Patents by Inventor David Rafferty
David Rafferty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8975573Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.Type: GrantFiled: March 11, 2013Date of Patent: March 10, 2015Assignee: 1st Detect CorporationInventors: David Rafferty, James Wylde, Michael Spencer, Warren Mino
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Patent number: 8969794Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture.Type: GrantFiled: March 12, 2014Date of Patent: March 3, 2015Assignee: 1st Detect CorporationInventors: James Wylde, David Rafferty, Michael Spencer
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Patent number: 8946624Abstract: A mass spectrometer system is disclosed. The mass spectrometer includes a vacuum chamber defining an enclosed evacuated space and an ion trap disposed in the enclosed space. The ion trap is configured to trap an ionized sample. The mass spectrometer further includes an ion detector coupled to the chamber at a location external to the chamber such that sample ions may exit the evacuated space and into the externally-coupled detector without loss of vacuum pressure.Type: GrantFiled: March 14, 2014Date of Patent: February 3, 2015Assignee: 1st Detect CorporationInventors: David Rafferty, Michael Spencer
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Publication number: 20150010442Abstract: A chemical pre-concentrator includes a conduit defining a flow path between two ends and having a heating element disposed within the conduit, such that the heating element has at least one sorbent material deposited directly on at least a portion of a conductive surface of the heating element. Some such heating elements are in the form of electrically conductive strips defining both a plurality of apertures through the strip and a series of undulations spaced along the flow path.Type: ApplicationFiled: May 5, 2014Publication date: January 8, 2015Inventors: David Rafferty, Michael Spencer, James Wylde, Pedro Ojeda, Thomas Bowden
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Publication number: 20140299760Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture.Type: ApplicationFiled: March 12, 2014Publication date: October 9, 2014Applicant: 1ST DETECT CORPORATIONInventors: James Wylde, David Rafferty, Michael Spencer
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Publication number: 20140264013Abstract: A mass spectrometer system is disclosed. The mass spectrometer includes a vacuum chamber defining an enclosed evacuated space and an ion trap disposed in the enclosed space. The ion trap is configured to trap an ionized sample. The mass spectrometer further includes an ion detector coupled to the chamber at a location external to the chamber such that sample ions may exit the evacuated space and into the externally-coupled detector without loss of vacuum pressure.Type: ApplicationFiled: March 14, 2014Publication date: September 18, 2014Applicant: 1st Detect CorporationInventors: David Rafferty, Michael Spencer
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Publication number: 20140264006Abstract: Apparatuses and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device. The ion trap device may comprise a first end cap having a first aperture and a second end cap having a second aperture, wherein the first aperture and the second aperture may define an ejection axis. The ion trap device may also comprise a ring electrode substantially coaxially aligned between the first and second end caps. The ring electrode may include an opening extending along a radial direction of the ring electrode, wherein the radial direction is substantially perpendicular to the ejection axis. One such method may include ionizing a sample in an ion trap through an opening separating at least part of first and second ring sections of the ion trap and detecting ions ejected though an aperture on an end cap of the ion trap.Type: ApplicationFiled: March 14, 2014Publication date: September 18, 2014Applicant: 1st Detect CorporationInventors: David RAFFERTY, Michael SPENCER
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Publication number: 20140264010Abstract: A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.Type: ApplicationFiled: March 12, 2014Publication date: September 18, 2014Applicant: 1ST DETECT CORPORATIONInventors: Abrar RIAZ, David RAFFERTY, James WYLDE
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Publication number: 20140252220Abstract: A mass spectrometer comprising a controller configured to generate an RF signal to be applied to an electrode during the mass scan, wherein the electrode generates, based on the RF signal, an electric field to be applied to sample ions during a mass scan; an ion detector configured to detect sample ions passing through the electric field and generate a corresponding ion detection signal; and a sampling circuit configured to sample the ion detection signal; wherein the controller is configured to adjust a phase of the at least one RF signal relative to a sample timing of the sampling circuit and average successive mass scans to cancel a portion of the RF signal present in the ion detection signal.Type: ApplicationFiled: March 11, 2013Publication date: September 11, 2014Applicant: 1st Detect CorporationInventors: David Rafferty, David Lorenz Gardner, James Wylde
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Publication number: 20140252224Abstract: An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapole field.Type: ApplicationFiled: November 18, 2013Publication date: September 11, 2014Applicant: 1st DETECT CORPORATIONInventors: David Rafferty, Michael Spencer
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Publication number: 20140252215Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.Type: ApplicationFiled: March 11, 2013Publication date: September 11, 2014Applicant: 1st Detect CorporationInventors: David Rafferty, James Wylde, Michael Spencer, Warren Mino
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Publication number: 20140250977Abstract: A mass spectrometer for analyzing a sample may include an analysis chamber for analyzing the sample and a first vacuum pump operably connected to the analysis chamber, wherein the first vacuum pump operates to create a first vacuum state. The mass spectrometer may also include a sample-preparation chamber operably connected to the analysis chamber and a second vacuum pump that operates to create a second vacuum state, wherein the first vacuum state is a lower pressure than the second vacuum state. The second vacuum pump may be operably connected to the first vacuum pump in a first configuration, and the second vacuum pump may be operably connected to the sample-preparation chamber in a second configuration.Type: ApplicationFiled: March 11, 2013Publication date: September 11, 2014Applicant: 1st Detect CorporationInventors: Michael Spencer, Warren Mino, David Rafferty
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Publication number: 20140252219Abstract: A mass spectrometer for analyzing a sample utilizing an ion trap comprises an entrance end cap defining an entrance aperture configured to receive the sample entering the ion trap; a ring electrode defining a ring cavity configured to generate, based on a radio frequency (RF) voltage applied to the ring electrode, an electric field configured to trap the sample received through the entrance aperture; an exit end cap defining an exit aperture configured to receive sample ions exiting the ion trap; and an end cap controller configured to generate a bias control voltage for applying a DC bias potential to at least one of the entrance end or the exit end cap, wherein a value of the bias control voltage is based on an operational parameter of the mass spectrometer.Type: ApplicationFiled: March 11, 2013Publication date: September 11, 2014Applicant: 1st Detect CorporationInventor: DAVID RAFFERTY
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Publication number: 20140252222Abstract: A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.Type: ApplicationFiled: March 10, 2014Publication date: September 11, 2014Applicant: 1st Detect CorporationInventors: David RAFFERTY, Michael SPENCER, James WYLDE, David Lorenz GARDNER, Warren MINO
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Patent number: 8784737Abstract: A chemical pre-concentrator includes a conduit defining a flow path between two ends and having a heating element disposed within the conduit, such that the heating element has at least one sorbent material deposited directly on at least a portion of a conductive surface of the heating element. Some such heating elements are in the form of electrically conductive strips defining both a plurality of apertures through the strip and a series of undulations spaced along the flow path.Type: GrantFiled: February 7, 2012Date of Patent: July 22, 2014Assignee: 1st Detect CorporationInventors: David Rafferty, Michael Spencer, James Wylde, Pedro Ojeda, Thomas Bowden
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Publication number: 20140190245Abstract: Processing a liquid sample (204) having an analyte (206) by reducing a pressure in a container (200) including the liquid sample to less than atmospheric pressure and maintaining a reduced pressure in the container. Reducing the pressure in the container (200) and optionally agitating the liquid sample increases an amount of vapor-phase analyte (206) above the liquid sample. In some cases, a concentration of the vapor-phase analyte is further increased, for example, with a chemical trap (502). The vapor-phase analyte can be provided to a chemical analyzer (302).Type: ApplicationFiled: June 21, 2012Publication date: July 10, 2014Inventors: David Rafferty, Abrar Riaz, Michael Spencer, William R. Stott, James Wylde
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Patent number: 8754361Abstract: A mass spectrometer comprises an ion trap configured to trap ions and to eject ions. The ion trap comprises an electrode. The mass spectrometer further comprises a detector configured to detect ions ejected from the ion trap, a radio frequency (RF) generator electrically coupled to the electrode and configured to generate an RF signal, a sampling circuit electrically coupled to electrode and configured to measure a voltage of the RF signal at the electrode, and a signal processor electrically coupled to the sampling circuit and the detector. The signal processor is configured to receive outputs from the detector and the sampling circuit and to correct the output from the detector based on the output from the sampling circuit.Type: GrantFiled: March 11, 2013Date of Patent: June 17, 2014Inventors: David Rafferty, Brian Oliver, Darron Black
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Patent number: 8704168Abstract: An ion trap for a mass spectrometer has a conductive central electrode with an aperture extending from a first open end to a second open end. A conductive first electrode end cap is disposed proximate to the first open end thereby forming a first intrinsic capacitance between the first end cap and the central electrode. A conductive second electrode end cap is disposed proximate to the second open end thereby forming a second intrinsic capacitance between the second end cap and the central electrode. A first circuit couples the second end cap to a reference potential. A signal source generating an AC trap signal is coupled to the central electrode. An excitation signal is impressed on the second end cap in response to a voltage division of the trap signal by the first intrinsic capacitance and the first circuit.Type: GrantFiled: December 17, 2012Date of Patent: April 22, 2014Assignee: 1st Detect CorporationInventor: David Rafferty
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Patent number: 8610055Abstract: An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapole field.Type: GrantFiled: March 11, 2013Date of Patent: December 17, 2013Assignee: 1st Detect CorporationInventors: David Rafferty, Michael Spencer
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Publication number: 20130099137Abstract: An ion trap for a mass spectrometer has a conductive central electrode with an aperture extending from a first open end to a second open end. A conductive first electrode end cap is disposed proximate to the first open end thereby forming a first intrinsic capacitance between the first end cap and the central electrode. A conductive second electrode end cap is disposed proximate to the second open end thereby forming a second intrinsic capacitance between the second end cap and the central electrode. A first circuit couples the second end cap to a reference potential. A signal source generating an AC trap signal is coupled to the central electrode. An excitation signal is impressed on the second end cap in response to a voltage division of the trap signal by the first intrinsic capacitance and the first circuit.Type: ApplicationFiled: December 17, 2012Publication date: April 25, 2013Applicant: 1st Detect CorporationInventor: David Rafferty