Patents by Inventor David P. Nackashi

David P. Nackashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
    Patent number: 9818578
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: November 14, 2017
    Assignee: Protochips, Inc.
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, Jr., Franklin Stampley Walden, II, David P. Nackashi
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20170278670
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: May 30, 2017
    Publication date: September 28, 2017
    Inventors: John Damiano, JR., David P. Nackashi, Stephen E. Mick
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 9666409
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: May 30, 2017
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS OR LARGER CONDUCTIVE SAMPLES
    Publication number: 20170062177
    Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
    Type: Application
    Filed: August 31, 2016
    Publication date: March 2, 2017
    Inventors: Franklin Stampley Walden II, John Damiano, JR., Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter
  • METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER
    Publication number: 20170054239
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Application
    Filed: September 1, 2016
    Publication date: February 23, 2017
    Inventors: John DAMIANO, JR., David P. NACKASHI, Daniel Stephen Gardiner, Franklin Stampley WALDEN, II, William Bradford CARPENTER
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20170025245
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: October 7, 2016
    Publication date: January 26, 2017
    Inventors: John Damiano, JR., David P. Nackashi, Stephen E. Mick
  • Method for forming an electrical connection to an sample support in an electron microscope holder
    Patent number: 9437393
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Grant
    Filed: November 13, 2013
    Date of Patent: September 6, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Franklin Stampley Walden, II, William Bradford Carpenter
  • MICROSCOPY SUPPORT STRUCTURES
    Publication number: 20160172153
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: February 23, 2016
    Publication date: June 16, 2016
    Inventors: John DAMIANO, Jr., Stephen E. MICK, David P. NACKASHI
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20160126056
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: January 13, 2016
    Publication date: May 5, 2016
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 9324539
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: April 26, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • Specimen holder used for mounting samples in electron microscopes
    Patent number: 9312097
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: October 14, 2014
    Date of Patent: April 12, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Microscopy support structures
    Patent number: 9275826
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: October 28, 2014
    Date of Patent: March 1, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Sample holder for electron microscopy for low-current, low-noise analysis
    Patent number: 9275825
    Abstract: A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: March 1, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, David P. Nackashi, Daniel S. Gardiner
  • METHOD FOR SAFE CONTROL OF GAS DELIVERY TO AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20160033355
    Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 4, 2016
    Inventors: Daniel S. Gardiner, John Damiano, JR., David P. Nackashi, William Bradford Carpenter, James Rivenbark, Mark Uebel, Michael Zapata, III, Rebecca Thomas, Franklin Stampley Walden, II
  • MEMBRANE SUPPORTS WITH REINFORCEMENT FEATURES
    Publication number: 20150338322
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Application
    Filed: May 22, 2015
    Publication date: November 26, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI, Madeline DUKES
  • METHOD FOR MONITORING ENVIRONMENTAL STATES OF A MICROSCOPE SAMPLE WITH AN ELECTRON MICROSCOPE SAMPLE HOLDER
    Publication number: 20150235805
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Application
    Filed: February 19, 2015
    Publication date: August 20, 2015
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, Jr., Franklin Stampley Walden, II, David P. Nackashi
  • MICROSCOPY SUPPORT STRUCTURES
    Publication number: 20150179397
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: October 28, 2014
    Publication date: June 25, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI
  • Specimen mount for microscopy
    Patent number: 9064672
    Abstract: Mounts, stages, and systems that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope. The mounts fixture and interface with a device, wherein the device corresponds to a structure that holds a specimen for microscopic imaging. The mounts are mateably and/or electrically compatible with a stage. Systems using the devices, mounts, and stages that can be used directly within the electron microscope are disclosed.
    Type: Grant
    Filed: December 22, 2008
    Date of Patent: June 23, 2015
    Assignee: PROTOCHIPS, INC.
    Inventors: Stephen E. Mick, John Damiano, David P. Nackashi
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20150162164
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: September 9, 2014
    Publication date: June 11, 2015
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Membrane supports with reinforcement features
    Patent number: 9040939
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Grant
    Filed: February 29, 2008
    Date of Patent: May 26, 2015
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi