Patents by Inventor David Rafferty
David Rafferty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10229824Abstract: A mass spectrometer for analyzing a sample may include an analysis chamber for analyzing the sample and a first vacuum pump operably connected to the analysis chamber, wherein the first vacuum pump operates to create a first vacuum state. The mass spectrometer may also include a sample-preparation chamber operably connected to the analysis chamber and a second vacuum pump that operates to create a second vacuum state, wherein the first vacuum state is a lower pressure than the second vacuum state. The second vacuum pump may be operably connected to the first vacuum pump in a first configuration, and the second vacuum pump may be operably connected to the sample-preparation chamber in a second configuration.Type: GrantFiled: March 11, 2013Date of Patent: March 12, 2019Assignee: 1st Detect CorporationInventors: Michael Spencer, Warren Mino, David Rafferty
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Patent number: 9870912Abstract: Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise an ion trap and a signal generator for applying an excitation signal to the ion trap. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the excitation signal.Type: GrantFiled: January 24, 2017Date of Patent: January 16, 2018Assignee: 1st Detect CorporationInventors: David Rafferty, Louis Johnson
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Patent number: 9804141Abstract: Methods, devices, and systems are disclosed for releasing a sample from a carrier medium. A method of releasing a sample from a carrier medium comprises treating a sample on a carrier medium with a first organic reagent, wherein when the sample contains at least one inorganic salt, the first organic reagent binds to a cation of the inorganic salt to produce both a first volatile compound and an isolated anion of the inorganic salt; treating the sample on the carrier medium with a second organic reagent, wherein the second organic reagent reacts with the isolated anion to produce a second volatile compound; and releasing the treated sample from the carrier medium, wherein when the first and the second volatile compounds are produced, the releasing step releases at least one of the first and second volatile compounds from the carrier medium.Type: GrantFiled: May 16, 2014Date of Patent: October 31, 2017Assignee: 1st Detect CorporationInventors: Guido Fridolin Verbeck, IV, David Rafferty, James Wylde, Michael Spencer
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Publication number: 20170133214Abstract: Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise an ion trap and a signal generator for applying an excitation signal to the ion trap. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the excitation signal.Type: ApplicationFiled: January 24, 2017Publication date: May 11, 2017Inventors: David RAFFERTY, Louis JOHNSON
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Patent number: 9599547Abstract: A chemical pre-concentrator includes a conduit defining a flow path between two ends and having a heating element disposed within the conduit, such that the heating element has at least one sorbent material deposited directly on at least a portion of a conductive surface of the heating element. Some such heating elements are in the form of electrically conductive strips defining both a plurality of apertures through the strip and a series of undulations spaced along the flow path.Type: GrantFiled: May 5, 2014Date of Patent: March 21, 2017Assignee: 1st DETECT CORPORATIONInventors: David Rafferty, Michael Spencer, James Wylde, Pedro Ojeda, Thomas Bowden
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Patent number: 9570282Abstract: A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.Type: GrantFiled: March 12, 2014Date of Patent: February 14, 2017Assignee: 1ST DETECT CORPORATIONInventors: Abrar Riaz, David Rafferty, James Wylde
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Patent number: 9472388Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer.Type: GrantFiled: January 20, 2015Date of Patent: October 18, 2016Assignee: 1st DETECT CORPORATIONInventors: James Wylde, David Rafferty, Michael Spencer
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Patent number: 9451364Abstract: A chemical analysis system is disclosed wherein, in evacuating a preconcentrator housing (2) prior to desorption, a pump system (13) reduces an internal pressure of the preconcentrator housing to a level substantially equal to an internal pressure of a chemical analyzer such that flow restrictors and/or membranes (15) between the chemical analyzer (7) and the preconcentrator housing (2) may be omitted. The chemical analysis system includes a chemical analyzer (7), a preconcentrator housing (2) coupled to the chemical analyzer, the preconcentrator housing enclosing a temperature control element (5, 18) and a sorbent material (1), the temperature control element configured to heat the sorbent material to adsorb or desorb a chemical of interest; and a pump system (13) coupled to the preconcentrator housing and the chemical analyzer, the pump system configured to evacuate the preconcentrator housing prior to desorption of the chemical of interest.Type: GrantFiled: August 27, 2010Date of Patent: September 20, 2016Assignee: 1ST DETECT CORPORATIONInventors: David Rafferty, James Wylde, Michael Spencer, Pedro Ojeda
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Patent number: 9312112Abstract: In one general aspect, a sample is transferred into a mass spectrometer by capturing a sample on a collector, inserting the collector into a sample chamber coupled to the mass spectrometer and a vacuum pump, evacuating the sample chamber using the vacuum pump to reduce an internal pressure of the sample chamber to a level less than atmospheric pressure, heating the collector to release the sample from the collector, and introducing the sample into the mass spectrometer from the evacuated sample chamber.Type: GrantFiled: January 11, 2012Date of Patent: April 12, 2016Assignee: 1ST DETECT CORPORATIONInventors: David Rafferty, James Wylde, Michael Spencer, Pedro Ojeda
