Abstract: A semiconductor chip providing on-chip self-testing of an Analog-to-Digital Converter, ADC, implemented in the semiconductor chip is provided. The semiconductor chip comprises the ADC and a Digital-to-Analog Converter, DAC, configured to generate and supply a radio frequency test signal to the ADC via a supply path. The ADC is configured to generate digital output data based on the radio frequency test signal. The semiconductor chip further comprises a reference data generation circuit configured to generate digital reference data. Additionally, the semiconductor chip comprises a comparator circuit configured to compare the digital output data to the digital reference in order to determine error data.

Abstract: The present disclosure relates to a concept for a transformer, a transmitter circuit, a semiconductor chip, a semiconductor package, a base station, a mobile device and a method for a radio frequency transmitter. The transformer for a radio frequency transmitter circuit comprises a primary coil and a secondary coils, which are configured to receive an input signal and to provide an output signal, and a ternary coil configured to provide a feedback signal.

Abstract: A slip ring system of an electrically excited dynamoelectric machine can be designed to be closed or open and includes a carrier segment configured to include a brush holder which includes a brush pocket for receiving a brush. The brush holder includes means for cooling the brush in the brush holder and/or for cooling the brush holder and has a surface-enlarging structure so as to enable a cooling air flow to be guided within the slip ring system and thereby cool the brush holder and/or brush pocket.

Abstract: A Digital-to-Analog Converter, DAC, is provided. The DAC comprises one or more first DAC cells configured to generate a first analog signal based on first digital data. The one or more first DAC cells are coupled to a first output node for coupling to a first load. The DAC comprises one or more second DAC cells configured to generate a second analog signal based on second digital data. The one or more second DAC cells are coupled to a second output node for coupling to a second load. The one or more first DAC cells and the one or more second DAC cells are couplable to a power supply for drawing a supply current. The DAC further comprises a data generation circuit configured to generate the second digital data based on the first digital data.

Abstract: A cooling unit for cold air generation, in particular for snow-making systems, has a mechanically operating de-icing device which comprises at least one rotary shaft (6), which extends between two tube layers (5) transversely to the refrigerant guide tubes and is displaceable in the longitudinal direction of the refrigerant guide tubes (4), and a rotary drive for rotating the rotary shaft (6). The removal elements (16) are designed as rotary elements which are fastened to the rotary shaft (6) and which remove the ice and frost build-up from the refrigerant guide tubes (4) by means of a rotary movement.

Abstract: A system and method for calibrating a time-interleaved digital-to-analog converter (DAC). A calibration signal generator generates calibration data, and a time-interleaved DAC converts the calibration data to an analog calibration signal. An observation analog-to-digital converter (ADC) samples, and quantizes, the analog calibration signal filtered by an anti-alias filter. A mismatch estimation block estimates a frequency response mismatch between the sub-DACs and generates a sub-DAC mismatch correction factor based on an output of the observation ADC. The calibration signal generator applies the sub-DAC mismatch correction factor to the calibration data. The mismatch estimation block may estimate a DC offset mismatch between the sub-DACs based on the output of the observation ADC and generates a DC offset correction factor, and the calibration signal generator applies the DC offset correction factor to the calibration data.

Abstract: A current feedback amplifier (CFA). The CFA includes a common-gate input stage, a biasing circuitry, and a differential pair coupled in parallel between the supply voltage node and the reference voltage node. The common-gate input stage amplifies an input signal received at an input node and supplies it to a gate of the complementary transistors of the differential pair. The biasing circuitry supplies a bias voltage to a gate of the transistors of the common-gate input stage. The input node of the common-gate input stage and a node between the complementary transistors in the first path of the differential pair are shorted.

