Abstract: Apparatuses and processes for distributing signals in an integrated circuit are disclosed. An embodiment to use a custom layer together with a base layer on an integrated circuit for testing the integrated circuit includes having a structured network on the base layer. The custom layer connects the network to logic elements on the integrated circuit. The network may be evenly distributed across the base layer of the integrated circuit. Even distribution of the network may reduce skew of the test signals. Buffers are also placed along the structured network. The buffers may be placed to ensure a deterministic test signals distribution. Unused buffers in the base layer may be tied off to reduce current leakage.

Abstract: Techniques are provided for controlling an on-chip termination (OCT) in an output driver. The OCT control circuit calibrates the effective resistance of transistors in the output driver to match an external resistor using a feedback loop. The feedback loop monitors the output voltage and generates an analog calibration signal that varies the output impedance of a selected group of the output transistors that are enabled to drive the output terminal. Digital signals under the control of the user select the number of output transistors to be enabled based on the output driver requirements of the circuit. The analog calibration signal varies the signal level driving the selected output transistors to modify the effective output impedance of the circuit for better termination matching.

Abstract: A structured ASIC device includes highly flexible clock signal routing to peripheral IO circuitry of the device. A plurality of peripheral IO circuits are divided into subpluralities of adjacent ones of those circuits. Each subplurality has associated clock signal routing that is mask-programmable to supply any of a plurality of clock signals to any of the IO circuits in the subplurality. Core circuitry of the structured ASIC includes clock signal distribution circuitry, and that distribution circuitry can supply (via buffers associated with each subplurality) the same plurality of clock signals to the routing circuitry associated with all of the subpluralities.

Abstract: Clock distribution circuitry for a structured ASIC device includes a deterministic portion and configurable portions. The deterministic portion employs a predetermined arrangement of conductor segments and buffers for distributing a clock signal to a plurality of predetermined locations on the device. From each predetermined location, an associated configurable portion of the clock distribution circuitry distributes the clock signal to any clock utilization circuitry needing that clock signal in a predetermined area of the structured ASIC that is served from that predetermined location.

Abstract: Clock distribution circuitry for a structured ASIC device includes a deterministic portion and configurable portions. The deterministic portion employs a predetermined arrangement of conductor segments and buffers for distributing a clock signal to a plurality of predetermined locations on the device. From each predetermined location, an associated configurable portion of the clock distribution circuitry distributes the clock signal to any clock utilization circuitry needing that clock signal in a predetermined area of the structured ASIC that is served from that predetermined location.