Patents by Inventor David P. Nackashi

David P. Nackashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
    Publication number: 20150129778
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: October 14, 2014
    Publication date: May 14, 2015
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Sample support structure and methods
    Patent number: 8920723
    Abstract: A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: December 30, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • SAMPLE HOLDER FOR ELECTRON MICROSCOPY FOR LOW-CURRENT, LOW-NOISE ANALYSIS
    Publication number: 20140361194
    Abstract: A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.
    Type: Application
    Filed: December 28, 2012
    Publication date: December 11, 2014
    Inventors: John Damiano, David P. Nackashi, Daniel S. Gardiner
  • Sample holder providing interface to semiconductor device with high density connections
    Patent number: 8872128
    Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes is provided. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: October 28, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi, Montie Roland, Paul Hakenewerth
  • Microscopy support structures
    Patent number: 8872129
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: May 9, 2008
    Date of Patent: October 28, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Specimen holder used for mounting samples in electron microscopes
    Patent number: 8859991
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: October 14, 2014
    Assignee: Protochips, Inc.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Specimen holder used for mounting samples in electron microscopes
    Patent number: 8853646
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: February 4, 2013
    Date of Patent: October 7, 2014
    Assignee: Protochips, Inc.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 8829469
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: August 2, 2011
    Date of Patent: September 9, 2014
    Assignee: PROTOCHIPS, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER
    Publication number: 20140138558
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Application
    Filed: November 13, 2013
    Publication date: May 22, 2014
    Applicant: PROTOCHIPS, INC.
    Inventors: John DAMIANO, JR., David P. NACKASHI, Daniel Stephen GARDINER, Franklin Stampley WALDEN, II, William Bradford CARPENTER
  • SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH DENSITY CONNECTIONS
    Publication number: 20130277572
    Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes is provided. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: June 18, 2013
    Publication date: October 24, 2013
    Inventors: JOHN DAMIANO, JR., STEPHEN E. MICK, DAVID P. NACKASHI, MONTIE ROLAND, PAUL HAKENEWERTH
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20130264476
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: August 2, 2011
    Publication date: October 10, 2013
    Applicant: PROTOCHIPS, INC.
    Inventors: John Damiano, JR., David P. Nackashi, Stephen E. Mick
  • Specimen holder used for mounting
    Patent number: 8513621
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: March 17, 2009
    Date of Patent: August 20, 2013
    Assignee: Protochips, Inc.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Sample holder providing interface to semiconductor device with high density connections
    Patent number: 8466432
    Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: April 12, 2011
    Date of Patent: June 18, 2013
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi, Montie Roland, Paul A. Hakenewerth
  • SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH DENSITY CONNECTIONS
    Publication number: 20110248165
    Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: April 12, 2011
    Publication date: October 13, 2011
    Applicant: PROTOCHIPS, INC.
    Inventors: John Damiano, JR., Stephen E. Mick, David P. Nackashi, Montie Roland, Paul A. Hakenewerth
  • SPECIMEN HOLDER USED FOR MOUNTING
    Publication number: 20110127427
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: March 17, 2009
    Publication date: June 2, 2011
    Applicant: PROTOCHIPS, INC.
    Inventors: David P. Nackashi, John Damiano, JR., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • MICROSCOPY SUPPORT STRUCTURES
    Publication number: 20110079710
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: May 9, 2008
    Publication date: April 7, 2011
    Applicant: PROTOCHIPS, INC.
    Inventors: John Damiano, JR., Stephen E. Mick, David P. Nackashi
  • SPECIMEN MOUNT FOR MICROSCOPY
    Publication number: 20110032611
    Abstract: Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.
    Type: Application
    Filed: December 22, 2008
    Publication date: February 10, 2011
    Applicant: PROTOCHIPS, INC.
    Inventors: Stephen E. Mick, John Damiano, David P. Nackashi
  • REUSABLE TEMPLATE FOR CREATION OF THIN FILMS; METHOD OF MAKING AND USING TEMPLATE; AND THIN FILMS PRODUCED FROM TEMPLATE
    Publication number: 20100221488
    Abstract: The present invention is directed generally to templates used in the creation of thin-film replicas, for example, the creation of thin films, such as carbon films, for use as specimen support in electron-beam specimen analysis. More specifically, the present invention is directed to novel reusable patterned templates, the methodology of making these reusable templates, the templates made from such methodologies, the use and reuse of these templates to make thin films of any type for any purpose, and the thin films made from these templates. A feature of the novel template of the present invention is in its employment of one or more zones of discontinuity, or undercuts, associated with the patterns transferred into the template to allow for the removal of the thin film from the template without sacrificing the structural integrity of the template to prevent at least one re-use of the template.
    Type: Application
    Filed: May 11, 2010
    Publication date: September 2, 2010
    Applicant: PROTOCHIPS, INC.
    Inventors: Stephen E. Mick, John Damiano, JR., David P. Nackashi
  • SAMPLE SUPPORT STRUCTURE AND METHODS
    Publication number: 20100143198
    Abstract: A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
    Type: Application
    Filed: November 16, 2007
    Publication date: June 10, 2010
    Applicant: PROTOCHIPS, INC.
    Inventors: John Damiano, JR., Stephen E. Mick, David P. Nackashi
  • MEMBRANE SUPPORTS WITH REINFORCEMENT FEATURES
    Publication number: 20100140497
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Application
    Filed: February 29, 2008
    Publication date: June 10, 2010
    Applicant: PROTOCHIPS, INC.
    Inventors: John Damiano, JR., Stephen E. Mick, David P. Nackashi