Patents by Inventor David Han

David Han has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260105253
    Abstract: A computer implemented method maintains in a database descriptive text characterizing employment roles, employment tasks, employment skills, and image descriptions. Employment role vectors, employment task vectors, employment skill vectors and image description vectors are formed. A selected role is received. A selected role vector is associated with the selected role. A list of matching employment tasks is produced. A selected employment task and an associated selected employment task vector are received. A list of matching employment skills is produced. A list of matching images is produced. A request for employment achievements is received. The selected role is used to produce a list of achievements where each achievement includes a selection from the list of matching employment skills and an image from the list of matching images. A selected achievement is received. The selected achievement is posted to a computer network data feed.
    Type: Application
    Filed: October 11, 2024
    Publication date: April 16, 2026
    Inventors: Richard S. DEVINE, Johanna LOBO, Rizwan AHMED, David HAN, Justin KEMPTON, Kameron Bertine
  • Patent number: 12461110
    Abstract: Disclosed herein are isolated compositions including at least 2 of mutant peptides selected from the group consisting of SEQ ID NOS: 1-149, or polypeptides comprising the mutant peptides; wherein the composition comprises mutant peptides encoded by 2 or more genes. Also disclosed are methods for personalized treatment of breast cancer involving creating a peptide array of mutant peptides comprising the mutations in protein-encoding regions of the high-frequency cancer genes or the exome in a subject and screening the peptide array with a biological sample from the subject to detect antibodies in the biological sample that bind to the array, to detect antigenic targets for therapy in treating the subject.
    Type: Grant
    Filed: March 14, 2022
    Date of Patent: November 4, 2025
    Assignee: UNIVERSITY OF CONNECTICUT
    Inventors: David Han, Veneta Qendro
  • Publication number: 20250264813
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Application
    Filed: April 28, 2025
    Publication date: August 21, 2025
    Applicant: ASML Netherlands B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, Adrianus Cornelis Matheus Koopman, David Han, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Patent number: 12287584
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Grant
    Filed: August 10, 2023
    Date of Patent: April 29, 2025
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Patent number: 12042711
    Abstract: A golf swing training device can be easily worn by a user, without requiring any special connection mechanism or clothing item, to provide adjustably positionable sights that assist users in improving their golf swing. One goal of the training device is to keep the golfer's vision focused on the ball while taking the swing and minimize head movement, especially during the backswing. When the correct focus is established, the swing will follow, therefore enhancing muscle memory to improve the user's swing consistency. A pair of focusing rings may be flexibly connected to a mounting system. The focusing rings can be positioned to help the golfer focus on the ball while taking their swing, especially while putting. The mounting system can secure the focusing rings in the desired position during use, while being comfortable to wear.
    Type: Grant
    Filed: May 4, 2022
    Date of Patent: July 23, 2024
    Inventor: David Han
  • Patent number: 11940740
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Grant
    Filed: June 9, 2022
    Date of Patent: March 26, 2024
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Publication number: 20240019788
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Application
    Filed: August 10, 2023
    Publication date: January 18, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Publication number: 20230356055
    Abstract: A golf swing training device can be easily worn by a user, without requiring any special connection mechanism or clothing item, to provide adjustably positionable sights that assist users in improving their golf swing. One goal of the training device is to keep the golfer’s vision focused on the ball while taking the swing and minimize head movement, especially during the backswing. When the correct focus is established, the swing will follow, therefore enhancing muscle memory to improve the user’s swing consistency. A pair of focusing rings may be flexibly connected to a mounting system. The focusing rings can be positioned to help the golfer focus on the ball while taking their swing, especially while putting. The mounting system can secure the focusing rings in the desired position during use, while being comfortable to wear.
    Type: Application
    Filed: May 4, 2022
    Publication date: November 9, 2023
    Inventor: David Han
  • Publication number: 20220326623
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Application
    Filed: June 9, 2022
    Publication date: October 13, 2022
    Applicant: ASML Netherlands B.V.
    Inventors: Alexander YPMA, Jasper MENGER, David DECKERS, David HAN, Adrianus Cornelis Matheus KOOPMAN, Irina LYULINA, Scott Anderson MIDDLEBROOKS, Richard Johannes Franciscus VAN HAREN, Jochem Sebastiaan WILDENBERG
  • Patent number: 11385550
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Grant
    Filed: May 1, 2020
    Date of Patent: July 12, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Publication number: 20220206011
    Abstract: Disclosed herein are isolated compositions including at least 2 of mutant peptides selected from the group consisting of SEQ ID NOS: 1-149, or polypeptides comprising the mutant peptides; wherein the composition comprises mutant peptides encoded by 2 or more genes. Also disclosed are methods for personalized treatment of breast cancer involving creating a peptide array of mutant peptides comprising the mutations in protein-encoding regions of the high-frequency cancer genes or the exome in a subject and screening the peptide array with a biological sample from the subject to detect antibodies in the biological sample that bind to the array, to detect antigenic targets for therapy in treating the subject.
