Abstract: An electronic price indicator according to an embodiment includes a display displaying product information, an NFC module configured to communicate with a user terminal, a Bluetooth module configured to communicate with the user terminal, and a processor configured to control the display to display the product information received from the user terminal through the Bluetooth module. The processor is further configured to release a sleep mode when receiving an interrupt from the user terminal through the NFC module, and perform Bluetooth communication with the user terminal by initiating a scan for a predetermined period of time to receive an advertising signal from the user terminal.

Abstract: A system and methods are disclosed for precision placement or insertion of an object using robotic manipulation. A robotic tool includes at least three members, including a first member and a second member that grip the object between opposing faces and a third member that exerts a force on a proximate end of the object to push the object out of the robotic tool. A series of maneuvers is performed with the robotic tool in order to place the object on a surface or insert the object in a hole. The maneuvers include positioning the object against the surface, rotating the object around a contact point between the object and the surface, rotating the robotic tool around a contact point between the object and either the first or second member of the robotic tool, sliding the object horizontally along a surface, and tucking the object into a final desired position.

Abstract: A system and methods are disclosed for precision placement or insertion of an object using robotic manipulation. A robotic tool includes at least three members, including a first member and a second member that grip the object between opposing faces and a third member that exerts a force on a proximate end of the object to push the object out of the robotic tool. A series of maneuvers is performed with the robotic tool in order to place the object on a surface or insert the object in a hole. The maneuvers include positioning the object against the surface, rotating the object around a contact point between the object and the surface, rotating the robotic tool around a contact point between the object and either the first or second member of the robotic tool, sliding the object horizontally along a surface, and tucking the object into a final desired position.

Abstract: Provided is a semiconductor device including low power retention flip-flop. The semiconductor device includes a first line to which a global power supply voltage is applied, a second line to which a local power supply voltage is applied, the second line being separated from the first line, a first operating circuit connected to the second line to use the local power supply voltage, a first power gating circuit determining whether the local power supply voltage is applied to the first operating circuit and a first retention flip-flop connected to the first line and the second line, wherein the first retention flip-flop comprises a first circuit including a master latch, a second circuit including a slave latch, and a first tri-state inverter connected between the master latch and the slave latch.

Abstract: A multi-bit flip-flop includes: a single scan input pin to receive a scan input signal, a plurality of data input pins to receive first and second data input signals, a first scan flip-flop to select one of the scan input signal and the first data input signal as a first selection signal in response to a scan enable signal and to latch the first selection signal to provide a first output signal, a second scan flip-flop to select one of an internal signal corresponding to the first output signal and the second data input signal as a second selection signal in response to the scan enable signal and to latch the second selection signal to provide a second output signal, and a plurality of output pins to output the first and second output signals, wherein scan paths of the first and second scan flip-flops are connected to each other.

Abstract: A semiconductor circuit includes a first circuit, a second circuit, a third circuit, and a fourth circuit. The first circuit determines a value of a first node based on a voltage level of a clock signal, and a voltage level of an enable signal or a voltage level of a scan enable signal. The second circuit determines a value of a second node based on the voltage levels of the first node and the clock signal. The third circuit determines a value of a third node based on a voltage level of the second node. The fourth circuit determines a value of a fourth node based on the voltage levels of the second node and the clock signal. The third circuit includes a first transistor and a second transistor connected in series with each other and gated to the voltage level of the second node to determine the value of the third node. The fourth circuit includes a third transistor that is gated to the voltage level of the clock signal to electrically connect the third node and the fourth node.

Abstract: A semiconductor circuit includes a first circuit, a second circuit, a third circuit, and a fourth circuit. The first circuit determines a value of a first node based on a voltage level of a clock signal, and a voltage level of an enable signal or a voltage level of a scan enable signal. The second circuit determines a value of a second node based on the voltage levels of the first node and the clock signal. The third circuit determines a value of a third node based on a voltage level of the second node. The fourth circuit determines a value of a fourth node based on the voltage levels of the second node and the clock signal. The third circuit includes a first transistor and a second transistor connected in series with each other and gated to the voltage level of the second node to determine the value of the third node. The fourth circuit includes a third transistor that is gated to the voltage level of the clock signal to electrically connect the third node and the fourth node.

Abstract: A multi-bit flip-flop includes: a single scan input pin to receive a scan input signal, a plurality of data input pins to receive first and second data input signals, a first scan flip-flop to select one of the scan input signal and the first data input signal as a first selection signal in response to a scan enable signal and to latch the first selection signal to provide a first output signal, a second scan flip-flop to select one of an internal signal corresponding to the first output signal and the second data input signal as a second selection signal in response to the scan enable signal and to latch the second selection signal to provide a second output signal, and a plurality of output pins to output the first and second output signals, wherein scan paths of the first and second scan flip-flops are connected to each other.

Abstract: Provided is a semiconductor device including low power retention flip-flop. The semiconductor device includes a first line to which a global power supply voltage is applied, a second line to which a local power supply voltage is applied, the second line being separated from the first line, a first operating circuit connected to the second line to use the local power supply voltage, a first power gating circuit determining whether the local power supply voltage is applied to the first operating circuit and a first retention flip-flop connected to the first line and the second line, wherein the first retention flip-flop comprises a first circuit including a master latch, a second circuit including a slave latch, and a first tri-state inverter connected between the master latch and the slave latch.

