Abstract: A method and system for detecting a known measurable object feature using a video inspection system. The method and system displays an image of a viewed object and detects a known measurable object feature on the viewed object. The method and system then displays a set of available measurement types including a measurement type associated with the detected known measurable object feature and/or automatically positions a plurality of measurement markers on the displayed image based on the measurement type associated with the detected known measurable object feature.

Abstract: A method and device for measuring dimensions of a feature on or near an object using a video inspection device. A reference surface is determined based on reference surface points on the surface of the object. One or more measurement cursors are placed on measurement pixels of an image of the object. Projected reference surface points associated with the measurement pixels on the reference surface are determined. The dimensions of the feature can be determined using the three-dimensional coordinates of at least one of the projected reference surface points.

Abstract: A method and device for automatically identifying a point of interest in a depth measurement on a viewed object using a video inspection device is disclosed. The video inspect device determines the three-dimensional coordinates in a region of interest on the viewed object and analyzes those surface points to determine the desired measurement application (e.g., determining the deepest point, the highest point, or the clearance between two surfaces). Based on the desired measurement application, the video inspection device automatically identifies the point of interest on the viewed object and places a cursor at that location.

Abstract: A method and device for automatically identifying a point of interest (e.g., the deepest or highest point) on a viewed object using a video inspection device. The method involves placing a first cursor on an image of the object to establish a first slice plane and first surface contour line, as well as placing another cursor, offset from the first cursor, used to establish an offset (second) slice plane and an offset (second) surface contour line. Profile slice planes and profile surface contour lines are then determined between corresponding points on the first surface contour line and the offset (second) surface contour line to automatically identify the point of interest.

Abstract: A modular device and method are disclosed. The modular device includes individual modular units. A first modular unit includes a pivot member and a connector and a second modular unit includes a matching connector and a first mating point. The first mating point is configured to fit a portion of the pivot member. A third modular unit may also be included, where the third modular unit has a second mating point which is configured to fit another portion of the pivot member. The matched connectors align and connect when the second modular unit is rotated about the pivot member into contact with the first modular unit. The third modular unit can also be rotated about the same pivot member with or without the second modular unit connected. The second and third modular units can be rotated independently and/or removed independently.

Abstract: The present disclosure describes an embodiment that provides a tangible, non-transitory, computer-readable medium storing instructions executable by a processor of an endoscope. The instructions include instructions to capture, using an imager in the endoscope, a first plurality of images at a first brightness level while a live video based at least in part on the first plurality of images is displayed, generate, using the processor, a baseline image by averaging or summing the first plurality of images, capture, using the imager, a second plurality of images at a plurality of brightness levels, in which the plurality of brightness levels are different from the first brightness level, and generate, using the processor, a high dynamic range image based at least in part on the baseline image and the second plurality of images, in which the high dynamic range image comprises more unsaturated pixels than the baseline image.

Abstract: A method and system for detecting a known measurable object feature using a video inspection system. The method and system displays an image of a viewed object and detects a known measurable object feature on the viewed object. The method and system then displays a set of available measurement types including a measurement type associated with the detected known measurable object feature and/or automatically positions a plurality of measurement markers on the displayed image based on the measurement type associated with the detected known measurable object feature.

Abstract: Measurement accuracy of a remote visual inspection (RVI) system is tested using a test object including a test feature having a known geometric characteristic. Using a controller, attachment of a detachable measurement optical tip to an RVI probe is detected. A user is then prompted to perform testing of the measurement accuracy. When the user indicates the test feature is visible, the system captures one or more images of the test feature, determines coordinates of the test feature from the images, and measures a geometric characteristic of the test feature using the coordinates. An accuracy result is determined using the measured geometric characteristic and the known geometric characteristic, and an indication is provided, e.g., to the user, of the result of the comparison. An RVI system with a user-prompt device is also described.

Abstract: A method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting a three-dimensional geometry of the viewed object using a video inspection device is disclosed. The video inspection device displays a two-dimensional image of the object surface of a viewed object, and determines the three-dimensional coordinates of a plurality of surface points. At least one rendered image of the three-dimensional geometry of the viewed object is displayed simultaneously with the two-dimensional image. As measurement cursors are placed and moved on the two-dimensional image, the rendered image of the three-dimensional geometry of the viewed object is automatically updated.

