Abstract: A radiotherapy system includes a neutron acceptor, an aerosolization device for aerosolizing the neutron acceptor, and an energy beam generator. A method for treating cancer, including: administering to a subject in need thereof an effective amount of an aerosolized neutron acceptor; and irradiating the subject with neutrons. A method for diagnosing cancer, including: administering to a subject in need thereof an effective amount of an aerosolized radioactive agent; and receiving an energy beam signal from the subject. A method for delivering a neutron receptor to a subject during radiation therapy, including aerosolizing the neutron receptor and administering to the subject an effective amount of the neutron receptor.

Abstract: A nucleic acid detection device includes tube holders, an illumination module, a detection module and a driving module. The tube holders accommodates tubes, each containing a reagent and a magnetizable element. The illumination module includes light sources, a magnet and a casing, and the light sources and the magnet are installed on the casing. The driving module includes a motor, a lead screw and a slider. The lead screw is coupled to the motor and driven by the motor to rotate, and the slider is sleeved on the lead screw and has a reciprocating linear motion in response to a rotation of the lead screw. The illumination module is coupled to and moved together with the slider, so that the light sources and the magnet are synchronously driven by the motor and have reciprocating linear motions in a direction parallel to the lead screw.

Abstract: A method removes defects in a dielectric layer, such as during fabrication of a device that emits light from hot electrons injected into an atomically two-dimensional material. An atomically two-dimensional material and the dielectric layer are adjoined. The dielectric layer is adapted to convey a variable electric field for modulating a wavelength of photons electronically emitted across a band structure of the atomically two-dimensional material. Laser pulses are strobed into the dielectric layer with sufficient cumulative energy to remove a majority of the defects in the dielectric layer without altering the atomically two-dimensional material.

Abstract: A neutron capture therapy system and a target material for a particle beam generation apparatus, the heat dissipation performance of a target material might be improved. A neutron capture therapy system includes a neutron generation apparatus and a beam shaping body, the neutron generation apparatus includes an accelerator and a target material, and a charged particle beam generated by means of acceleration of the accelerator acts with the target material to generate a neutron beam. The target material includes an active layer, an anti-foaming layer, a heat dissipation layer and a heat conduction layer, the active layer acts with a charged particle beam to generate a neutron beam; the anti-foaming layer suppresses foaming caused by the charged particle beam; the heat dissipation layer directly and rapidly conducts to the heat conduction layer, heat deposited on the active layer, and discharges by means of a cooling medium.

Abstract: This disclosure relates to an X-ray reflectometry apparatus and a method for measuring a three-dimensional nanostructure on a flat substrate. The X-ray reflectometry apparatus comprises an X-ray source, an X-ray reflector, a 2-dimensional X-ray detector, and a two-axis moving device. The X-ray source is for emitting X-ray. The X-ray reflector is configured for reflecting the X-ray onto a sample surface. The 2-dimensional X-ray detector is configured to collect a reflecting X-ray signal from the sample surface. The two-axis moving device is configured to control two-axis directions of the 2-dimensional X-ray detector to move on at least one of x-axis and z-axis with a formula concerning an incident angle of the X-ray with respect to the sample surface for collecting the reflecting X-ray signal.

Abstract: A method for determining parameters of nanostructures, wherein the method includes steps as follows: Firstly, an X-ray reflection intensity measurement curve of a nanostructure to be tested is obtained by radiating the nanostructure to be tested with X-ray. The X-ray reflection intensity measurement curve is compared with an X-ray reflection intensity standard curve to obtain a comparison result. Subsequently, at least one parameter existing in the nanostructure to be tested is determined according to the comparison result.

Abstract: This disclosure relates to an X-ray reflectometry apparatus and a method for measuring a three-dimensional nanostructure on a flat substrate. The X-ray reflectometry apparatus comprises an X-ray source, an X-ray reflector, a 2-dimensional X-ray detector, and a two-axis moving device. The X-ray source is for emitting X-ray. The X-ray reflector is configured for reflecting the X-ray onto a sample surface. The 2-dimensional X-ray detector is configured to collect a reflecting X-ray signal from the sample surface. The two-axis moving device is configured to control two-axis directions of the 2-dimensional X-ray detector to move on at least one of x-axis and z-axis with a formula concerning an incident angle of the X-ray with respect to the sample surface for collecting the reflecting X-ray signal.

Abstract: This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes. In one embodiment, the incident angle of the long-wavelength focused X-ray is ?24°, and the sample area is ?25 ?m×25 ?m.

Abstract: An electronic device comprises a heat source and a heat distribution structure coupled to the heat source to distribute heat generated by the heat source during operation of the electronic device.

