Patents by Inventor Daniel C. Guterman
Daniel C. Guterman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6893268Abstract: A peripheral card having a Personal Computer (“PC”) card form factor and removably coupled externally to a host system is further partitioned into a mother card portion and a daughter card portion. The daughter card is removably coupled to the mother card. In the preferred embodiment, a low cost flash “floppy” is accomplished with the daughter card containing only flash EEPROM chips and being controlled by a memory controller residing on the mother card. Other aspects of the invention includes a comprehensive controller on the mother card able to control a predefined set of peripherals on daughter cards connectable to the mother card; relocation of some host resident hardware to the mother card to allow for a minimal host system; a mother card that can accommodate multiple daughter cards; daughter cards that also operates directly with hosts having embedded controllers; daughter cards carrying encoded data and information for decoding it; and daughter cards with security features.Type: GrantFiled: May 6, 2004Date of Patent: May 17, 2005Assignee: SanDisk CorporationInventors: Eliyahou Harari, Daniel C. Guterman, Robert F. Wallace
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Patent number: 6888752Abstract: In a non-volatile memory, the displacement current generated in non-selected word lines that results when the voltage levels on an array's bit lines are changed can result in disturbs. Techniques for reducing these currents are presented. In a first aspect, the number of cells being simultaneously programmed on a word line is reduced. In a non-volatile memory where an array of memory cells is composed of a number of units, and the units are combined into planes that share common word lines, the simultaneous programming of units within the same plane is avoided. Multiple units may be programmed in parallel, but these are arranged to be in separate planes. This is done by selecting the number of units to be programmed in parallel and their order such that all the units programmed together are from distinct planes, by comparing the units to be programmed to see if any are from the same plane, or a combination of these.Type: GrantFiled: July 1, 2003Date of Patent: May 3, 2005Assignee: SanDisk CorporationInventors: John S. Mangan, Daniel C. Guterman, George Samachisa, Brian Murphy, Chi-Ming Wang, Khandker N. Quader
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Patent number: 6873549Abstract: The present invention presents several techniques for using writable tracking cells. Multiple tracking cells are provided for each write block of the memory. These cells are re-programmed each time the user cells of the associated write block are written, preferably at the same time, using the same fixed, global reference levels to set the tracking and user cell programmed thresholds. The threshold voltages of the tracking cells are read every time the user cells are read, and these thresholds are used to determine the stored logic levels of the user cells. In one set of embodiments, populations of one or more tracking cells are associated with different logic levels of a multi-state memory. These tracking cell populations may be provided for only a subset of the logic levels. The read points for translating the threshold voltages are derived for all of the logic levels based upon this subset.Type: GrantFiled: October 23, 2003Date of Patent: March 29, 2005Assignee: SanDisk CorporationInventors: Shahzad B. Khalid, Daniel C. Guterman, Geoffrey S. Gongwer, Richard Simko, Kevin M. Conley
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Patent number: 6862218Abstract: Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.Type: GrantFiled: February 25, 2004Date of Patent: March 1, 2005Assignee: SanDisk CorporationInventors: Daniel C. Guterman, Yupin Kawing Fong
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Patent number: 6861700Abstract: Novel memory cells utilize source-side injection, allowing very small programming currents. If desired, to-be-programmed cells are programmed simultaneously while not requiring an unacceptably large programming current for any given programming operation. In one embodiment, memory arrays are organized in sectors with each sector being formed of a single column or a group of columns having their control gates connected in common. In one embodiment, a high speed shift register is used in place of a row decoder to serially shift in data for the word lines, with all data for each word line of a sector being contained in the shift register on completion of its serial loading. In one embodiment, speed is improved by utilizing a parallel loaded buffer register which receives parallel data from the high speed shift register and holds that data during the write operation, allowing the shift register to receive serial loaded data during the write operation for use in a subsequent write operation.Type: GrantFiled: September 29, 2003Date of Patent: March 1, 2005Assignee: SanDisk CorporationInventors: Daniel C. Guterman, Gheorghe Samachisa, Yupin Kawing Fong, Eliyahou Harari
