Patents by Inventor David Richard Esler

David Richard Esler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130321000
    Abstract: A radial clearance measurement system is provided. The radial clearance measurement system comprises a radial clearance sensor that is relatively insensitive to axial movement of an object rotating relative to the radial clearance sensor. In one embodiment, the radial clearance sensor includes an electrode having a relatively constant overlap area over the range of axial movement of the object.
    Type: Application
    Filed: May 31, 2012
    Publication date: December 5, 2013
    Applicant: General Electric Company
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, Mahadevan Balasubramaniam, David Richard Esler
  • Patent number: 8536878
    Abstract: A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.
    Type: Grant
    Filed: August 10, 2011
    Date of Patent: September 17, 2013
    Assignee: General Electric Company
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Walter Parry, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, Cheryl Herron
  • Publication number: 20120274258
    Abstract: A condition monitoring method for an electrical machine is provided. The method includes providing at least one first sensor element embedded in or disposed on at least one substrate element located in a stator core for obtaining a first set of data. The method also includes providing at least one second sensor element for obtaining a second set of data from the electrical machine. Further, the method includes generating signals indicative of changes in characteristics of the first sensor element based on the second set of data. Finally, the method includes refining the first set of data by combining the first set of data with the generated signals.
    Type: Application
    Filed: April 29, 2011
    Publication date: November 1, 2012
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Emad Andarawis Andarawis, Ertugrul Berkcan, Brock Matthew Lape, David Richard Esler
  • Patent number: 8272246
    Abstract: Self-calibration of a multiple channel clearance sensor system, which in one embodiment includes at least one sensor for measuring at least one clearance parameter signal between a stationary object and a rotating object of a rotating machine. The sensor output is processed as a clearance parameter by an offset correction section configured to determine an offset error in the clearance parameter signal which is used by a level shifter. The level shifter is also switchably coupled to the clearance parameter signal wherein the output of the level shifter, which may be amplified and digitally converted, is processed by a signal level analyzer to determine a channel gain signal.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: September 25, 2012
    Assignee: General Electric Company
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, Ibrahim Issoufou Kouada
  • Patent number: 8121813
    Abstract: A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.
    Type: Grant
    Filed: January 28, 2009
    Date of Patent: February 21, 2012
    Assignee: General Electric Company
    Inventors: Zhiyuan Ren, Wayne Charles Hasz, Emad Andarawis Andarawis, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, William Lee Herron, Cheryl Lynn Herron, legal representative, David Walter Parry, David Richard Esler, Mahadevan Balasubramaniam
  • Publication number: 20110295538
    Abstract: A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.
    Type: Application
    Filed: August 10, 2011
    Publication date: December 1, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Walter Parry, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, William Lee Herron, Cheryl Herron
  • Patent number: 8022715
    Abstract: A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.
    Type: Grant
    Filed: January 27, 2009
    Date of Patent: September 20, 2011
    Assignee: General Electric Company
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Walter Parry, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, William Lee Herron, Cheryl Herron, legal representative
  • Publication number: 20110139495
    Abstract: A circuit board includes a solder wettable surface and a metal mask configured to restrict solder from flowing outside the solder wettable surface of the circuit board.
    Type: Application
    Filed: February 25, 2011
    Publication date: June 16, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Arun Virupaksha Gowda, Kevin Matthew Durocher, James Wilson Rose, Paul Jeffrey Gillespie, Richard Alfred Beaupre, David Richard Esler
  • Patent number: 7919714
    Abstract: An assembly including a solder wettable surface is provided. The assembly also includes a metal mask configured to restrict solder from flowing outside the solder wettable surface.
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: April 5, 2011
    Assignee: General Electric Company
    Inventors: Arun Virupaksha Gowda, Kevin Matthew Durocher, James Wilson Rose, Paul Jeffrey Gillespie, Richard Alfred Beaupre, David Richard Esler
  • Publication number: 20100191502
    Abstract: A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.
    Type: Application
    Filed: January 28, 2009
    Publication date: July 29, 2010
    Applicant: General Electric Company
    Inventors: Zhiyuan Ren, Wayne Charles Hasz, Emad Andarawis Andarawis, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, William Lee Herron, David Walter Parry, Cheryl Lynn Herron, David Richard Esler, Mahadevan Balasubramaniam
  • Publication number: 20100188100
    Abstract: A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.
    Type: Application
    Filed: January 27, 2009
    Publication date: July 29, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Walter Parry, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, William Lee Herron, Cheryl Herron
  • Publication number: 20100077830
    Abstract: Self-calibration of a multiple channel clearance sensor system, which in one embodiment includes at least one sensor for measuring at least one clearance parameter signal between a stationary object and a rotating object of a rotating machine. The sensor output is processed as a clearance parameter by an offset correction section configured to determine an offset error in the clearance parameter signal which is used by a level shifter. The level shifter is also switchably coupled to the clearance parameter signal wherein the output of the level shifter, which may be amplified and digitally converted, is processed by a signal level analyzer to determine a channel gain signal.
