Abstract: A method and device for determining the offset distance between a first surface and a second surface is disclosed. The method and device determine a first reference surface, which is based on the three-dimensional coordinates of the first surface, and a second reference surface, which is based on the three-dimensional coordinates of the second surface. The offset distance is determined as the distance between a first point on the first reference surface and a second point on the second reference surface.

Abstract: A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light patterns from the light emitters for performing a phase-shift analysis using a plurality of images of the light patterns that are projected onto a component being inspected. The control circuit controls the projection of the light patterns by receiving electrical energy from a drive circuit. At least one of the light emitters is identified for receiving a power input based at least in part on the electrical energy received from the drive circuit. The power input is transmitted to the identified light emitter, based at least in part on the electrical energy received from the drive circuit, to enable the activation of the identified light emitter.

Abstract: An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns.

Abstract: Embodiments of an inspection system deploy active cooling to dissipate heat in a portable handset. In one embodiment, the inspection system comprise a visual inspection apparatus with a handle portion and a head portion coupled to the handle portion. The head portion can have a display and a circuit board coupled to the display and a heat sink in thermal connection with the circuit board. To facilitate active cooling, the apparatus may include an air moving device in flow connection with the heat sink, where the air moving device comprises a motor and an impeller and where the motor and the circuit board are sealed from the environment.

Abstract: A system for measuring a distance to an object includes a camera positioned at a location and a signal generated by the camera that is reflective of a camera setting. A controller operably connected to the camera receives the signal and generates an accuracy signal based on the signal. The accuracy signal is reflective of a predicted accuracy of a distance measurement. An indicator operably connected to the controller provides an indication reflective of the accuracy signal. A method for measuring a distance to an object includes positioning a camera and generating a signal reflective of a predicted accuracy of a distance measurement. The method further includes providing an indication reflective of the signal, capturing one or more images of the object at the location, and calculating a distance to the object based on the one or more captured images of the object at the location.

Abstract: A method and device for displaying an indication of the quality of the three-dimensional data for a surface of a viewed object are disclosed, wherein overlays are displayed on pixels of an image corresponding to surface points, indicating the predicted accuracy or availability of the three-dimensional coordinates of those surface points.

Abstract: A method and device for displaying a three-dimensional view of the surface of a viewed object is disclosed, wherein a subset of the three-dimensional data from the entire image of the viewed object in a region of interest is determined and displayed to provide enhanced detail in the region of interest.

Abstract: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

Abstract: A method for embedding frames of image data in a streaming video is disclosed, comprising the steps of receiving a plurality of frames of image data of a target object over a period of time; compressing the plurality of frames of image data; embedding the plurality of compressed frames of image data in a streaming video; initiating a control signal during the period of time to embed a particular frame of image data; selecting a frame of image data from the plurality of frames of image data received near the time the control signal is initiated; embedding a user data marker in the streaming video; and embedding the selected frame of image data in the streaming video as user data, wherein the embedded selected frame of image data has a higher quality than the embedded plurality of compressed frames of image data.

Abstract: A method of determining the distance to an object can use a video inspection device comprising a first light emitter and a second light emitter, wherein the first light emitter can emit light through an opening with at least one shadow-forming element. The method can comprise capturing at least one first emitter image with the first light emitter activated and the second light emitter deactivated, capturing at least one second emitter image with the second light emitter activated and the first light emitter deactivated, determining a first plurality of luminance values of the pixels in the at least one first emitter image, determining a second plurality of luminance values of the pixels in the at least one second emitter image, determining the brightness ratios of the second plurality of luminance values to the first plurality of luminance values, and determining an object distance using the brightness ratios.

Abstract: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

Abstract: A method of determining the distance to an object can use a video inspection device comprising a first light emitter and a second light emitter, wherein the first light emitter can emit light through an opening with at least one shadow-forming element. The method can comprise capturing at least one first emitter image with the first light emitter activated and the second light emitter deactivated, capturing at least one second emitter image with the second light emitter activated and the first light emitter deactivated, determining a first plurality of luminance values of the pixels in the at least one first emitter image, determining a second plurality of luminance values of the pixels in the at least one second emitter image, determining the brightness ratios of the second plurality of luminance values to the first plurality of luminance values, and determining an object distance using the brightness ratios.

Abstract: A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a reference surface and a reference surface line. The reference surface line is then used to determine a surface contour line on the surface of the object. The profile is then determined by determining the distances between the reference surface and the surface contour line.

Abstract: An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns.

Abstract: A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object.

Abstract: A system for providing a two-position zoom-focus capability in a video inspection device comprising, in one embodiment, a focus lens cell and primary aperture attached to a set of fixed rails and connected to a zoom lens cell. In one embodiment, the focus lens cell is moveable into a first position along the rails through activation of a proximally located lens movement mechanism, and moveable into a second position through relaxation of a tensioned focus spring. In one embodiment, movement of the focus lens cell between first and second focus positions causes movement of the zoom lens cell and a secondary aperture between corresponding first and second zoom and aperture positions to provide unmagnified and magnified images of a target object.

Abstract: A system for providing a two-position zoom-focus capability in a video inspection device comprising, in one embodiment, a focus lens cell and primary aperture attached to a set of fixed rails and connected to a zoom lens cell. In one embodiment, the focus lens cell is moveable into a first position along the rails through activation of a proximally located lens movement mechanism, and moveable into a second position through relaxation of a tensioned focus spring. In one embodiment, movement of the focus lens cell between first and second focus positions causes movement of the zoom lens cell and a secondary aperture between corresponding first and second zoom and aperture positions to provide unmagnified and magnified images of a target object.

Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

Abstract: A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.

Abstract: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.