Abstract: An overvoltage protection circuit may include a reference voltage generator, a trigger circuit, and a clamping device. The reference voltage generator is for providing a reference voltage that is relatively constant during a powered EOS/ESD event. The trigger circuit is coupled to receive the reference voltage and a power supply voltage. The trigger circuit is for comparing the reference voltage to the power supply voltage. In response to detecting that the power supply voltage is above the reference voltage, the trigger circuit provides a trigger signal having a voltage proportional to a voltage level of the overvoltage event. The clamping device is coupled between a first power supply terminal and a second power supply terminal. The clamping device is for providing a current path between the first and second power supply terminals in response to the trigger signal.

Abstract: A measurement circuit and method for measuring a quiescent current of a circuit under test are provided. The measurement circuit comprises: a comparator having a first input terminal for receiving a reference voltage, a second input terminal coupled to the circuit under test, and an output terminal; a current source having a first terminal coupled to a first power supply voltage terminal, and a second terminal for providing a current to the circuit under test; a first switch having a first terminal coupled to the second terminal of the current source, a second terminal coupled to the circuit under test, and a control terminal coupled to the output terminal of the comparator; and a first counter having a first input terminal coupled to the output terminal of the comparator, a second input terminal for receiving a clock signal, and an output terminal for providing a first counter value associated with the quiescent current.

Abstract: A design-for-test (DFT) circuit for an integrated circuit (IC) for enabling accurate quiescent current testing. The IC includes a voltage supply pin, a ground pin and an internal voltage regulator coupled between the voltage supply and ground pins for providing an internal output voltage. The DFT circuit includes a voltage storage device which couples to the voltage regulator to temporarily maintain the internal output voltage when the voltage regulator is disabled. The mode control circuit detects a quiescent current test mode, disables the voltage regulator and decouples the voltage regulator from the voltage storage device when the quiescent current test mode is detected. The DFT circuit may include an enable circuit which generates a freeze signal when the quiescent current test mode is detected, and at least one switch which decouples the voltage regulator from the voltage storage node. The DFT circuit is particularly useful for low pin-count ICs.

Abstract: A programmable capacitor array does not require separate switching transistors because the capacitors themselves have a switchable capacitance, which capacitors are made in the manner of regular N channel transistors with their source/drains connected to each other. When a logic low is applied to the gate, the capacitance is relatively low and the capacitance is what is commonly called parasitic capacitance. The capacitance increases significantly when a logic high is applied to the gate because the logic high has the effect of inverting the channel. Thus, the capacitor array is made of transistors that themselves have switchable capacitance operated so that no separate switching transistors are required. This allows for construction of an array of unit capacitors to achieve monotonic operation and good linearity using conventional manufacturing of N channel transistors while achieving significant area savings and reduced power consumption.

Abstract: A fully differential peak detection circuit includes programmable sensitivity and an autozero function. The peak detector has a fully differential charge-coupled analog signal path. The entire analog signal path is autozeroed upon enable and/or in response to sensing a logic zero at the output, where the logic zero follows a logic one. The peak detector includes a differential gain stage for receiving an analog input signal. The differential gain stage includes offset error compensation. The offset error compensation is selected upon enable and/or in response to an output signal of the peak detection circuit and automatically zeros an offset error voltage in response to a predetermined logic state of the output signal. The output of the gain stage is provided to a comparator stage. A plurality of capacitors coupled to the comparator stage stores a predetermined voltage for setting a sensitivity of the peak detector.