Abstract: A method and device for automatically identifying a point of interest (e.g., the deepest or highest point) on the surface of an anomaly on a viewed object using a video inspection device is disclosed. The video inspection device obtains and displays an image of the surface of the viewed object. A reference surface is determined along with a region of interest that includes a plurality of points on the surface of the anomaly. The video inspection device determines a depth or height for each of the plurality of points on the surface of the anomaly in the region of interest. The point on the surface of the anomaly (e.g., having the greatest depth or height) is identified as the point of interest. A profile of the object surface at the point of interest is then determined.

Abstract: A method and device for automatically identifying the deepest point on the surface of an anomaly on a viewed object using a video inspection device. The video inspection device obtains and displays an image of the surface of the viewed object. A reference surface is determined along with a region of interest that includes a plurality of points on the surface of the anomaly. The video inspection device determines a depth for each of the plurality of points on the surface of the anomaly in the region of interest. The point on the surface of the anomaly having the greatest depth is identified as the deepest point.

Abstract: A method and device for displaying a three-dimensional view of the surface of a viewed object is disclosed, wherein a subset of the three-dimensional data from the entire image of the viewed object in a region of interest is determined and displayed to provide enhanced detail in the region of interest.

Abstract: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

Abstract: A handset for inspecting a target object with a sensor in an inspection module is disclosed. The handset includes a housing having a grip portion adapted to be held by a person, the housing adapted to selectively mechanically engage with the inspection module, a handset interface on the housing adapted to exchange signals with the inspection module, a handset processor, a user input interface accessible to the person gripping the grip portion and adapted to provide a control signal to the handset processor, and a user output interface responsive to the handset processor to display the data transmitted by the handset processor about the target object.

Abstract: A modular device and method are disclosed. The modular device includes individual modular units. A first modular unit includes a pivot member and a connector and a second modular unit includes a matching connector and a first mating point. The first mating point is configured to fit a portion of the pivot member. A third modular unit may also be included, where the third modular unit has a second mating point which is configured to fit another portion of the pivot member. The matched connectors align and connect when the second modular unit is rotated about the pivot member into contact with the first modular unit. The third modular unit can also be rotated about the same pivot member with or without the second modular unit connected. The second and third modular units can be rotated independently and/or removed independently.

Abstract: An embedded imaging system in one embodiment includes an encoding module, an imaging module, and a cable. The encoding module is disposed proximate to a proximal end of the system, and is configured to encode frame synchronizing information into timing information comprising a reference clock. The imaging module is disposed proximate the distal end, and includes an image capture device configured to obtain imaging information and a decoding module. The decoding control module is configured to obtain the timing information, to decode the timing information to obtain recovered frame synchronizing information, and to control the image capture device using the recovered frame synchronizing information. The cable is interposed between the proximal end and the distal end, and is configured for passage therethrough of the timing information and the imaging information.

Abstract: Measurement accuracy of a remote visual inspection (RVI) system is tested using a test object including a test feature having a known geometric characteristic. Using a controller, attachment of a detachable measurement optical tip to an RVI probe is detected. A user is then prompted to perform testing of the measurement accuracy. When the user indicates the test feature is visible, the system captures one or more images of the test feature, determines coordinates of the test feature from the images, and measures a geometric characteristic of the test feature using the coordinates. An accuracy result is determined using the measured geometric characteristic and the known geometric characteristic, and an indication is provided, e.g., to the user, of the result of the comparison. An RVI system with a user-prompt device is also described.

Abstract: A method of operating an inspection device includes collecting a plurality of successive image frames using an image sensor of the inspection device and displaying the plurality of successive image frames on a display of the inspection device. The method includes processing, via a processor of the inspection device, each image frame of the plurality of successive image frames by determining a motion parameter of each respective image frame and adding each respective image frame to a frame buffer when the respective image frame is motion free. The method includes receiving a control signal from a user interface of the inspection device requesting an image frame output. The method further includes determining, via the processor of the inspection device, a noise-reduced image frame from the frame buffer in response to the control signal and outputting the noise-reduced image frame in response to the control signal.

Abstract: A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light patterns from the light emitters for performing a phase-shift analysis using a plurality of images of the light patterns that are projected onto a component being inspected. The control circuit controls the projection of the light patterns by receiving electrical energy from a drive circuit. At least one of the light emitters is identified for receiving a power input based at least in part on the electrical energy received from the drive circuit. The power input is transmitted to the identified light emitter, based at least in part on the electrical energy received from the drive circuit, to enable the activation of the identified light emitter.

Abstract: A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a reference surface and a reference surface line. The reference surface line is then used to determine a surface contour line on the surface of the object. The profile is then determined by determining the distances between the reference surface and the surface contour line.