Patents by Inventor Daniel Rodier

Daniel Rodier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240133793
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Application
    Filed: October 26, 2023
    Publication date: April 25, 2024
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
  • Patent number: 11946852
    Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
    Type: Grant
    Filed: December 16, 2021
    Date of Patent: April 2, 2024
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
  • Publication number: 20220397519
    Abstract: Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.
    Type: Application
    Filed: June 14, 2022
    Publication date: December 15, 2022
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian A. KNOLLENBERG, Edward YATES, Daniel RODIER
  • Patent number: 11428617
    Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: August 30, 2022
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Brian A. Knollenberg, Daniel Rodier
  • Publication number: 20220155212
    Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
    Type: Application
    Filed: December 16, 2021
    Publication date: May 19, 2022
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
  • Patent number: 11268930
    Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: March 8, 2022
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel Rodier, Brian Knollenberg, Isidro Sanchez
  • Patent number: 11237095
    Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: February 1, 2022
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel Rodier, James Lumpkin, Dwight Sehler, Brian Knollenberg
  • Publication number: 20210381948
    Abstract: Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.
    Type: Application
    Filed: June 8, 2021
    Publication date: December 9, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Daniel RODIER, Mehran Vahdani MOGHADDAM, Christopher A. BONINO
  • Publication number: 20210208054
    Abstract: The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.
    Type: Application
    Filed: November 20, 2020
    Publication date: July 8, 2021
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Timothy A. ELLIS, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel RODIER, Dwight SEHLER, Mehran Vahdani MOGHADDAM, Thomas RAMIN
  • Publication number: 20210190659
    Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.
    Type: Application
    Filed: December 29, 2020
    Publication date: June 24, 2021
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian A. KNOLLENBERG, Daniel RODIER
  • Publication number: 20210063349
    Abstract: Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.
    Type: Application
    Filed: August 25, 2020
    Publication date: March 4, 2021
    Inventors: Daniel RODIER, Brian KNOLLENBERG, Isidro SANCHEZ
  • Patent number: 10908059
    Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.
    Type: Grant
    Filed: November 13, 2019
    Date of Patent: February 2, 2021
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian A. Knollenberg, Daniel Rodier
  • Publication number: 20200355599
    Abstract: Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
    Type: Application
    Filed: April 24, 2020
    Publication date: November 12, 2020
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Daniel RODIER, James LUMPKIN, Dwight SEHLER, Brian KNOLLENBERG
  • Publication number: 20200158616
    Abstract: Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.
    Type: Application
    Filed: November 13, 2019
    Publication date: May 21, 2020
    Inventors: Brian A. KNOLLENBERG, Daniel RODIER
  • Patent number: 9808760
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: June 6, 2017
    Date of Patent: November 7, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Publication number: 20170266614
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Application
    Filed: June 6, 2017
    Publication date: September 21, 2017
    Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
  • Patent number: 9682345
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: June 20, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Publication number: 20160008757
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Application
    Filed: July 7, 2015
    Publication date: January 14, 2016
    Inventors: Gerald GROMALA, Ronald W. ADKINS, Gilberto DALMASO, Brian A. KNOLLENBERG, Daniel RODIER
  • Patent number: 7235214
    Abstract: A molecular contamination monitoring system includes a piezoelectric measurement sensor exposed to a molecular constituent to be measured; a piezoelectric reference sensor; and a filter for filtering said molecular constituent, the filter located between the reference sensor and the measurement environment. The reference sensor is exposed to the same ambient conditions of temperature, pressure and humidity as the measurement sensor. Alternatively, there may be a plurality of different reference sensors having different filters, or there may be a plurality of different measurement sensors.
    Type: Grant
    Filed: April 23, 2003
    Date of Patent: June 26, 2007
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Daniel Rodier, Scott Waisanen, Dale Griffin
  • Patent number: 7208123
    Abstract: A flow-through monitor for detecting molecular contamination (MC) within a fluid flow. The monitor has a diffusion chamber having an inlet port and an outlet port, and a structure for supporting a fluid flow from the inlet port to the outlet port. The structure includes a flow gap causing a diffusion of molecular contaminants into the diffusion chamber, while substantially preventing, for a rate of the fluid flow above a predetermined magnitude, particulate contaminants within the fluid from entering the diffusion chamber. A SAW device detects molecular contamination interior to the diffusion chamber. Fluid input to the flow-through monitor may be diluted by a pure fluid for extended monitor life. A system for aggregate sampling connects an ensemble manifold upstream of the flow-through monitor. A system for triggered sampling connects a sample preconcentrator downstream of the flow-through monitor. A chemically selective membrane may be located between the flow gap and the SAW.
    Type: Grant
    Filed: June 24, 2002
    Date of Patent: April 24, 2007
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Brian A. Knollenberg, Daniel Rodier, Scott Waisanen