Patents by Inventor Daniel Rodier
Daniel Rodier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240230509Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: October 27, 2023Publication date: July 11, 2024Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Patent number: 11988593Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: GrantFiled: November 20, 2020Date of Patent: May 21, 2024Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A Ellis, Chris Bonino, Brian A. Knollenberg, James Lumpkin, Daniel Rodier, Dwight Sehler, Mehran Vahdani Moghaddam, Thomas Ramin
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Publication number: 20240133793Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: October 26, 2023Publication date: April 25, 2024Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Patent number: 11946852Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: GrantFiled: December 16, 2021Date of Patent: April 2, 2024Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
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Publication number: 20220397519Abstract: Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.Type: ApplicationFiled: June 14, 2022Publication date: December 15, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Edward YATES, Daniel RODIER
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Patent number: 11428617Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: GrantFiled: December 29, 2020Date of Patent: August 30, 2022Assignee: Particle Measuring Systems, Inc.Inventors: Brian A. Knollenberg, Daniel Rodier
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Publication number: 20220155212Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: ApplicationFiled: December 16, 2021Publication date: May 19, 2022Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
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Patent number: 11268930Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.Type: GrantFiled: August 25, 2020Date of Patent: March 8, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, Brian Knollenberg, Isidro Sanchez
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Patent number: 11237095Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: GrantFiled: April 24, 2020Date of Patent: February 1, 2022Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
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Publication number: 20210381948Abstract: Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.Type: ApplicationFiled: June 8, 2021Publication date: December 9, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Daniel RODIER, Mehran Vahdani MOGHADDAM, Christopher A. BONINO
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Publication number: 20210208054Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.Type: ApplicationFiled: November 20, 2020Publication date: July 8, 2021Applicant: Particle Measuring Systems, Inc.Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
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Publication number: 20210190659Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: ApplicationFiled: December 29, 2020Publication date: June 24, 2021Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. KNOLLENBERG, Daniel RODIER
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Publication number: 20210063349Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.Type: ApplicationFiled: August 25, 2020Publication date: March 4, 2021Inventors: Daniel RODIER, Brian KNOLLENBERG, Isidro SANCHEZ
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Patent number: 10908059Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: GrantFiled: November 13, 2019Date of Patent: February 2, 2021Assignee: PARTICLE MEASURING SYSTEMS, INC.Inventors: Brian A. Knollenberg, Daniel Rodier
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Publication number: 20200355599Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.Type: ApplicationFiled: April 24, 2020Publication date: November 12, 2020Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
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Publication number: 20200158616Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.Type: ApplicationFiled: November 13, 2019Publication date: May 21, 2020Inventors: Brian A. KNOLLENBERG, Daniel RODIER
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Patent number: 9808760Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: GrantFiled: June 6, 2017Date of Patent: November 7, 2017Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
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Publication number: 20170266614Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: ApplicationFiled: June 6, 2017Publication date: September 21, 2017Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
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Patent number: 9682345Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: GrantFiled: July 7, 2015Date of Patent: June 20, 2017Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
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Publication number: 20160008757Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.Type: ApplicationFiled: July 7, 2015Publication date: January 14, 2016Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER