Abstract: The present invention provides a probe card comprising a probe base, at least one impedance-matching probes, and a plurality of first probes. The probe base has a probing side and a tester side opposite to the probing side. Each impedance-matching probe has a probing part and a signal transmitting part electrically coupled to the probing part, wherein one end of the signal transmitting part is arranged at tester side, and the signal transmitting part has a central probing axis. Each first probe has a probing tip and a cantilever part coupled to the probing tip, wherein the cantilever part is coupled to the probe base and has a first central axis such that an included angle is formed between the central probing axis and the first central axis.

Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

Abstract: A battery regenerative strength control method for an electric vehicle is provided. The method includes: in an initial stage, gradually adjusting a current regenerative strength; in a real-time adjustment stage, dynamically adjusting the current regenerative strength; calculating a corrected regenerative strength according to a historical data when a current time point reaches at least one correction check point; and comparing the corrected regenerative strength with the current regenerative strength to decide whether to update the current regenerative strength.

Abstract: A balance charging method and a charging device are provided. The method includes: obtaining a voltage parameter of a plurality of battery cells; determining a control parameter set according to a first value relationship between the voltage parameter and a plurality of first threshold values, wherein the control parameter set includes a plurality of second threshold values; determining a charging rule of balance charging according to a second value relationship between the voltage parameter and the second threshold values; and performing the balance charging on the battery cells according to the charging rule.

Abstract: The present invention provides a probe card comprising a probe base, at least one impedance-matching probes, and a plurality of first probes. The probe base has a probing side and a tester side opposite to the probing side. Each impedance-matching probe has a probing part and a signal transmitting part electrically coupled to the probing part, wherein one end of the signal transmitting part is arranged at tester side, and the signal transmitting part has a central probing axis. Each first probe has a probing tip and a cantilever part coupled to the probing tip, wherein the cantilever part is coupled to the probe base and has a first central axis such that an included angle is formed between the central probing axis and the first central axis.

Abstract: A balance charging method and a charging device are provided. The method includes: obtaining a voltage parameter of a plurality of battery cells; determining a control parameter set according to a first value relationship between the voltage parameter and a plurality of first threshold values, wherein the control parameter set includes a plurality of second threshold values; determining a charging rule of balance charging according to a second value relationship between the voltage parameter and the second threshold values; and performing the balance charging on the battery cells according to the charging rule.

Abstract: A battery regenerative strength control method for an electric vehicle is provided. The method includes: in an initial stage, gradually adjusting a current regenerative strength; in a real-time adjustment stage, dynamically adjusting the current regenerative strength; calculating a corrected regenerative strength according to a historical data when a current time point reaches at least one correction check point; and comparing the corrected regenerative strength with the current regenerative strength to decide whether to update the current regenerative strength.

Abstract: A method for determining a state of charge adapted for a battery is provided, the method including: obtaining a plurality of discharge curves; determining that the battery is in a discharge mode; measuring a current C-rate and a current voltage of the battery in the discharge mode; selecting a first discharge curve and a second discharge curve from the plurality of discharge curves, wherein a first C-rate corresponding to the first discharge curve is greater than the current C-rate, and a second C-rate corresponding to the second discharge curve is less than the current C-rate; and calculating a state of charge of the battery according to the first discharge curve and the second discharge curve.

Abstract: Embodiments of the present disclosure provide a battery power estimating method. The method includes: performing a discharge operation of a battery; detecting, by an impedance component, a plurality of current values generated by the discharge operation of the battery during a time range, wherein the impedance component is coupled to a discharge path of the battery; obtaining a first average current value of the current values; obtaining a value distribution status of the current values; and estimating a remaining power of the battery according to the first average current value, the value distribution status and an initial power of the battery.

Abstract: A method for determining a state of charge adapted for a battery is provided, the method including: obtaining a plurality of discharge curves; determining that the battery is in a discharge mode; measuring a current C-rate and a current voltage of the battery in the discharge mode; selecting a first discharge curve and a second discharge curve from the plurality of discharge curves, wherein a first C-rate corresponding to the first discharge curve is greater than the current C-rate, and a second C-rate corresponding to the second discharge curve is less than the current C-rate; and calculating a state of charge of the battery according to the first discharge curve and the second discharge curve.

Abstract: Embodiments of the present disclosure provide a battery power estimating method. The method includes: performing a discharge operation of a battery; detecting, by an impedance component, a plurality of current values generated by the discharge operation of the battery during a time range, wherein the impedance component is coupled to a discharge path of the battery; obtaining a first average current value of the current values; obtaining a value distribution status of the current values; and estimating a remaining power of the battery according to the first average current value, the value distribution status and an initial power of the battery.

