Abstract: In one embodiment, an optical splitter/coupler may be created by i) providing an optical waveguide having a first waveguide channel core, ii) forming an angular trench at an end of the first waveguide channel core, the angular trench establishing first and second facets within the first waveguide channel core, and iii) mirroring the first and second facets, wherein the mirrored first and second facets are configured to provide optical reflection into and/or from respective second and third waveguide channel cores located at correspondingly opposing sides of the first waveguide channel core.

Abstract: Bandwidth translation may be provided. First, data may be transceived at a first data port. Next, the data may be transceived at a plurality of second data ports. The bandwidth of a path for the data between the first port and the plurality of second ports may be translated.

Abstract: An apparatus may be provided. The apparatus may comprise a first edge having a first area and a second edge having a second area larger than the first area. The apparatus may further comprise a volume of material disposed between the first edge and the second edge. The volume of material may have a first numeral aperture value at the first area and a second numeral aperture value at the second area. The second numeral aperture value may be less than the first numeral aperture value.

Abstract: An apparatus may be provided. The apparatus may comprise a first edge having a first area and a second edge having a second area larger than the first area. The apparatus may further comprise a volume of material disposed between the first edge and the second edge. The volume of material may have a first numeral aperture value at the first area and a second numeral aperture value at the second area. The second numeral aperture value may be less than the first numeral aperture value.

Abstract: Bandwidth translation may be provided. First, data may be transceived at a first data port. Next, the data may be transceived at a plurality of second data ports. The bandwidth of a path for the data between the first port and the plurality of second ports may be translated.

Abstract: According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.

Abstract: A scalable signal processing test device and related signal processing techniques are provided herein for processing signals at a signal processing module of the scalable signal processing test device. Source electrical signals are processed to generate test electrical signals that model electrical signals produced by an optical module from received optical signals in accordance with a high speed optical standard for optical transmission. The test electrical signals are transmitted over transmit links to a host device that is configured to receive the test electrical signals in a format that would normally be produced by an optical module in accordance with the high speed optical standard. The test electrical signals are received after they have been looped back from the host device over receive links from the host device.

Abstract: According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.

Abstract: An apparatus for testing multiple Small Form-Factor Pluggable Plus (SFP+) ports comprising: a first testing module; a second testing module; and a communications link coupled with the first and the second testing modules; wherein each of the testing modules includes: a SFP+ interface connectable to a port under test (PUT), a signal processing circuit including: a signal compensator configured to perform signal compensation on a signal received from the other testing module, and a signal modifier configured to: modify the compensated signal according to a set of predetermined modification parameters, and transmit the modified signal to the PUT.

Abstract: A scalable signal processing test device and related signal processing techniques are provided herein for processing signals at a signal processing module of the scalable signal processing test device. Source electrical signals are processed to generate test electrical signals that model electrical signals produced by an optical module from received optical signals in accordance with a high speed optical standard for optical transmission. The test electrical signals are transmitted over transmit links to a host device that is configured to receive the test electrical signals in a format that would normally be produced by an optical module in accordance with the high speed optical standard. The test electrical signals are received after they have been looped back from the host device over receive links from the host device.