Abstract: A semiconductor device comprising at least one transmit path is provided. The transmit path comprises an input node for receiving a digital baseband signal. Further, the transmit path comprises digital mixer circuitry coupled to the input node and configured to generate an upconverted digital baseband signal by upconverting a frequency of the digital baseband signal. Additionally, the transmit path comprises Digital-to-Analog Converter (DAC) circuitry coupled to the digital mixer circuitry and configured to generate an analog radio frequency signal based on the upconverted digital baseband signal. The transmit path comprises first analog mixer circuitry coupleable to an output of the DAC circuitry, and second analog mixer circuitry coupleable to the output of the DAC circuitry. Further, the transmit path comprises a first output node coupleable to an output of the first analog mixer circuitry, and a second output node coupleable to an output of the second analog mixer circuitry.

Abstract: A digital-to-analog converter (DAC). A DAC includes a plurality of DAC cells and a controller. The controller generates a control signal for driving the plurality of DAC cells for each clock cycle. The controller may generate the control signal to select a set of one or more DAC cells for an input code or for a standby mode of the DAC such that the selected set of one or more DAC cells to be active for the same input code or for the standby mode of the DAC change over time without affecting an output of the DAC more than a predetermined limit.

Abstract: A segmented digital-to-analog converter (DAC) includes DAC segments, an overrange DAC, and a dither control circuit. Each DAC segment includes a plurality of DAC cells for generating an analog output signal based on input data to each DAC segment. The overrange DAC generates an analog output signal based on a control signal. The dither control circuit adds a dither to first input data supplied to a higher-order DAC segment, subtract a portion of the dither from second input data supplied to a lower-order DAC segment, and generate the control signal for subtracting a remaining portion of the dither from an output of the segmented DAC in an analog domain. The dither added to the first input data may be one of +1, 0, and ?1 and the portion of the dither subtracted from the second input data may be a half of the dither added to the first input data.

Abstract: An apparatus for analog-to-digital conversion is provided. The apparatus includes a first analog-to-digital converter (ADC) configured to receive an input signal and convert the input signal to a sequence of M-bit digital values. The apparatus further includes a second ADC including a plurality of time-interleaved sub-ADCs each being configured to receive the input signal and at least one M-bit digital value of the sequence of M-bit digital values. Further, each of the plurality of time-interleaved sub-ADCs is configured to convert the input signal to a respective sequence of B-bit digital values using the at least one M-bit digital value of the sequence of M-bit digital values. M and B are integers with M<B.

Abstract: Circuitry for digital-to-analog conversion is provided. The circuitry includes a driver circuit and a weighting resistor circuit coupled to an output of the driver circuit. The weighting resistor circuit includes a first resistive sub-circuit coupled to the output of the driver circuit and an intermediate node. The weighting resistor further includes a second resistive sub-circuit coupled to the intermediate node and a common node. Further, the weighting circuit includes a third resistive sub-circuit coupled to the intermediate node and an output of the circuitry. The resistivity of the second resistive sub-circuit is equal to or smaller than the resistivity of the first resistive sub-circuit.

Abstract: A processing device is provided. The processing device comprises one or more interfaces configured to transmit information to a nonlinear device and processing circuitry configured to control the one or more interfaces and to. Further, the processing circuitry is configured to transmit an excitation signal to the nonlinear device and to receive response information from the nonlinear device. Further, the processing circuitry is configured to determine a linear response of the nonlinear device based on the response information and to determine a nonlinear response of the nonlinear device based on the determined linear response.

Abstract: An Analog-to-Digital Converter, ADC, system is provided. The ADC system comprises a plurality of ADC circuits and a first input for receiving a transmit signal of a transceiver. One ADC circuit of the plurality of ADC circuits is coupled to the first input and configured to provide first digital data based on the transmit signal. The ADC system further comprises a second input for receiving a receive signal of the transceiver. The other ADC circuits of the plurality of ADC circuits are coupled to the second input, wherein the other ADC circuits of the plurality of ADC circuits are time-interleaved and configured to provide second digital data based on the receive signal. Additionally, the ADC system comprises a first output configured to output digital feedback data based on the first digital data, and a second output configured to output digital receive data based on the second digital data.

