Abstract: A system and method for measuring a sample by X-ray reflectance scatterometry. The method may include impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles; and collecting at least a portion of the scattered X-ray beam.

Abstract: A system and method for measuring a sample by X-ray reflectance scatterometry. The method may include impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles; and collecting at least a portion of the scattered X-ray beam.

Abstract: A pulsation dampener includes: a housing extending between a first end and a second end and having an exterior surface and an opposed interior surface; a flexible inner tube disposed inside the housing and having an exterior surface and an opposed interior surface, wherein an outer chamber is defined between the interior surface of the housing and the exterior surface of the inner tube; an inlet orifice disposed in the housing communicating with the outer chamber; a sealing structure disposed in the outer chamber and defining a sealing surface, wherein an outlet orifice extends from the sealing surface through the sealing structure to the exterior surface of the housing; and wherein the inner tube is moveable between an open position in which it is spaced away from the sealing surface, and a closed position in which it seals against the sealing surface so as to close off the outlet orifice.

Abstract: A centerbody assembly for a pressure regulator includes: a centerbody having a process surface, at least one outlet orifice disposed in the centerbody; an outlet port positioned in fluid communication with the at least one outlet orifice; an inlet port; a valve chamber positioned in the centerbody in fluid communication with the inlet port, the valve chamber including a valve seat positioned in fluid communication with the process surface; a spherical valve element disposed in the valve chamber and moveable between an open position in which it is spaced away from the valve seat, and a closed position in which it seals against the valve seat; a flexible control diaphragm facing the process surface, wherein a perimeter of the control diaphragm is bonded to the centerbody so as to define a seal that blocks the passage of fluid; and wherein the valve element is mechanically interconnected with the control diaphragm.

Abstract: A support pole is received in a pole receiver. The pole has an outwardly biased spring tab that is compressible by an inside surface of the pole receiver until the spring tab is inserted to a location above a top surface of the pole receiver, thereby creating a secure attachment of the torch assembly to the pole.

Abstract: A single-use centerbody assembly for a valve includes: a centerbody, including: a process surface and a back surface; at least one inlet orifice disposed in the centerbody, and at least one outlet orifice disposed in the centerbody separate from the at least one inlet orifice; a peripheral surface extending between the process surface and the back surface; an inlet fitting extending from the peripheral surface; and an outlet fitting extending from the peripheral surface; a control diaphragm facing the process surface, a perimeter of the control diaphragm being bonded to the centerbody so as to define a seal that blocks the passage of fluid; and a backside diaphragm positioned facing the back surface, a perimeter of the backside diaphragm being bonded to the centerbody so as to define a seal that blocks the passage of fluid.

Abstract: The present invention is intended to provide improved patterned X-ray emitting targets as well as X-ray sources that include patterned X-ray emitting targets as well as X-ray reflectance scatterometry (XRS) systems and also including X-ray photoelectron spectroscopy (XPS) systems and X-ray fluorescence (XRF) systems which employ such X-ray emitting targets.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: A system and method for measuring a sample by X-ray reflectance scatterometry. The method may include impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles; and collecting at least a portion of the scattered X-ray beam.

Abstract: In an example, a method of detecting cyanide exposure of an individual includes: measuring a thiocyanate level of the individual which includes placing saliva of the individual in contact with a chemical indicator to measure the thiocyanate level and measuring thiocyanate (SCN?) catalyzed by enzyme rhodanese of the individual; comparing the measured thiocyanate level to a preset thiocyanate threshold to determine whether the measured thiocyanate level is above the preset thiocyanate threshold indicating a level of cyanide poisoning for which a medical procedure is recommended to manage health effects of the exposure; and performing the medical procedure if the measured thiocyanate level is above the preset thiocyanate threshold and not performing the medical procedure if the measured thiocyanate level is not above the preset thiocyanate threshold.

Abstract: The present invention is intended to provide improved patterned X-ray emitting targets as well as X-ray sources that include patterned X-ray emitting targets as well as X-ray reflectance scatterometry (XRS) systems and also including X-ray photoelectron spectroscopy (XPS) systems and X-ray fluorescence (XRF) systems which employ such X-ray emitting targets.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: A centerbody assembly for a pressure regulator includes: a centerbody having a process surface, at least one outlet orifice disposed in the centerbody; an outlet port positioned in fluid communication with the at least one outlet orifice; an inlet port; a valve chamber positioned in the centerbody in fluid communication with the inlet port, the valve chamber including a valve seat positioned in fluid communication with the process surface; a spherical valve element disposed in the valve chamber and moveable between an open position in which it is spaced away from the valve seat, and a closed position in which it seals against the valve seat; a flexible control diaphragm facing the process surface, wherein a perimeter of the control diaphragm is bonded to the centerbody so as to define a seal that blocks the passage of fluid; and wherein the valve element is mechanically interconnected with the control diaphragm.

Abstract: A support pole is received in a pole receiver. The pole has an outwardly biased spring tab that is compressible by an inside surface of the pole receiver until the spring tab is inserted to a location above a top surface of the pole receiver, thereby creating a secure attachment of the torch assembly to the pole.

Abstract: A support pole is received in a pole receiver. The pole has an outwardly biased spring tab that is compressible by an inside surface of the pole receiver until the spring tab is inserted to a location above a top surface of the pole receiver, thereby creating a secure attachment of the torch assembly to the pole.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: In an example, a method of detecting cyanide exposure of an individual includes: measuring a thiocyanate level of the individual which includes placing saliva of the individual in contact with a chemical indicator to measure the thiocyanate level and measuring thiocyanate (SCN?) catalyzed by enzyme rhodanese of the individual; comparing the measured thiocyanate level to a preset thiocyanate threshold to determine whether the measured thiocyanate level is above the preset thiocyanate threshold indicating a level of cyanide poisoning for which a medical procedure is recommended to manage health effects of the exposure; and performing the medical procedure if the measured thiocyanate level is above the preset thiocyanate threshold and not performing the medical procedure if the measured thiocyanate level is not above the preset thiocyanate threshold.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: In an example, a method of detecting cyanide exposure of an individual comprises measuring a thiocyanate level of the individual, and comparing the measured thiocyanate level to a preset thiocyanate threshold to determine whether the measured thiocyanate level is above the preset thiocyanate threshold indicating a level of cyanide poisoning requiring immediate medical assessment.

Abstract: A hardware system for simulating a network physical layer for communication channels. The hardware system includes a plurality of hardware processors configurable to model a network physical layer and communication channels. The hardware system further includes a multi-point data switch configured to be coupled to various data log points associated with the plurality of hardware processors. The hardware system further includes a RAM coupled to the multi-point data switch, where the RAM is configured to store log data provided by the multi-point data switch as software defined data structures.