Abstract: A system and method for measuring a sample by X-ray reflectance scatterometry. The method may include impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles; and collecting at least a portion of the scattered X-ray beam.

Abstract: Systems and methods for rapidly developing annotated computer models of structures and properties is provided. The system generates three-dimensional (3D) models of structures and property using a wide variety of digital imagery, and/or can process existing 3D models created by other systems. The system processes the 3D models to automatically identify candidate objects within the 3D models that may be suitable for annotation, such as roof faces, chimneys, windows, gutters, etc., using computer vision techniques to automatically identify such objects. Once the candidate objects have been identified, the system automatically generates user interface screens which gather relevant information related to the candidate objects, so as to rapidly obtain, associate, and store annotation information related to the candidate objects.

Abstract: A system and method for generating models from digital images in an interactive environment comprising a memory and a processor in communication with the memory. The processor captures or derives metadata for one or more digital images. The processor derives transforms from the metadata to align the digital images with one or more three-dimensional (“3D”) models of objects/structures represented in the digital image. The processor generates an interactive environment which allows a user to view a contextual model of each of the objects/structures in two dimensional (“2D”) and 3D views.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) are disclosed. For example, a method of measuring a sample by X-ray reflectance scatterometry involves impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles. The method also involves collecting at least a portion of the scattered X-ray beam.

Abstract: A centerbody assembly for a valve includes: a centerbody having a first side which defines a process surface and an opposed second side defining a back surface, at least one inlet orifice disposed in the centerbody and adapted to be disposed in fluid communication with a fluid at a process pressure, and at least one outlet orifice disposed in the centerbody separate from the at least one inlet orifice; an inlet port disposed in fluid communication with the at least one inlet orifice; an outlet port disposed in fluid communication with the at least one outlet orifice; and a flexible control diaphragm having opposed reference and process sides, wherein the control diaphragm is positioned with the process side facing the process surface, and a perimeter of the control diaphragm is sealed to the centerbody.

Abstract: The present invention facilitates efficient and effective utilization of storage management features. In one embodiment, a system comprises: a storage component, a memory controller, and a communication link. The storage component stores information. The memory controller controls the storage component. The communication link communicatively couples the storage component and the memory controller. In one embodiment, the communication link communicates storage system management information between the memory storage component and memory controller, and communication of the storage system management information does not interfere with command/address information communication and data information communication.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: A system and method for construction estimation using aerial images is provided. The system receives at least one aerial image of a building. An estimation engine processes the aerial image at a plurality of angles to automatically identify a plurality (e.g., perimeter and interior) lines in the image corresponding to a plurality of features of a roof the building. The estimation engine allows users to generate two-dimensional and three-dimensional models of the roof by automatically delineating various roof features, and generates a report including information about the roof of the building.

Abstract: There is disclosed packaging (10) for edible product comprising a base component (12) and a separate lid component (14). The base component (12) is formed from a folded blank (28) and has an opening (20) which provides access to a hollow interior (32) for storing edible product. The lid component (14) is bonded to the base component (12) so as to close the opening (20) and inhibit access to the interior (32). The lid component comprises an access panel (18) which can be moved with respect to the base component (12) to open the packaging (10) and provide access to the interior (32) through the opening (20). There is—inter alia—also disclosed a method for manufacturing a packaged product.

Abstract: A method of treating exposure to an organophosphate compound by administering a cyproheptadine compound to a subject in need thereof.

Abstract: Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) are disclosed. For example, a method of measuring a sample by X-ray reflectance scatterometry involves impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles. The method also involves collecting at least a portion of the scattered X-ray beam.

Abstract: A system and method for generating models from digital images in an interactive environment comprising a memory and a processor in communication with the memory. The processor captures or derives metadata for one or more digital images. The processor derives transforms from the metadata to align the digital images with one or more three-dimensional (“3D”) models of objects/structures represented in the digital image. The processor generates an interactive environment which allows a user to view a contextual model of each of the objects/structures in two dimensional (“2D”) and 3D views.

Abstract: Described herein is a combination apparatus and methods of using the combination apparatus. The combination apparatus is operable as both an edger and a sod cutter. The combination apparatus includes an arm that oscillates when driven by a motor. Both a sod cutter blade and an edger blade are coupled to the arm.

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: A system and method for construction estimation using aerial images is provided. The system receives at least one aerial image of a building. An estimation engine processes the aerial image at a plurality of angles to automatically identify a plurality (e.g., perimeter and interior) lines in the image corresponding to a plurality of features of a roof the building. The estimation engine allows users to generate two-dimensional and three-dimensional models of the roof by automatically delineating various roof features, and generates a report including information about the roof of the building.

Abstract: A method of treating exposure to organophosphate agents and preventing morbidity due to such exposure through the administration of a pyrazolopyrimidine compound such as ocinaplon, zaleplon, indiplon, or divaplon.

Abstract: Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) are disclosed. For example, a method of measuring a sample by X-ray reflectance scatterometry involves impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles. The method also involves collecting at least a portion of the scattered X-ray beam.

Abstract: Dynamic error vector magnitude (EVM) compensation is accomplished for radio frequency (RF) power amplifiers (PAs) which experience EVM distortion from thermal settling. Thermal settling causes gain changes in the PAs, and systems, apparatuses, and methods of the present disclosure compensate for known thermal transients of PAs.