Abstract: Input circuitry for an analog-to-digital converter (ADC) is provided. The input circuitry includes a calibration signal source configured to output a calibration signal for the ADC and an analog circuitry configured to receive and process an analog input signal for the ADC. The analog circuitry is further configured to generate a combined signal by combining the analog input signal and the calibration signal. The input circuitry further includes a buffer amplifier coupled to the analog circuitry and configured to supply a buffered signal to the ADC based on the combined signal. Further, the input circuitry includes neutralization circuitry configured to generate, based on the calibration signal, a neutralization signal for mitigating an unwanted signal component related to a limited reverse isolation of the analog circuitry. The neutralization circuitry is further configured to supply the neutralization signal to at least one of an input node and an intermediate node of the analog circuitry.

Abstract: An apparatus for correcting a mismatch between a first segment and a second segment of a Digital-to-Analog Converter, DAC, is provided. The first segment generates a first contribution to an analog output signal of the DAC based on a first number of bits of a digital input word for the DAC converter, and the second segment generates a second contribution to the analog output signal based on a second number of bits of the digital input word. The apparatus comprises an input configured to receive the digital input word. Further, the apparatus comprises a first processing circuit for the first number of bits comprising a first filter configured to modify the first number of bits in order to generate first modified bits, and a second processing circuit for the second number of bits comprising a second filter configured to modify the second number of bits in order to generate second modified bits. The apparatus additionally comprises an output configured to output a modified digital input word for the DAC.

Abstract: A semiconductor chip providing on-chip self-testing of an Analog-to-Digital Converter, ADC, implemented in the semiconductor chip is provided. The semiconductor chip comprises the ADC and a Digital-to-Analog Converter, DAC, configured to generate and supply a radio frequency test signal to the ADC via a supply path. The ADC is configured to generate digital output data based on the radio frequency test signal. The semiconductor chip further comprises a reference data generation circuit configured to generate digital reference data. Additionally, the semiconductor chip comprises a comparator circuit configured to compare the digital output data to the digital reference in order to determine error data.

Abstract: The invention relates to a milling tool made of cemented carbide having a cylindrical shank (16) and a cutting head (18) for the face milling of workpieces made of a hard-brittle material. The cutting head (18) is configured as an end mill with corner radius or a ball nose end mill having a cutting length (L 2.2). The shank (16) has, up to its chucking end (26), at least one clearance segment (28) having a smaller diameter (d3) than the cutting head (18). The tip of the cutting head (18) is coated or tipped with hard mineral along a length (L2) having a diameter (d1) used for finishing, to which is connected a segment (24), which is used for roughing, having the cutting length (L2.2?L2=L2.1) and a reduced diameter (d4), which is smaller than the diameter (d1) of the cutting length (L2) on the cutting head (18) used for finishing and is greater than the diameter (d3) of the clearance segment (28).

Abstract: A Digital-to-Analog Converter, DAC, is provided. The DAC comprises one or more first DAC cells configured to generate a first analog signal based on first digital data. The one or more first DAC cells are coupled to a first output node for coupling to a first load. The DAC comprises one or more second DAC cells configured to generate a second analog signal based on second digital data. The one or more second DAC cells are coupled to a second output node for coupling to a second load. The one or more first DAC cells and the one or more second DAC cells are couplable to a power supply for drawing a supply current. The DAC further comprises a data generation circuit configured to generate the second digital data based on the first digital data.

Abstract: An apparatus for generating synchronized clock signals is provided. The apparatus comprises a first circuit comprising a clock divider circuit configured to receive a first clock signal and to generate a second clock signal by frequency dividing the first clock signal. Further, the apparatus comprises a one or more second circuits comprising a respective synchronization circuit configured to receive the first clock signal. The synchronization circuit of one of the one or more second circuits is configured to receive the second clock signal from the first circuit and to resample the second clock signal based on the first clock signal in order to generate a replica of the second clock signal that is in phase with the second clock signal.