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Patent number: 9299545Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.Type: GrantFiled: January 22, 2015Date of Patent: March 29, 2016Assignee: 1ST DETECT CORPORATIONInventors: David Rafferty, James Wylde, Michael Spencer, Warren Mino
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Patent number: 9214321Abstract: A mass spectrometer for analyzing a sample utilizing an ion trap comprises an entrance end cap defining an entrance aperture configured to receive the sample entering the ion trap; a ring electrode defining a ring cavity configured to generate, based on a radio frequency (RF) voltage applied to the ring electrode, an electric field configured to trap the sample received through the entrance aperture; an exit end cap defining an exit aperture configured to receive sample ions exiting the ion trap; and an end cap controller configured to generate a bias control voltage for applying a DC bias potential to at least one of the entrance end or the exit end cap, wherein a value of the bias control voltage is based on an operational parameter of the mass spectrometer.Type: GrantFiled: March 11, 2013Date of Patent: December 15, 2015Assignee: 1ST DETECT CORPORATIONInventor: David Rafferty
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Patent number: 9214325Abstract: Apparatuses and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device. The ion trap device may comprise a first end cap having a first aperture and a second end cap having a second aperture, wherein the first aperture and the second aperture may define an ejection axis. The ion trap device may also comprise a ring electrode substantially coaxially aligned between the first and second end caps. The ring electrode may include an opening extending along a radial direction of the ring electrode, wherein the radial direction is substantially perpendicular to the ejection axis. One such method may include ionizing a sample in an ion trap through an opening separating at least part of first and second ring sections of the ion trap and detecting ions ejected though an aperture on an end cap of the ion trap.Type: GrantFiled: March 14, 2014Date of Patent: December 15, 2015Assignee: 1ST DETECT CORPORATIONInventors: David Rafferty, Michael Spencer
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Patent number: 9196467Abstract: A mass spectrometer comprising a controller configured to generate an RF signal to be applied to an electrode during the mass scan, wherein the electrode generates, based on the RF signal, an electric field to be applied to sample ions during a mass scan; an ion detector configured to detect sample ions passing through the electric field and generate a corresponding ion detection signal; and a sampling circuit configured to sample the ion detection signal; wherein the controller is configured to adjust a phase of the at least one RF signal relative to a sample timing of the sampling circuit and average successive mass scans to cancel a portion of the RF signal present in the ion detection signal.Type: GrantFiled: March 11, 2013Date of Patent: November 24, 2015Assignee: 1st DETECT CORPORATIONInventors: David Rafferty, David Lorenz Gardner, James Wylde
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Publication number: 20150330961Abstract: Methods, devices, and systems are disclosed for releasing a sample from a carrier medium. A method of releasing a sample from a carrier medium comprises treating a sample on a carrier medium with a first organic reagent, wherein when the sample contains at least one inorganic salt, the first organic reagent binds to a cation of the inorganic salt to produce both a first volatile compound and an isolated anion of the inorganic salt; treating the sample on the carrier medium with a second organic reagent, wherein the second organic reagent reacts with the isolated anion to produce a second volatile compound; and releasing the treated sample from the carrier medium, wherein when the first and the second volatile compounds are produced, the releasing step releases at least one of the first and second volatile compounds from the carrier medium.Type: ApplicationFiled: May 16, 2014Publication date: November 19, 2015Applicant: 1ST DETECT CORPORATIONInventors: Guido Fridolin VERBECK, IV, David RAFFERTY, James WYLDE, Michael SPENCER
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Publication number: 20150235826Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.Type: ApplicationFiled: January 22, 2015Publication date: August 20, 2015Applicant: 1ST DETECT CORPORATIONInventors: David Rafferty, James Wylde, Michael Spencer, Warren Mino
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Publication number: 20150228468Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer.Type: ApplicationFiled: January 20, 2015Publication date: August 13, 2015Applicant: 1ST DETECT CORPORATIONInventors: James Wylde, David Rafferty, Michael Spencer
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Patent number: 9082599Abstract: An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapole field.Type: GrantFiled: November 18, 2013Date of Patent: July 14, 2015Assignee: 1st Detect CorporationInventors: David Rafferty, Michael Spencer
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Patent number: 9035244Abstract: A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.Type: GrantFiled: March 10, 2014Date of Patent: May 19, 2015Assignee: 1st Detect CorporationInventors: David Rafferty, Michael Spencer, James Wylde, David Lorenz Gardner, Warren Mino
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Patent number: 8975573Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.Type: GrantFiled: March 11, 2013Date of Patent: March 10, 2015Assignee: 1st Detect CorporationInventors: David Rafferty, James Wylde, Michael Spencer, Warren Mino
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Patent number: 8969794Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture.Type: GrantFiled: March 12, 2014Date of Patent: March 3, 2015Assignee: 1st Detect CorporationInventors: James Wylde, David Rafferty, Michael Spencer