Abstract: A speed generation method for simulating riding is provided. A computer device (20) retrieves a riding weight and road condition information, selects one of a plurality of preset gear ratios (30) as a selected gear ratio, retrieves a wheel rotating speed of a bicycle (4), and determines a simulated speed in a simulating riding service based on the selected gear ratio, a tire parameter, and the rotating speed.

Abstract: A cryogenic system cools and operates cryogenic electronics. The cryogenic system includes a cryogenic stage or multiple cryogenic stages for cooling the cryogenic electronics to an operational cryogenic temperature. The cryogenic stage or stages transfer heat from the cryogenic electronics to an ambient environment. An optical fiber or multiple optical fibers deliver an operational power from the ambient environment to the cryogenic electronics and transfer communication data between the cryogenic electronics and the ambient environment. Preferably, the only connection delivering any power from the ambient environment to the cryogenic electronics or transferring any data from the cryogenic electronics to the ambient environment is the optical fiber or fibers, such that the cryogenic system does not include any electrically conductive wires spanning between the ambient environment and the cryogenic electronics.

Abstract: This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes.

Abstract: Example low latency tactile capacitive keyboards are disclosed. An example compute system includes a keyboard including a housing, a plurality of keys, and a touch sensor positioned between the housing and at least one of the plurality of keys, keyboard circuitry to detect a signal output by the touch sensor, the signal corresponding to a keystroke, and generate a code corresponding to the detected signal and processor circuitry to process the code to effect the keystroke.

Abstract: A method removes defects in a dielectric layer, such as during fabrication of a device that emits light from hot electrons injected into an atomically two-dimensional material. An atomically two-dimensional material and the dielectric layer are adjoined. The dielectric layer is adapted to convey a variable electric field for modulating a wavelength of photons electronically emitted across a band structure of the atomically two-dimensional material. Laser pulses are strobed into the dielectric layer with sufficient cumulative energy to remove a majority of the defects in the dielectric layer without altering the atomically two-dimensional material.

Abstract: This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes. In one embodiment, the incident angle of the long-wavelength focused X-ray is ?24°, and the sample area is ?25 ?m×25 ?m.

Abstract: The present disclosure relates to a device and a method for measuring a thickness of an ultrathin film on a solid substrate. The thickness of the target ultrathin film is measured from the intensity of the fluorescence converted by the substrate and leaking and tunneling through the target ultrathin film at low detection angle. The fluorescence generated from the substrate has sufficient and stable high intensity, and therefore can provide fluorescence signal strong enough to make the measurement performed rapidly and precisely. The detection angle is small, and therefore the noise ratio is low, and efficiency of thickness measurement according to the method disclosed herein is high. The thickness measurement method can be applied into In-line product measurement without using standard sample, and therefore the thickness of the product can be measured rapidly and efficiently.

Abstract: The present disclosure relates to a device and a method for measuring a thickness of an ultrathin film on a solid substrate. The thickness of the target ultrathin film is measured from the intensity of the fluorescence converted by the substrate and leaking and tunneling through the target ultrathin film at low detection angle. The fluorescence generated from the substrate has sufficient and stable high intensity, and therefore can provide fluorescence signal strong enough to make the measurement performed rapidly and precisely. The detection angle is small, and therefore the noise ratio is low, and efficiency of thickness measurement according to the method disclosed herein is high. The thickness measurement method can be applied into In-line product measurement without using standard sample, and therefore the thickness of the product can be measured rapidly and efficiently.

Abstract: This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes.

Abstract: The present disclosure provides a method and system for sharing privacy data based on smart contracts. The method includes: receiving, from a first providing device, a first pointer directing to a data contract, and adding the first pointer to a relationship contract of a first user, where the data contract is deployed on a first blockchain by the first providing device in response to the newly added first privacy data, and the first privacy data belongs to the first user; in response to the first privacy data being authorized to be shared with a second providing device, providing the first pointer to the second providing device to allow the second providing device to access the first privacy data through the first pointer.

Abstract: A sensing system including a substrate, at least one explicit device, at least one inner operation device, a plurality of conductors, and a plurality of conductive traces is provided. The substrate has a first surface and a second surface opposite to the first surface, and has a plurality of vias communicating the first surface and the second surface. The explicit device is disposed on the first surface. The explicit device includes a display, a sensor, or a combination thereof. The inner operation device is totally disposed on the second surface. The inner operation device includes a signal processor, a driver, or a combination thereof. The conductors are disposed in the vias, respectively, and connect the at least one explicit device with the at least one inner operation device. The conductive traces are disposed on at least one of the first surface and the second surface.