Abstract: A method forming a grating device includes: providing a substrate; entering the substrate into a process chamber; and depositing a grating material on the substrate to form a grating material layer on the substrate. A refractive index of the grating material gradually changes during depositing the grating material in the process chamber. The grating material layer includes a varying refractive index.

Abstract: An ambient light sensor includes a substrate, a metasurface disposed on the substrate, and an aperture layer disposed on the substrate. The metasurface includes a plurality of nanostructures and a filling layer laterally surrounding the plurality of nanostructures. The aperture layer laterally separates the metasurface into a plurality of sub-meta groups.

Abstract: In some implementations, one or more semiconductor processing tools may form a metal cap on a metal gate. The one or more semiconductor processing tools may form one or more dielectric layers on the metal cap. The one or more semiconductor processing tools may form a recess to the metal cap within the one or more dielectric layers. The one or more semiconductor processing tools may perform a bottom-up deposition of metal material on the metal cap to form a metal plug within the recess and directly on the metal cap.

Abstract: An electronic system with an expansion system is provided. The electronic system includes plural electronic devices. Each electronic device includes plural connecting interfaces. The plural electronic devices are combined together through the plural connecting interfaces.

Abstract: An input system includes a first input device and a second input device. Each of the first input device and the second input device includes a main body, a first connecting port, at least two second connecting ports, a power switching circuit and a control unit. When the first connecting port of the first input device is connected with an external power source, the power switching circuit of the first input device receives a first voltage from the external power source. When one of the second connecting ports of the first input device is connected with one of the second connecting ports of the second input device, the first voltage is converted into a second voltage by the power switching circuit of the first input device and the second voltage is transmitted to the second input device.

Abstract: An input system includes a first input device and a second input device. Each of the first input device and the second input device includes a main body, a first connecting port, at least two second connecting ports, a power switching circuit and a control unit. When the first connecting port of the first input device is connected with an external power source, the power switching circuit of the first input device receives a first voltage from the external power source. When one of the second connecting ports of the first input device is connected with one of the second connecting ports of the second input device, the first voltage is converted into a second voltage by the power switching circuit of the first input device and the second voltage is transmitted to the second input device.

Abstract: A color adjusting method for a color light-emitting element is provided. Firstly, a first white light beam is produced by red, green and blue light-emitting units collaboratively, and a second white light beam is produced by a white light-emitting unit. Then, a second chromaticity value corresponding to the second white light beam is acquired. Then, the red, green and blue light-emitting units are controlled to produce a third white light beam according to the second chromaticity value, and a first adjusting parameter is acquired. Then, the white light-emitting unit is controlled to produce a fourth white light beam according to a third luminance value corresponding to the third white light beam, and a second adjusting parameter is acquired. Then, a gray level adjustment process is performed according to the first and second adjusting parameters.

Abstract: A color adjusting method for a color light-emitting element is provided. Firstly, a first white light beam is produced by red, green and blue light-emitting units collaboratively, and a second white light beam is produced by a white light-emitting unit. Then, a second chromaticity value corresponding to the second white light beam is acquired. Then, the red, green and blue light-emitting units are controlled to produce a third white light beam according to the second chromaticity value, and a first adjusting parameter is acquired. Then, the white light-emitting unit is controlled to produce a fourth white light beam according to a third luminance value corresponding to the third white light beam, and a second adjusting parameter is acquired. Then, a gray level adjustment process is performed according to the first and second adjusting parameters.

Abstract: An input device includes a universal serial bus interface, a white light-emitting diode unit, a red light-emitting diode unit, a green light-emitting diode unit, a blue light-emitting diode unit and a driving part. The driving part receives electricity through the universal serial bus and drives at least one of the white light-emitting diode unit, the red light-emitting diode unit, the green light-emitting diode unit and the blue light-emitting diode unit to emit a light beam. Consequently, the light beam with a higher luminous intensity and a specified color is outputted from the input device.

Abstract: A method of processing FMCW radar signal retrieves a configuring parameter set (120) corresponding to a working environment or a detected material, receives a reflection time-domain signal, executes a time-domain-to-frequency-domain converting process to the reflection time-domain signal for obtaining a reflection frequency-domain signal, executes the corresponded process on the reflection frequency-domain signal according to the configuring parameter set (120), and analyzes the processed reflection frequency-domain signal and generates a detecting result. The present disclosed example can effectively reduce the time of the development and the cost of manufacture via executing the corresponded process according to the configuring parameter set (120) corresponding to the working environment or the detected material.

Abstract: A probe (14) of a material level measuring apparatus (10) inserts into a container (20). The material level measuring apparatus (10) transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (30), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (14), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t1) and a second time-passing difference value (t2) are obtained. According to the first time-passing difference value (t1), the second time-passing difference value (t2) and a predetermined empty container time-passing difference value (t3), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.

Abstract: A method of processing FMCW radar signal retrieves a configuring parameter set (120) corresponding to a working environment or a detected material, receives a reflection time-domain signal, executes a time-domain-to-frequency-domain converting process to the reflection time-domain signal for obtaining a reflection frequency-domain signal, executes the corresponded process on the reflection frequency-domain signal according to the configuring parameter set (120), and analyzes the processed reflection frequency-domain signal and generates a detecting result. The present disclosed example can effectively reduce the time of the development and the cost of manufacture via executing the corresponded process according to the configuring parameter set (120) corresponding to the working environment or the detected material.

Abstract: A material level indicator includes a probe, first and second signal compensating units, arranged at first and second ends of the probe respectively, and a controlling module arranged at the first end and includes a signal processor, a signal emitter, and a signal receiver. The second end is opposite to the first end. The signal processor is connected to the signal emitter and the signal receiver. The signal emitter emits an electromagnetic signal from the first end to the second end of the probe. The first and second signal compensating units reflect the electromagnetic signal, and the signal processor generates first and second time interval differences according to the reflected electromagnetic signal received by the signal receiver. The signal processor calibrates an environmental coefficient and indicates a dielectric coefficient of the material according to the first and second time interval differences respectively.

Abstract: A material level indicator includes a probe, first and second signal compensating units, arranged at first and second ends of the probe respectively, and a controlling module arranged at the first end and includes a signal processor, a signal emitter, and a signal receiver. The second end is opposite to the first end. The signal processor is connected to the signal emitter and the signal receiver. The signal emitter emits an electromagnetic signal from the first end to the second end of the probe. The first and second signal compensating units reflect the electromagnetic signal, and the signal processor generates first and second time interval differences according to the reflected electromagnetic signal received by the signal receiver. The signal processor calibrates an environmental coefficient and indicates a dielectric coefficient of the material according to the first and second time interval differences respectively.

Abstract: A probe (14) of a material level measuring apparatus (10) inserts into a container (20). The material level measuring apparatus (10) transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (30), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (14), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t1) and a second time-passing difference value (t2) are obtained. According to the first time-passing difference value (t1), the second time-passing difference value (t2) and a predetermined empty container time-passing difference value (t3), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.