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Patent number: 6856546Abstract: Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.Type: GrantFiled: November 13, 2001Date of Patent: February 15, 2005Assignee: SanDisk CorporationInventors: Daniel C. Guterman, Yupin Kawing Fong
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Patent number: 6850441Abstract: The present invention presents methods for reducing the amount of noise inherent in the reading of a non-volatile storage device by applying an episodic agitation (e.g. a time varying voltage) to some terminal(s) of the cell as part of the reading process. Various aspects of the present invention also extend to devices beyond non-volatile memories. According to one aspect of the present invention, in addition to the normal voltage levels applied to the cell as part of the reading process, a time varying voltage is applied to the cell. A set of exemplary embodiments apply a single or multiple set of alternating voltages to one or more terminals of a floating gate memory cell just prior to or during the signal integration time of a read process. In other embodiments, other reproducible external or internal agitations which are repeatable, and whose average effect (from one integration time to the next integration time) remains sufficiently constant so as to have a net noise reduction effect is applicable.Type: GrantFiled: January 18, 2002Date of Patent: February 1, 2005Assignee: SanDisk CorporationInventors: Nima Mokhlesi, Daniel C. Guterman, Geoffrey S. Gongwer
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Publication number: 20040255090Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.Type: ApplicationFiled: June 13, 2003Publication date: December 16, 2004Inventors: Daniel C. Guterman, Stephen J. Gross, Shahzad Khalid, Geoffrey S. Gongwer
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Publication number: 20040246798Abstract: Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.Type: ApplicationFiled: March 24, 2004Publication date: December 9, 2004Inventors: Daniel C. Guterman, Yupin Kawing Fong
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Publication number: 20040237010Abstract: Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulative drift becomes so severe that it develops into a hard error. Data could be lost if enough of these hard errors swamps available error correction codes in the memory. A memory device and techniques therefor are capable of detecting these drifts and substantially maintaining the threshold voltage of each memory cell to its intended level throughout the use of the memory device, thereby resisting the development of soft errors into hard errors.Type: ApplicationFiled: June 22, 2004Publication date: November 25, 2004Inventors: Daniel L. Auclair, Jeffrey Craig, John S. Mangan, Robert D. Norman, Daniel C. Guterman, Sanjay Mehrotra
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Publication number: 20040225947Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the qualify indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.Type: ApplicationFiled: June 10, 2004Publication date: November 11, 2004Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
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Publication number: 20040213049Abstract: Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.Type: ApplicationFiled: November 13, 2001Publication date: October 28, 2004Applicant: SanDisk CorporationInventors: Daniel C. Guterman, Yupin Kawing Fong
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Publication number: 20040174744Abstract: Non-volatile memory that has non-volatile charge storing capability such as EEPROM and flash EEPROM is programmed by a programming system that applies to a plurality of memory cells in parallel. Enhanced performance is achieved by programming each cell to its target state with a minimum of programming pulses using a data-dependent programming voltage. Further improvement is accomplished by performing the programming operation in multiphase where each successive phase is executed with a finer programming resolution such as employing a programming voltage with a gentler staircase waveform. These features allow rapid and accurate convergence to the target states for the group of memory cells being programmed in parallel, thereby allowing each cell to store several bits of information without sacrificing performance.Type: ApplicationFiled: March 19, 2004Publication date: September 9, 2004Inventors: Geoffrey Gongwer, Daniel C. Guterman
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Publication number: 20040170058Abstract: Storage elements are read multiple times and the results are accumulated and averaged for each storage element to reduce the effects of noise or other transients in the storage elements and associated circuits that may adversely affect the quality of the read. Several techniques may be employed, including: A full read and transfer of the data from the storage device to the controller device for each iteration, with averaging performed by the controller; a full read of the data for each iteration, with the averaging performed by the storage device, and no transfer to the controller until the final results are obtained; one full read followed by a number of faster re-reads exploiting the already established state information to avoid a fill read, followed by an intelligent algorithm to guide the state at which the storage element is sensed. These techniques may be used as the normal mode of operation, or invoked upon exception condition, depending on the system characteristics.Type: ApplicationFiled: March 12, 2004Publication date: September 2, 2004Inventors: Carlos J. Gonzalez, Daniel C. Guterman