    Type: Application
    Filed: September 30, 2008
    Publication date: April 1, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Emad Andarawis Andarawis, Wayne Charles Hasz, David So Keung Chan, David Mulford Shaddock, John Harry Down, Samhita Dasgupta, David Richard Esler, Zhiyuan Ren, Mahadevan Balasubramaniam, Ibrahim Issoufou Kouada
  • Patent number: 7559701
    Abstract: A method for assembling a Fabry-Perot interferometer includes depositing a first metal layer on an end portion of a ferrule, depositing a second metal layer on a back portion of a die, placing the first metal layer and the second metal layer in contact with each other with respective first and second orifices aligned with respect to each other, and bonding the ferrule to the die by thermo compression. The resulting interferometer includes a glass die with a cavity, a silicon diaphragm disposed over the opening of the cavity and bonded to the glass die, a ferrule bonded to the glass die by thermo compression with the first and second orifices being aligned to each other, and an optical fiber inserted through the other end of the ferrule in direct contact to a back portion of the die and aligned with the first orifice.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: July 14, 2009
    Assignee: General Electric Company
    Inventors: Aaron Jay Knobloch, David Mulford Shaddock, David Richard Esler, Marco Francesco Aimi, Douglas S. Byrd, David Robert O'Connor, Stacey Joy Kennerly
  • Publication number: 20080318055
    Abstract: An electronic component includes a base insulative layer having a first surface and a second surface; an electronic device having a first surface and a second surface, and the electronic device being secured to the base insulative layer; an adhesive layer disposed between the first surface of the electronic device and the second surface of the base insulative layer; and a removable layer disposed between the first surface of the electronic device and the second surface of the base insulative layer. The base insulative layer secures to the electronic device through the removable layer. The removable layer is capable of releasing the base insulative layer from the electronic device. The removal may be done without damage to a predetermined part of the electronic component.
    Type: Application
    Filed: June 21, 2007
    Publication date: December 25, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Raymond Albert Fillion, David Richard Esler, Jeffrey Scott Erlbaum, Ryan Christopher Mills, Charles Gerard Woychik
  • Publication number: 20080318413
    Abstract: A method is provided for making an interconnect structure. The method includes applying a removable layer to an electronic device or to a base insulative layer; applying an adhesive layer to the electronic device or to the base insulative layer; and securing the electronic device to the base insulative layer using the adhesive layer.
    Type: Application
    Filed: June 21, 2007
    Publication date: December 25, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Raymond Albert Fillion, David Richard Esler, Jeffrey Scott Erlbaum, Ryan Christopher Mills, Charles Gerard Woychik
  • Patent number: 7451651
    Abstract: A modular sensor assembly and methods of fabricating a modular sensor assembly are provided. The modular sensor assembly includes a sensor array coupled to an electronics array in a stacked configuration. The sensor array comprises a plurality of sensor modules, each comprising a plurality of sensor sub-arrays. The electronics array comprises a plurality of integrated circuit modules, each comprising a plurality of integrated circuit chips. The sensor modules may be coupled to the electronics modules via flip chip technology.
    Type: Grant
    Filed: December 11, 2006
    Date of Patent: November 18, 2008
    Assignee: General Electric Company
    Inventors: Charles Gerard Woychik, Rayette Ann Fisher, David Martin Mills, Scott Cogan, David Richard Esler, Robert Gideon Wodnicki, Jeffrey Scott Erlbaum
  • Publication number: 20080277456
    Abstract: An assembly including a solder wettable surface is provided. The assembly also includes a metal mask configured to restrict solder from flowing outside the solder wettable surface.
    Type: Application
    Filed: May 9, 2007
    Publication date: November 13, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: ARUN VIRUPAKSHA GOWDA, KEVIN MATTHEW DUROCHER, JAMES WILSON ROSE, PAUL JEFFREY GILLESPIE, RICHARD ALFRED BEAUPRE, DAVID RICHARD ESLER
  • Publication number: 20080232745
    Abstract: A method for assembling a Fabry-Perot interferometer includes depositing a first metal layer on an end portion of a ferrule, depositing a second metal layer on a back portion of a die, placing the first metal layer and the second metal layer in contact with each other with respective first and second orifices aligned with respect to each other, and bonding the ferrule to the die by thermo compression. The resulting interferometer includes a glass die with a cavity, a silicon diaphragm disposed over the opening of the cavity and bonded to the glass die, a ferrule bonded to the glass die by thermo compression with the first and second orifices being aligned to each other, and an optical fiber inserted through the other end of the ferrule in direct contact to a back portion of the die and aligned with the first orifice.
    Type: Application
    Filed: March 19, 2007
    Publication date: September 25, 2008
    Inventors: Aaron Jay Knobloch, David Mulford Shaddock, David Richard Esler, Marco Francesco Aimi, Douglas S. Byrd, David Robert O'Connor, Stacey Joy Kennerly
  • Publication number: 20080134793
    Abstract: A modular sensor assembly and methods of fabricating a modular sensor assembly are provided. The modular sensor assembly includes a sensor array coupled to an electronics array in a stacked configuration. The sensor array comprises a plurality of sensor modules, each comprising a plurality of sensor sub-arrays. The electronics array comprises a plurality of integrated circuit modules, each comprising a plurality of integrated circuit chips. The sensor modules may be coupled to the electronics modules via flip chip technology.
    Type: Application
    Filed: December 11, 2006
    Publication date: June 12, 2008
    Inventors: Charles Gerard Woychik, Rayette Ann Fisher, David Martin Mills, Scott Cogan, David Richard Esler, Robert Gideon Wodnicki, Jeffrey Scott Erlbaum
  • Publication number: 20080039542
    Abstract: A composition including a first curable and a second curable material is provided. The first curable material may include an alcohol and an anhydride. At a first temperature (T1) the first curable material may cures and the second curable material may not cure. An associated method is provided.
    Type: Application
    Filed: August 11, 2006
    Publication date: February 14, 2008
    Applicant: General Electric Company
    Inventors: Ryan Christopher Mills, Slawomir Rubinsztajn, David Richard Esler, David Andrew Simon