of first finger electrodes. The second capacitor includes a plurality of second units and each second unit includes a plurality of second finger electrodes. The first units and the second units are alternately arranged to form an array. The semiconductor structure further includes a plurality of first connecting lines and a plurality of second connecting lines being parallel with each other. The first connecting lines are electrically connected to the first finger electrodes, and the second connecting lines are electrically connected to the second finger electrodes. The first finger electrodes and its adjacent first connecting lines form a straight line, and the second finger electrodes and its adjacent second connecting lines form another straight line.Type: ApplicationFiled: September 9, 2013Publication date: January 9, 2014Applicant: UNITED MICROELECTRONICS CORP.Inventors: Chao-Sheng Cheng, Kai-Ling Chiu, Chih-Yu Tseng
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Publication number: 20130320421Abstract: A MOS capacitor includes a substrate, a p-type MOS (pMOS) transistor positioned on the substrate, and an n-type MOS (nMOS) transistor positioned on the substrate. More important, the pMOS transistor and the nMOS transistor are electrically connected in parallel. The MOS transistor further includes a deep n-well that encompassing the pMOS transistor and the nMOS transistor.Type: ApplicationFiled: May 29, 2012Publication date: December 5, 2013Inventors: Kai-Ling Chiu, Chao-Sheng Cheng, Chih-Yu Tseng, Yu-Jen Liu
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Patent number: 8558346Abstract: A semiconductor structure includes a first capacitor and a second capacitor. The first capacitor includes a plurality of first units and each first unit includes a plurality of first finger electrodes. The second capacitor includes a plurality of second units and each second unit includes a plurality of second finger electrodes. The first units and the second units are alternately arranged to form an array. The semiconductor structure further includes a plurality of first connecting lines and a plurality of second connecting lines being parallel with each other. The first connecting lines are electrically connected to the first finger electrodes, and the second connecting lines are electrically connected to the second finger electrodes. The first finger electrodes and its adjacent first connecting lines form a straight line, and the second finger electrodes and its adjacent second connecting lines form another straight line.Type: GrantFiled: June 26, 2012Date of Patent: October 15, 2013Assignee: United Microelectronics Corp.Inventors: Chao-Sheng Cheng, Kai-Ling Chiu, Chih-Yu Tseng
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Patent number: 8507987Abstract: A radio frequency (RF) device that can achieve high frequency response while maintaining high output impedance and high breakdown voltage includes a substrate, a gate, at least a dummy gate, at least a doped region, a source region and a drain region. The substrate includes a well of first type and a well of second type. The well of second type is adjacent to the well of first type.Type: GrantFiled: September 21, 2009Date of Patent: August 13, 2013Assignee: United Microelectronics Corp.Inventors: Sheng-Yi Huang, Cheng-Chou Hung, Tzung-Lin Li, Chin-Lan Tseng, Victor-Chiang Liang, Chih-Yu Tseng