    Type: Application
    Filed: March 14, 2022
    Publication date: June 30, 2022
    Inventors: David HAN, Veneta QENDRO
  • Patent number: 11373553
    Abstract: A haptic robotic training system includes a haptic robot arm, a position tracking system, a scanning surface, a monitor and a computer. The robotic arm includes a haptic feedback system and holds a custom syringe in place. The position tracking system includes a positon tracking probe shaped like an ultrasound probe and a motion tracker. The scanning surface is a soft pad made from a synthetic phantom tissue. A simulation software receives the positioning data for the syringe from the robotic arm, and for the virtual ultrasound probe from the position tracking system and generates a virtual environment which mimics an actual ultrasound image. The user receives a real time feedback in the form of a haptic feel through the robotic arm, a virtual ultrasound image on the screen, and a performance feedback on the simulation software.
    Type: Grant
    Filed: August 17, 2017
    Date of Patent: June 28, 2022
    Assignee: The Penn State Research Foundation
    Inventors: Scarlett Miller, Jason Z. Moore, David Han, Katelin Mirkin, David Pepley, Mary Yovanoff, Inki Kim
  • Patent number: 11300574
    Abstract: Disclosed herein are isolated compositions including at least 2 of mutant peptides selected from the group consisting of SEQ ID NOS: 1-149, or polypeptides comprising the mutant peptides; wherein the composition comprises mutant peptides encoded by 2 or more genes. Also disclosed are methods for personalized treatment of breast cancer involving creating a peptide array of mutant peptides comprising the mutations in protein-encoding regions of the high-frequency cancer genes or the exome in a subject and screening the peptide array with a biological sample from the subject to detect antibodies in the biological sample that bind to the array, to detect antigenic targets for therapy in treating the subject.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: April 12, 2022
    Assignee: UNIVERSITY OF CONNECTICUT
    Inventors: David Han, Veneta Qendro
  • Patent number: 11295244
    Abstract: A system and methods for mapping price and location of tickets in an event venue are described. An interactive event venue seat map is provided by a network-based system that implements an online marketplace for tickets for upcoming events. The interactive event venue seat map enables sellers to view pricing information and transaction information for both sold and current event listings for any section or zone in an event venue. The interactive event venue seat map allows sellers to browse and click on sections to see sold and listed data for any section and zone in the event venue and to compare a proposed sale price to available pricing information of sold and current event listings in comparable sections. Other embodiments are described and claimed.
    Type: Grant
    Filed: October 28, 2016
    Date of Patent: April 5, 2022
    Assignee: StubHub, Inc.
    Inventors: Eric Thomas, Ganesh Ramamurthy, Benjamin Salles, Mihir Sambhus, David Han
  • Publication number: 20210043112
    Abstract: A haptic robotic training system (200) includes a haptic robot arm (300), a position tracking system (210 and 212), a scanning surface (208), a monitor (214) and a computer. The robotic arm (300) includes a haptic feedback system and holds a custom syringe (500) in place. The position tracking system includes a position tracking probe (210) shaped like an ultrasound probe and a motion tracker (212). The scanning surface (208) is a soft pad made from a synthetic phantom tissue. A simulation software receives the positioning data for the syringe from the robotic arm, and for the virtual ultrasound probe from the position tracking system and generates a virtual environment which mimics an actual ultrasound image. The user receives a real time feedback in the form of a haptic feel through the robotic arm, a virtual ultrasound image on the screen, and a performance feedback on the simulation software.
    Type: Application
    Filed: August 17, 2017
    Publication date: February 11, 2021
    Inventors: Scarlett Miller, Jason Z. Moore, David Han, Katelin Mirkin, David Pepley, Mary Yovanoff, Inki Kim
  • Publication number: 20200264520
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Application
    Filed: May 1, 2020
    Publication date: August 20, 2020
    Applicant: ASML Netherlands B.V
    Inventors: Alexander YPMA, Jasper MENGER, David DECKERS, David HAN, Adrianus Cornelis Matheus KOOPMAN, Irina LYULINA, Scott Anderson MIDDLEBROOKS, Richard Johannes Franciscu VAN HAREN, Jochem Sebastiaan WILDENBERG
  • Patent number: 10642162
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Grant
    Filed: March 13, 2019
    Date of Patent: May 5, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Publication number: 20190278188
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in the multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Application
    Filed: March 13, 2019
    Publication date: September 12, 2019
    Applicant: ASML Netherlands B.V.
    Inventors: Alexander YPMA, Jasper MENGER, David DECKERS, David HAN, Adrianus Cornelis Matheus KOOPMAN, Irina LYULINA, Scott Anderson MIDDLEBROOKS, Richard Johannes Franciscus VAN HAREN, Jochem Sebastiaan WILDENBERG
  • Patent number: 10274834
    Abstract: In a lithographic process, product units such as semiconductor wafers are subjected to lithographic patterning operations and chemical and physical processing operations. Alignment data or other measurements are made at stages during the performance of the process to obtain object data representing positional deviation or other parameters measured at points spatially distributed across each unit. This object data is used to obtain diagnostic information by performing a multivariate analysis to decompose a set of vectors representing the units in said multidimensional space into one or more component vectors. Diagnostic information about the industrial process is extracted using the component vectors. The performance of the industrial process for subsequent product units can be controlled based on the extracted diagnostic information.
    Type: Grant
    Filed: March 8, 2018
    Date of Patent: April 30, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina, Scott Anderson Middlebrooks, Richard Johannes Franciscus Van Haren, Jochem Sebastiaan Wildenberg
  • Patent number: D1033649
    Type: Grant
    Filed: May 12, 2022
    Date of Patent: July 2, 2024
    Inventor: David Han