Abstract: The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination circuit includes a measurable circuit element and determines the state of the measurable element. The replicate circuit includes a replicate circuit element which has similar electrical characteristics as the measurable element, and is configured to aid in determining an adjustable test current. The trim determination circuit generates a test current which is proportional to the adjustable test current. The test current is passed through the measurable element such that a first voltage drop occurs across the measurable element. A measured current is generated at a current level dictated by the voltage drop across the measurable element, such that the state of the measurable element is determined by the difference between the measured current and a scaled reference current.

Abstract: A class AB low voltage output stage with improved current drive capability where the signal input to the stage modulates the base drive currents of both an output transistor sourcing current to a load and an output transistor sinking current from the load. Coupling the base drive currents by means of the input amplifier permits higher drive currents to be obtained for the output transistors without increasing the quiescent current of the circuit.