Abstract: A voltage droop mitigation system, that includes a first processor core that executes computer executable components stored in a memory. A time-based sensor component generates digital data representing voltage values associated with a power supply. A filtering component digitally conditions the generated digital data, and an analysis component analyzes the conditioned data and determines slope of the power supply voltage and employs counters to determine rate of data change over time; and if the slope is negative and exceeds a first pre-determined value for a pre-determined time period. The system implements one or more voltage droop-reduction techniques at the first processor core; and the first processor core transmits at least one of the following types of information: its voltage value, slope information or decision to apply droop reduction to one or more other cores.

Abstract: Techniques facilitating voltage droop reduction and/or mitigation in a processor core are provided. In one example, a system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise an observation component that detects one or more events at a first stage of a processor pipeline. An event of the one or more events can be a defined event determined to increase a level of power consumed during a second stage of the processor pipeline. The computer executable components can also comprise an instruction component that applies a voltage droop mitigation countermeasure prior to the increase of the level of power consumed during the second stage of the processor pipeline and a feedback component that provides a notification to the instruction component that indicates a success or a failure of a result of the voltage droop mitigation countermeasure.

Abstract: The present invention provides a system and method of increasing the resolution of on-chip timing uncertainty measurements. In an embodiment, the system includes a set of delay circuits logically coupled in a chain configuration, a plurality of flip-flop circuits logically coupled to the delay output of the each of the delay circuits respectively, forming tiers of flip-flop circuits, a clock circuit logically coupled to each of the tiers of flip-flop circuits respectively, and where the plurality of flip-flop circuits is logically configured, in response to a delay input of a first delay circuit in the set of delay circuits receiving an output from a programmable delay circuit and in response to receiving skewed clock signals from the clock circuits, to indicate how far within the plurality of flip-flop circuits an edge signal transmitted from the delay output of the each of the delay circuits propagated, respectively.

Abstract: Techniques facilitating on-chip supply noise voltage reduction and/or mitigation using local detection loops in a processor core are provided. In one example, a computer-implemented method can comprise detecting, by a processor core, a voltage droop at a first area of the processor core. The computer-implemented method can also comprise transmitting, by the processor core, voltage droop information to a local controller located in the first area and to a global controller located in the processor core. Further, the computer-implemented method can comprise applying, by the processor core, a first mitigation countermeasure at the first area of the processor core in response to a local instruction received from the local controller. The local instruction can comprise an indication of the first mitigation countermeasure.

Abstract: Techniques facilitating on-chip supply noise voltage reduction and/or mitigation using local detection loops in a processor core are provided. In one example, a computer-implemented method can comprise detecting, by a processor core, a voltage droop at a first area of the processor core. The computer-implemented method can also comprise transmitting, by the processor core, voltage droop information to a local controller located in the first area and to a global controller located in the processor core. Further, the computer-implemented method can comprise applying, by the processor core, a first mitigation countermeasure at the first area of the processor core in response to a local instruction received from the local controller. The local instruction can comprise an indication of the first mitigation countermeasure.

Abstract: The present invention provides a system and method of increasing the resolution of on-chip timing uncertainty measurements. In an embodiment, the system includes a set of delay circuits logically coupled in a chain configuration, a plurality of flip-flop circuits logically coupled to the delay output of the each of the delay circuits respectively, forming tiers of flip-flop circuits, a clock circuit logically coupled to each of the tiers of flip-flop circuits respectively, and where the plurality of flip-flop circuits is logically configured, in response to a delay input of a first delay circuit in the set of delay circuits receiving an output from a programmable delay circuit and in response to receiving skewed clock signals from the clock circuits, to indicate how far within the plurality of flip-flop circuits an edge signal transmitted from the delay output of the each of the delay circuits propagated, respectively.

Abstract: A method for increasing a resolution of an on-chip measurement circuit is provided. The method includes propagating a first signal through the on-chip measurement circuit to generate a first output. The method also includes propagating a second signal through the on-chip measurement circuit to generate a second output. The second signal includes a delay. The method also includes reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit. The resolution of the on-chip measurement circuit increases in correspondence with a fineness of a step of the delay.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: A voltage droop mitigation system, that includes a first processor core that executes computer executable components stored in a memory. A time-based sensor component generates digital data representing voltage values associated with a power supply. A filtering component digitally conditions the generated digital data, and an analysis component analyzes the conditioned data and determines slope of the power supply voltage and employs counters to determine rate of data change over time; and if the slope is negative and exceeds a first pre-determined value for a pre-determined time period. The system implements one or more voltage droop-reduction techniques at the first processor core; and the first processor core transmits at least one of the following types of information: its voltage value, slope information or decision to apply droop reduction to one or more other cores.

Abstract: A voltage droop mitigation system, that includes a first processor core that executes computer executable components stored in a memory. A time-based sensor component generates digital data representing voltage values associated with a power supply. A filtering component digitally conditions the generated digital data, and an analysis component analyzes the conditioned data and determines slope of the power supply voltage and employs counters to determine rate of data change over time; and if the slope is negative and exceeds a first pre-determined value for a pre-determined time period. The system implements one or more voltage droop-reduction techniques at the first processor core; and the first processor core transmits at least one of the following types of information: its voltage value, slope information or decision to apply droop reduction to one or more other cores.