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Patent number: 6785164Abstract: Storage elements are read multiple times and the results are accumulated and averaged for each storage element to reduce the effects of noise or other transients in the storage elements and associated circuits that may adversely affect the quality of the read. Several techniques may be employed, including: A full read and transfer of the data from the storage device to the controller device for each iteration, with averaging performed by the controller; a full read of the data for each iteration, with the averaging performed by the storage device, and no transfer to the controller until the final results are obtained; one full read followed by a number of faster re-reads exploiting the already established state information to avoid a full read, followed by an intelligent algorithm to guide the state at which the storage element is sensed. These techniques may be used as the normal mode of operation, or invoked upon exception condition, depending on the system characteristics.Type: GrantFiled: May 16, 2003Date of Patent: August 31, 2004Assignee: SanDisk CorporationInventors: Carlos J. Gonzalez, Daniel C. Guterman
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Publication number: 20040165431Abstract: Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.Type: ApplicationFiled: February 25, 2004Publication date: August 26, 2004Inventors: Daniel C. Guterman, Yupin Kawing Fong
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Patent number: 6751766Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.Type: GrantFiled: May 20, 2002Date of Patent: June 15, 2004Assignee: SanDisk CorporationInventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
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Publication number: 20040109362Abstract: The present invention presents a “smart verify” technique whereby multi-state memories are programmed using a verify-results-based dynamic adjustment of the multi-states verify range for sequential-state-based verify implementations. This technique can increase multi-state write speed while maintaining reliable operation within sequentially verified, multi-state memory implementations. It does so by providing “intelligent” means to minimize the number of sequential verify operations for each program/verify/lockout step of the write sequence. In an exemplary embodiment of the write sequence for the multi-state memory during a program/verify cycle sequence of the selected storage elements, at the beginning of the process only the lowest state of the multi-state range to which the selected storage elements are being programmed is checked during the verify phase.Type: ApplicationFiled: December 5, 2002Publication date: June 10, 2004Inventors: Geoffrey S. Gongwer, Daniel C. Guterman, Yupin Kawing Fong
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Publication number: 20040105307Abstract: The present invention presents several techniques for using writable tracking cells. Multiple tracking cells are provided for each write block of the memory. These cells are re-programmed each time the user cells of the associated write block are written, preferably at the same time, using the same fixed, global reference levels to set the tracking and user cell programmed thresholds. The threshold voltages of the tracking cells are read every time the user cells are read, and these thresholds are used to determine the stored logic levels of the user cells. In one set of embodiments, populations of one or more tracking cells are associated with different logic levels of a multi-state memory. These tracking cell populations may be provided for only a subset of the logic levels. The read points for translating the threshold voltages are derived for all of the logic levels based upon this subset.Type: ApplicationFiled: October 23, 2003Publication date: June 3, 2004Inventors: Shahzad B. Khalid, Daniel C. Guterman, Geoffrey S. Gongwer, Richard Simko, Kevin M. Conley
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Patent number: 6738289Abstract: Non-volatile memory that has non-volatile charge storing capability such as EEPROM and flash EEPROM is programmed by a programming system that applies to a plurality of memory cells in parallel. Enhanced performance is achieved by programming each cell to its target state with a minimum of programming pulses using a data-dependent programming voltage. Further improvement is accomplished by performing the programming operation in multiphase where each successive phase is executed with a finer programming resolution such as employing a programming voltage with a gentler staircase waveform. These features allow rapid and accurate convergence to the target states for the group of memory cells being programmed in parallel, thereby allowing each cell to store several bits of information without sacrificing performance.Type: GrantFiled: February 26, 2001Date of Patent: May 18, 2004Assignee: SanDisk CorporationInventors: Geoffrey Gongwer, Daniel C. Guterman