Abstract: A row driver according to an embodiment drives a shared row-reset bus to one of a select voltage and a boosted voltage to select a row for readout and to reset the pixels in the row, respectively. The boosted voltage is higher than the select voltage. A row select circuit includes PMOS transistors through which a path may be opened between a supply line carrying the select voltage and the bus. A reset enable circuit includes PMOS transistors through which a path may be opened between a supply line carrying the boosted voltage and the bus. In order to prevent a parasitic diode leakage between the two supply lines during reset, the n-wells of the PMOS transistors in the row select circuit may be coupled to the supply line carrying the boost voltage.

Abstract: A circuit for generating a reference voltage of an image sensor is provided. The circuit comprises a signal differential amplifier, a gain amplifier, a source follower and a clamp circuit. The signal differential amplifier is adapted for receiving and comparing a bias voltage and the reference voltage, and outputting a first voltage according to a comparison result. The gain amplifier is coupled to the signal differential amplifier, and is adapted for receiving the first voltage and outputting a second voltage. The source follower, coupled to the gain amplifier, and is adapted for receiving the second voltage and outputting the reference voltage. The clamp circuit is coupled to the source follower, and is adapted for receiving the reference voltage and limiting the reference voltage to below a clamp voltage.

Abstract: Imaging sensors having dual-port for digital readout to pipeline readout processes of two different groups of pixels.

Abstract: A frame shuttered CMOS image sensor with simultaneous array readout. An array of CMOS pixels are printed on a silicon substrate. Within each pixel is a light sensitive region comprising a photo sensitive diode for converting photons into electrical charge and at least three transistors to permit reading of reset electrical charges and collected electrical charges and for re-setting the photosensitive diode. The sensor includes an array of signal and re-set readout capacitors located on the substrate but outside of the pixel array. Metal conductors printed in said substrate connect each pixel in said pixel array with a signal capacitor and a re-set capacitor in array of signal and re-set readout capacitors. Transistor switches printed in said substrate but outside of said pixel array are used to isolate the signal and re-set capacitors from each other and from the pixels.

Abstract: A reference voltage generator for use in an image sensor provides a reference voltage to an S/H block during a pixel read-out operation and another reference voltage to an analog-to-digital converter (ADC) during a digitization operation. The reference voltage generator includes a variable voltage generator, a sample-and-hold circuit to sample a reference voltage prior to the pixel read-out operation or the digitization operation, and a buffer amplifier to drive the appropriate reference voltage to the relatively high impedance load presented by the S/H block and the variable impedance load provided by the ADC.

Abstract: A reference voltage generator for use in an image sensor provides a reference voltage to an S/H block during a pixel read-out operation and another reference voltage to an analog-to-digital converter (ADC) during a digitization operation. The reference voltage generator includes a variable voltage generator, a sample-and-hold circuit to sample a reference voltage prior to the pixel read-out operation or the digitization operation, and a buffer amplifier to drive the appropriate reference voltage to the relatively high impedance load presented by the S/H block and the variable impedance load provided by the ADC.

Abstract: A reference voltage generator for use in an image sensor provides a reference voltage to an S/H block during a pixel read-out operation and another reference voltage to an analog-to-digital converter (ADC) during a digitization operation. The reference voltage generator includes a variable voltage generator, a sample-and-hold circuit to sample a reference voltage prior to the pixel read-out operation or the digitization operation, and a buffer amplifier to drive the appropriate reference voltage to the relatively high impedance load presented by the S/H block and the variable impedance load provided by the ADC.

Abstract: CMOS image sensor with a rolling shutter that uses two separate clocks. One of the clocks is used during normal operation. When timing is changed, the other clock is started and used during an interim period to avoid distortion in the image. After that interim period, the new clock timing is coupled to the original clock circuit.

Abstract: A row driver according to an embodiment drives a shared row-reset bus to one of a select voltage and a boosted voltage to select a row for readout and to reset the pixels in the row, respectively. The boosted voltage is higher than the select voltage. A row select circuit includes PMOS transistors through which a path may be opened between a supply line carrying the select voltage and the bus. A reset enable circuit includes PMOS transistors through which a path may be opened between a supply line carrying the boosted voltage and the bus. In order to prevent a parasitic diode leakage between the two supply lines during reset, the n-wells of the PMOS transistors in the row select circuit may be coupled to the supply line carrying the boost voltage.