Abstract: A time of flight type mass spectrometer (TOF-MS) of the present invention includes: a flight space containing a loop orbit on which ions fly once or more than once; a flight controller for making ions of a same mass to charge ratio fly the loop orbit at several values of number of turns; a flight time measurer for measuring a length of flight time of the ions; and a processor for determining the mass to charge ratio of the ions based on a relationship between the value of number of turns and the length of flight time of the ions. The speed of ions flying a loop orbit depends on their mass to charge ratios. For ions of the same mass to charge ratio, the difference between the lengths of flight time of the ions flying the loop orbit N turns and of the ions flying the loop orbit N+1 turns depends on the speed of the ions, so that the difference depends on the mass to charge ratio of the ions.

Abstract: In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly.

Abstract: In a time of flight mass spectrometer (TOF-MS) of the present invention, a flight controller makes ions fly a loop orbit a predetermined number of turns, and an ion detector detects the ions at each turn of the flight. A flight time measurer measures the length of flight time of ions of a same mass to charge ratio at every turn, and a data processor constructs a spectrum of flight time. The data processor further computes the Fourier transformation of the spectrum, and determines the mass to charge ratio of the ions based on a frequency peak appearing in the Fourier transformation.

Abstract: A time of flight type mass spectrometer (TOF-MS) of the present invention includes: a flight space containing a loop orbit on which ions fly once or more than once; a flight controller for making ions of a same mass to charge ratio fly the loop orbit at several values of number of turns; a flight time measurer for measuring a length of flight time of the ions; and a processor for determining the mass to charge ratio of the ions based on a relationship between the value of number of turns and the length of flight time of the ions. The speed of ions flying a loop orbit depends on their mass to charge ratios. For ions of the same mass to charge ratio, the difference between the lengths of flight time of the ions flying the loop orbit N turns and of the ions flying the loop orbit N+1 turns depends on the speed of the ions, so that the difference depends on the mass to charge ratio of the ions.

Abstract: In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly.

Abstract: In a time of flight mass spectrometer (TOF-MS) of the present invention, a flight controller makes ions fly a loop orbit a predetermined number of turns, and an ion detector detects the ions at each turn of the flight. A flight time measurer measures the length of flight time of ions of a same mass to charge ratio at every turn, and a data processor constructs a spectrum of flight time. The data processor further computes the Fourier transformation of the spectrum, and determines the mass to charge ratio of the ions based on a frequency peak appearing in the Fourier transformation.

Abstract: Transparent conductive ZnO films are formed at a high rate, are equal in performance to those formed by MOCVD and have a large area, while the influence of sputtering bombardment is reduced. A method for producing transparent conductive ZnO films is used to produce the window layer of a CIGS thin-film solar cell. A first conductive film functioning as an interface-protective film is formed on a high-resistance-buffer (interfacial) layer by low-output (100 W or lower) RF sputtering using a ZnO target while reducing sputtering bombardment. Second and third conductive films for the window layer are then formed by DC magnetron sputtering in steps using a ZnO--Al target in each step.