Abstract: Various implementations described herein are directed to device having a memory block and a sense amplifier coupled to the memory block. The device may include a bias generator that applies a bias signal to the sense amplifier for regulating read current to the sense amplifier for faster activation of the memory block.

Abstract: Various implementations described herein are directed to device having a clock generator that provides write reference signals. The device may include a voltage divider that receives the write reference signals and provides an output reference signal based on write polarity of the write reference signals. The device may include a voltage regulator that receives the output reference signal and provides a regulated voltage to a load based on the output reference signal.

Abstract: According to certain implementations of the present disclosure, an input circuit provides one or more reference paths and bit paths for sense amplifier circuit operations. In one implementation, the input circuit includes a reference path, a bit path, and a CMOS resistor. The reference path includes a first MTJ device and a first access device, where the reference path is coupled to the sense amplifier via a first input terminal. The bit path includes a second MTJ device and a second access device, where the bit path is coupled to the sense amplifier via a second input terminal. In certain implementations, the CMOS resistor is coupled to one of the reference path or the bit path.

Abstract: In a particular implementation, an apparatus including first and second bias circuits and an inner amplifier provides sense amplifier offset cancellation. The inner amplifier includes: first and second current generators configured to replicate respective first and second currents from the first and second bias circuits, first and second transistors configured to transform the first and second currents into voltage samples, and first and second capacitors configured to store the voltage samples. In a sampling phase, a sampling of the first and second currents may be performed in the inner amplifier, and further, in an amplification phase, an amplification of the stored voltage samples may also be performed in the inner amplifier.

Abstract: Briefly, embodiments of claimed subject matter relate to circuits and methods for providing signals, such as signals to bring about writing of binary logic values to magnetic random-access memory (MRAM) cells. In particular embodiments, such circuits may operate to control output signal variability over an operating temperature range.

Abstract: In a particular implementation, an apparatus including first and second bias circuits and an inner amplifier provides sense amplifier offset cancellation. The inner amplifier includes: first and second current generators configured to replicate respective first and second currents from the first and second bias circuits, first and second transistors configured to transform the first and second currents into voltage samples, and first and second capacitors configured to store the voltage samples. In a sampling phase, a sampling of the first and second currents may be performed in the inner amplifier, and further, in an amplification phase, an amplification of the stored voltage samples may also be performed in the inner amplifier.

Abstract: Various implementations described herein refer to a device having an encoder coupled to memory. The ECC encoder receives input data from memory built-in self-test circuitry, generates encoded data by encoding the input data and by adding check bits to the input data, and writes the encoded data to memory. The device may have an ECC decoder coupled to memory. The ECC decoder reads the encoded data from memory, generates corrected data by decoding the encoded data and by extracting the check bits from the encoded data, and provides the corrected data and double-bit error flag as output. The ECC decoder has error correction logic that performs error correction on the decoded data based on the check bits, wherein if the error correction logic detects a multi-bit error in the decoded data, the error correction logic corrects the multi-bit error in the decoded data to provide the corrected data.

Abstract: Briefly, embodiments of claimed subject matter relate to adjusting, such as extending, a clock signal to permit completion of a write operations to a first memory type and/or to permit completion of read operations from a second memory type, wherein the first memory type and the second memory type are dissimilar from each other. In certain embodiments, the first memory type may comprise a magnetic random-access memory (MRAM) cell array, and the second memory type may comprise a static random-access memory (SRAM) cell array.

Abstract: In a particular implementation, an apparatus including first and second bias circuits and an inner amplifier provides sense amplifier offset cancellation. The inner amplifier includes: first and second current generators configured to replicate respective first and second currents from the first and second bias circuits, first and second transistors configured to transform the first and second currents into voltage samples, and first and second capacitors configured to store the voltage samples. In a sampling phase, a sampling of the first and second currents may be performed in the inner amplifier, and further, in an amplification phase, an amplification of the stored voltage samples may also be performed in the inner amplifier.

Abstract: Various implementations described herein refer to an integrated circuit having first circuitry and second circuitry. The first circuitry receives first input data and bypasses error correction circuitry to determine whether the first input data has one or more first errors. The second circuitry receives second input data and enables the error correction circuitry to determine whether the second input data has one or more second errors.