Abstract: Provided are a semiconductor device and a method for operating a semiconductor device. The semiconductor device includes a clock generating unit receiving a reference clock and generating first and second clocks that are different from each other from the reference clock; a first latch configured to receive input data based on the first clock and to output the input data as first output data; and a second latch configured to receive the first output data based on the second clock and to output the first output data as second output data, wherein a first edge of the first clock does not overlap a first edge of the second clock, and at least a part of a second edge of the first clock overlaps a second edge of the second clock.

Abstract: An example embodiment discloses a flip-flop including a first inverter configured to invert first data, first and second transistors connected to each other in series and configured to receive the inverted first data and a first clock, respectively, a third transistor and a first gate configured to perform a logic operation on the first data and the first clock, the third transistor configured to receive an output of the logic operation. The second transistor and the third transistor are connected to a first node.

Abstract: The present invention relates to a high-flux forward osmosis membrane assembly and a forward osmosis module using the same, and more specifically, to a forward osmosis membrane assembly capable of improving the flux inside an osmosis membrane and simultaneously promoting uniform flux along a fluid flow route by forming more channels inside the osmosis membrane in order to allow an osmotic action to be smoothly performed even if formed in a spiral wound shape, and minimizing the separation, which could occur, of a different osmosis membrane adhering to each other by minimizing the concentration polarization on the surface of the forward osmosis membrane by increasing the flux on the surface of the osmosis membrane through the promotion of turbulence along the channels and simultaneously forming separate channels inside the osmosis membrane, and a forward osmosis module in which the active area of a separation membrane capable of performing a smooth osmotic action and forming an osmotic pressure gradient is max

Abstract: Provided are a semiconductor device and a method for operating a semiconductor device. The semiconductor device includes a clock generating unit receiving a reference clock and generating first and second clocks that are different from each other from the reference clock; a first latch configured to receive input data based on the first clock and to output the input data as first output data; and a second latch configured to receive the first output data based on the second clock and to output the first output data as second output data, wherein a first edge of the first clock does not overlap a first edge of the second clock, and at least a part of a second edge of the first clock overlaps a second edge of the second clock.

Abstract: Provided are a semiconductor device and a method for operating a semiconductor device. The semiconductor device includes a clock generating unit receiving a reference clock and generating first and second clocks that are different from each other from the reference clock; a first latch configured to receive input data based on the first clock and to output the input data as first output data; and a second latch configured to receive the first output data based on the second clock and to output the first output data as second output data, wherein a first edge of the first clock does not overlap a first edge of the second clock, and at least a part of a second edge of the first clock overlaps a second edge of the second clock.

Abstract: An example embodiment discloses a flip-flop including a first inverter configured to invert first data, first and second transistors connected to each other in series and configured to receive the inverted first data and a first clock, respectively, a third transistor and a first gate configured to perform a logic operation on the first data and the first clock, the third transistor configured to receive an output of the logic operation. The second transistor and the third transistor are connected to a first node.

Abstract: Provided are a semiconductor device and a method for operating a semiconductor device. The semiconductor device includes a clock generating unit receiving a reference clock and generating first and second clocks that are different from each other from the reference clock; a first latch configured to receive input data based on the first clock and to output the input data as first output data; and a second latch configured to receive the first output data based on the second clock and to output the first output data as second output data, wherein a first edge of the first clock does not overlap a first edge of the second clock, and at least a part of a second edge of the first clock overlaps a second edge of the second clock.

Abstract: Provided are a semiconductor circuit and method for operating the same. The semiconductor circuit includes a first flip-flop configured to, based on input data synchronized to a first clock, output first output data synchronized to a second clock different from the first clock, and a second flip-flop configured to, based on the first output data, output second output data synchronized to the second clock, wherein the first and the second flip-flops share an inverted second clock and a delayed second clock and output the first and the second output data based thereon, respectively.

Abstract: A scan flip-flop circuit includes a pulse generator, a dynamic input unit and a latch output unit. The pulse generator generates a pulse signal which is enabled in synchronization with a rising edge of a clock signal in a normal mode, and is selectively enabled in synchronization with the rising edge of the clock signal in response to a logic level of a scan input signal in a scan mode. The dynamic input unit precharges a first node to a power supply voltage in a first phase of the clock signal, selectively discharges the first node in the normal mode, and discharges the first node in the scan mode. The latch output unit latches an internal signal provided from the first node to provide an output data, and determines whether the output data is toggled based on the clock signal and a previous state of the output data.

Abstract: A scan flip-flop circuit includes a pulse generator, a dynamic input unit and a latch output unit. The pulse generator generates a pulse signal which is enabled in synchronization with a rising edge of a clock signal in a normal mode, and is selectively enabled in synchronization with the rising edge of the clock signal in response to a logic level of a scan input signal in a scan mode. The dynamic input unit precharges a first node to a power supply voltage in a first phase of the clock signal, selectively discharges the first node in the normal mode, and discharges the first node in the scan mode. The latch output unit latches an internal signal provided from the first node to provide an output data, and determines whether the output data is toggled based on the clock signal and a previous state of the output data.

Abstract: A clock skew controller for adjusting a skew between a first clock, which is input to a first clock mesh, and a second clock mesh input to a second clock mesh, includes a pulse generator adapted to output a pulse signal corresponding to a delay time between a first output clock output from the first clock mesh and a second output clock output from the second clock mesh, a pulse width detector adapted to generate a digital signal corresponding to a pulse width of the pulse signal, and a clock delay adjuster adapted to delay one of the first and second clocks by a time corresponding to the digital signal.