Abstract: A skew compensation circuit includes a skew detection circuit configured to generate skew detection signals by detecting a skew characteristic of a basic logic element constituting a semiconductor apparatus, a skew compensation signal generation circuit configured to generate a skew compensation signal by comparing the skew detection signals and a plurality of reference voltages, a variable delay circuit configured to generate a compensation signal by delaying an input signal by a delay time varied according to the skew compensation signal, and a reference voltage generation circuit configured to generate the plurality of reference voltages of which offset components are compensated for according to variations of a temperature and an external voltage.

Abstract: A delay control device and method are disclosed, which relate to a technology for compensating for a delay difference of a delay locked loop (DLL). The delay control device may include a delay locked loop (DLL) configured to adjust a delay time of a delay line, and compensate for a delay time of a replica delay circuit based on a calibration signal. The delay control device may include a real clock path delay circuit configured to delay an output of the delay locked loop (DLL. The delay control device may include a control signal generator configured to generate the calibration signal in consideration of a difference between the delay time of the replica delay circuit and the delay time of the real clock path delay circuit.

Abstract: A semiconductor system includes: a controller suitable for outputting an external clock signal and a command/address signal; and a semiconductor device suitable for selecting one of pre-stored code values of a delay control signal to output an initial value control signal according to the command/address signal, and outputting an internal clock signal by delaying the external clock signal by a predetermined time based on the delay control signal having an initial value that is set in response to the initial value control signal.

Abstract: A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a correction code generator configured to generate a reference correction code according to a duty detection signal based on a phase difference between the pair of first reference clocks, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

Abstract: A semiconductor system includes: a controller suitable for outputting an external clock signal and a command/address signal; and a semiconductor device suitable for selecting one of pre-stored code values of a delay control signal to output an initial value control signal according to the command/address signal, and outputting an internal clock signal by delaying the external clock signal by a predetermined time based on the delay control signal having an initial value that is set in response to the initial value control signal.

Abstract: A delay control device and method are disclosed, which relate to a technology for compensating for a delay difference of a delay locked loop (DLL). The delay control device may include a delay locked loop (DLL) configured to adjust a delay time of a delay line, and compensate for a delay time of a replica delay circuit based on a calibration signal. The delay control device may include a real clock path delay circuit configured to delay an output of the delay locked loop (DLL. The delay control device may include a control signal generator configured to generate the calibration signal in consideration of a difference between the delay time of the replica delay circuit and the delay time of the real clock path delay circuit.

Abstract: A duty cycle detector may include a rising clock detection unit enabled in response to a first control signal; a falling clock detection unit enabled in response to a second control signal with a different activation timing from the first control signal; and a comparison unit configured to compare an output signal of the rising clock detection unit to an output signal of the falling clock detection unit in response to a comparison enable signal, and output a duty cycle detection signal.

Abstract: A synchronization circuit may include: a delay line configured to delay a reference clock signal; a division circuit configured to generate a divided feedback clock signal by dividing a feedback clock signal at a division ratio which is set according to a division ratio control signal; a phase detection circuit configured to generate a phase detection signal by detecting the phase of the divided feedback clock signal based on the reference clock signal; and a delay line control circuit configured to control a delay time of the delay line according to the phase detection signal and the divided feedback clock signal.

Abstract: A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a correction code generator configured to generate a reference correction code according to a duty detection signal based on a phase difference between the pair of first reference clocks, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

Abstract: A duty cycle detection circuit may include: a timing signal generation unit to generate a plurality of timing signal groups by selectively combining multi-phase clock signals according to an enable signal; and a detection unit to generate a duty detection signal by selectively combining signals of the plurality of timing signal groups according to the enable signal.

Abstract: A duty cycle detector may include a rising clock detection unit enabled in response to a first control signal; a falling clock detection unit enabled in response to a second control signal with a different activation timing from the first control signal; and a comparison unit configured to compare an output signal of the rising clock detection unit to an output signal of the falling clock detection unit in response to a comparison enable signal, and output a duty cycle detection signal.

Abstract: A duty cycle detector may include a rising clock detection unit enabled in response to a first control signal; a falling clock detection unit enabled in response to a second control signal with a different activation timing from the first control signal; and a comparison unit configured to compare an output signal of the rising clock detection unit to an output signal of the falling clock detection unit in response to a comparison enable signal, and output a duty cycle detection signal.

Abstract: A duty cycle detector (DCD) circuit may include: a duty cycle detector including one or more capacitor sets which are charged, discharged, or charged and discharged a clock, and suitable for detecting a duty cycle of the clock; and a frequency detector suitable for detecting a frequency of the clock. Each of the one or more capacitor sets has an adjustable capacity according to the frequency detection result of the frequency detector.

Abstract: A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a triggering unit configured to generate a pair of second reference clocks from the pair of first reference clocks, a pulse detector configured to generate a duty detection signal based on a phase difference between the pair of second reference clocks, a correction code generator configured to generate a reference correction code based on the duty detection signal, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

Abstract: A regulation circuit of a semiconductor apparatus includes a control block configured to generate control signals in response to a reference clock signal and a feedback clock signal; and a noise compensation block configured to compensate for a variation in a level of power in response to the control signals.

Abstract: A delay locked loop (DLL) circuit may include: a DLL unit suitable for generating an internal clock by delaying an external clock by a delay amount required for locking; a single-to-differential divider suitable for generating multi-phase divided clocks at a specific edge of the internal clock; and a phase correction unit suitable for correcting a phase error between the multi-phase divided clocks.

Abstract: An output control circuit may include a period setting signal generation unit configured to output a setup signal enabled during a designated period, in response to a delayed locked loop (DLL) locking signal and an output enable reset signal. The output control circuit may also include a clock division unit configured to divide an internal clock at a preset division ratio in response to the setup signal, and output a divided clock. In addition, the output control circuit may include a shift unit configured to shift the setup signal by a preset first time in response to the divided clock, and output a first delayed setup signal. Further, the output control circuit may include an output unit configured to receive and process the first delayed setup signal in response to the divided clock, and output the output enable reset signal.

Abstract: A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a triggering unit configured to generate a pair of second reference clocks from the pair of first reference clocks, a pulse detector configured to generate a duty detection signal based on a phase difference between the pair of second reference clocks, a correction code generator configured to generate a reference correction code based on the duty detection signal, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

Abstract: A duty cycle detection circuit may include a detection block configured to generate a duty detection signal by detecting a duty cycle of an input clock; and a current amount control block configured to control a current flowing through the detection block in response to the input clock, regardless of a variation in a frequency of the input clock.

Abstract: A delay locked loop (DLL) circuit may include: an input clock control unit suitable for transmitting first and second internal clocks generated based on an external clock, and controlling transmission of the second internal clock based on a clock control signal which is activated during a predetermined period; a clock delay unit suitable for generating a first delay locked clock by delaying the first internal clock by a delay time required for locking, and generating a second delay locked clock by delaying the second internal clock based on the clock control signal; and an output clock control unit suitable for outputting the first delay locked clock and the second delay locked clock during a period in which the clock control signal is activated.