Abstract: A method for increasing a resolution of an on-chip measurement circuit is provided. The method includes propagating a first signal through the on-chip measurement circuit to generate a first output. The method also includes propagating a second signal through the on-chip measurement circuit to generate a second output. The second signal includes a delay. The method also includes reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit. The resolution of the on-chip measurement circuit increases in correspondence with a fineness of a step of the delay.

Abstract: An integrated circuit includes a test block which in turn includes a plurality of identical paths; a counter selectively coupled to the plurality of identical paths to selectively obtain a count of at least one of correctly operating paths and incorrectly operating paths from each of the plurality of identical paths; and a plurality of count latches selectively coupled to the counter to store output of the counter. Each path in turn includes a first clocked latch; a clocked logic path beginning and ending at the first clocked latch; and a clocked detection circuit coupled to the first clocked latch and the counter, which determines whether the clocked logic path is operating properly in a given clock period.

Abstract: A structure and method of testing degradation of semiconductor devices by stressing an array of several semiconductor devices at the same time and measuring the resulting degradation separately for each individual device to obtain an estimate of its expected lifetime is provided. The devices may be subjected to stress that is either in a pulsed state or in a DC state. An on-chip pulse generator may be used for stressing in the pulsed state.

Abstract: A pulse-drive resonant clock with on-the fly mode changing provides robust operation in a resonant clock distribution network, in particular for processor circuits having a dynamically-varied operating frequency. The clock drivers for the resonant clock distribution network include a pulse width control circuit having selectable operating modes corresponding to multiple clocking modes of the resonant clock distribution network. The pulse width control circuit includes a delay line that has a selectable delay length to provide pulse enable signals that control the pulse widths of the clock drivers in a sector of the resonant clock distribution network. The delay line responds to a mode control signal so that at least one pulse width of the output is changed from a first pulse width to a second pulse width without generating half-cycles with a pulse width narrower than the first or second pulse width.

Abstract: A pulse-drive resonant clock with on-the fly mode changing provides robust operation in a resonant clock distribution network, in particular for processor circuits having a dynamically-varied operating frequency. The clock drivers for the resonant clock distribution network include a pulse width control circuit having selectable operating modes corresponding to multiple clocking modes of the resonant clock distribution network. The pulse width control circuit includes a delay line that has a selectable delay length to provide pulse enable signals that control the pulse widths of the clock drivers in a sector of the resonant clock distribution network. The delay line responds to a mode control signal so that at least one pulse width of the output is changed from a first pulse width to a second pulse width without generating half-cycles with a pulse width narrower than the first or second pulse width.

Abstract: A pulse-drive resonant clock with on-the fly mode changing provides robust operation in a resonant clock distribution network, in particular for processor circuits having a dynamically-varied operating frequency. The clock drivers for the resonant clock distribution network include a pulse width control circuit having selectable operating modes corresponding to multiple clocking modes of the resonant clock distribution network. The pulse width control circuit includes a delay line that has a selectable delay length to provide pulse enable signals that control the pulse widths of the clock drivers in a sector of the resonant clock distribution network. The delay line responds to a mode control signal so that at least one pulse width of the output is changed from a first pulse width to a second pulse width without generating half-cycles with a pulse width narrower than the first or second pulse width.

Abstract: A pulse-drive resonant clock with on-the fly mode changing provides robust operation in a resonant clock distribution network, in particular for processor circuits having a dynamically-varied operating frequency. The clock drivers for the resonant clock distribution network include a pulse width control circuit having selectable operating modes corresponding to multiple clocking modes of the resonant clock distribution network. The pulse width control circuit includes a delay line that has a selectable delay length to provide pulse enable signals that control the pulse widths of the clock drivers in a sector of the resonant clock distribution network. The delay line responds to a mode control signal so that at least one pulse width of the output is changed from a first pulse width to a second pulse width without generating half-cycles with a pulse width narrower than the first or second pulse width.

Abstract: A structure and method of testing degradation of semiconductor devices by stressing an array of several semiconductor devices at the same time and measuring the resulting degradation separately for each individual device to obtain an estimate of its expected lifetime is provided. The devices may be subjected to stress that is either in a pulsed state or in a DC state. An on-chip pulse generator may be used for stressing in the pulsed state.

Abstract: An integrated circuit includes a test block which in turn includes a plurality of identical paths; a counter selectively coupled to the plurality of identical paths to selectively obtain a count of at least one of correctly operating paths and incorrectly operating paths from each of the plurality of identical paths; and a plurality of count latches selectively coupled to the counter to store output of the counter. Each path in turn includes a first clocked latch; a clocked logic path beginning and ending at the first clocked latch; and a clocked detection circuit coupled to the first clocked latch and the counter, which determines whether the clocked logic path is operating properly in a given clock period.