Abstract: A probe card includes a wiring board, a top cover, a retractable structure and a probe. The top cover couples with the wiring board and has an air inlet. The retractable structure connects with the top cover and includes a first and a second rings. The first ring has vent holes. A top surface of the first ring and a first bottom surface of the top cover define a homogenized space communicating with the air inlet and the vent holes. The second ring couples with the first ring and has jet holes communicating with the vent holes. Outlets of the jet holes locate on a second bottom surface of the second ring. A first inner sidewall of the first ring and a second inner sidewall of the second ring define a pressure space. The probe connects with the wiring board and extends to the pressure space.

Abstract: A coaxial probe card device includes a substrate, a plurality of probe holders, and a plurality of probes. The substrate has a through hole. The plurality of probe holders is disposed on the substrate and is configured in a radial manner surrounding the through hole by using the through hole of the substrate as a center. Each probe holder has a probe slot, and the probe slot is inclined with respect to a surface of the substrate and extends towards the through hole of the substrate. The probes are individually disposed in the probe slots of the probe holders.

Abstract: A probe card includes a wiring board, a top cover, a retractable structure and a probe. The top cover couples with the wiring board and has an air inlet. The retractable structure connects with the top cover and includes a first and a second rings. The first ring has vent holes. A top surface of the first ring and a first bottom surface of the top cover define a homogenized space communicating with the air inlet and the vent holes. The second ring couples with the first ring and has jet holes communicating with the vent holes. Outlets of the jet holes locate on a second bottom surface of the second ring. A first inner sidewall of the first ring and a second inner sidewall of the second ring define a pressure space. The probe connects with the wiring board and extends to the pressure space.

Abstract: A probe holding structure includes a substrate and a plurality of holding modules. The substrate has an opening and a plurality of grooves arranged around a periphery of the opening. The holding modules are connected with the grooves, respectively. Each holding modules includes a fixing member and a plurality of probes. The fixing member is connected with a corresponding groove. The probes are connected with the fixing member and pass through the corresponding groove. The probe holding structure is combined with a lens adjusting mechanism having a lens to form an optical inspection device for testing electric characteristics of chips.

Abstract: A high frequency probe card includes at least one substrate having at least one first opening, an interposing plate disposed on the at least one substrate and having at least one second opening corresponding to the at least one first opening, a circuit board disposed on the interposing plate and having a third opening corresponding to the at least one first and second openings, and at least one probe module including at least one ground probe and at least one high frequency signal probe passing through the corresponding substrate, the interposing plate and the third opening and being electrically connected with the circuit board. Each high frequency signal probe includes a signal probe and a first conductor corresponding to the signal probe and being electrically connected with the ground probe. An insulation layer is disposed between the first conductor and the signal probe.

Abstract: A high frequency probe card includes at least one substrate having at least one first opening, an interposing plate disposed on the at least one substrate and having at least one second opening corresponding to the at least one first opening, a circuit board disposed on the interposing plate and having a third opening corresponding to the at least one first and second openings, and at least one probe module including at least one N-type ground probe and at least one high frequency signal probe passing through the corresponding substrate, the interposing plate and the third opening and being electrically connected with the circuit board. Each high frequency signal probe includes an N-type signal probe and a first conductor corresponding to the N-type signal probe and being electrically connected with the N-type ground probe. An insulation layer is disposed between the first conductor and the N-type signal probe.

Abstract: An optical inspection device includes a circuit board having at least one first opening, a mounting plate disposed on a top or bottom surface of the circuit board and having at least one second opening corresponding to the at least one first opening respectively, at least one lens holder received in the at least one second opening, and at least one probe module disposed on a bottom surface of the mounting plate or the bottom surface of the circuit board, corresponding to the at least one lens holder respectively, and having probes electrically connected with the circuit board. Each lens holder has an accommodation for accommodating a lens, and is operatable to do a position adjusting motion in the corresponding second opening.

Abstract: A probe holding structure includes a substrate and a plurality of holding modules. The substrate has an opening and a plurality of grooves arranged around a periphery of the opening. The holding modules are connected with the grooves, respectively. Each holding modules includes a fixing member and a plurality of probes. The fixing member is connected with a corresponding groove. The probes are connected with the fixing member and pass through the corresponding groove. The probe holding structure is combined with a lens adjusting mechanism having a lens to form an optical inspection device for testing electric characteristics of chips.