Abstract: Parameters indicative of resistance variance of the memory elements are tracked. The resistance variance affects values of data stored in the resistance-based memory elements. A hash function is performed for each memory element. The hash function returns a reference to one of a plurality of counter elements. A value of each counter element is modified in response to the tracked parameter data of the associated memory element. Read operations affecting the memory elements are adjusted based on the values for the associated counter elements.

Abstract: Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.

Abstract: A data storage device may generally be constructed and operated with at least one variable resistance memory cell having a first logic state threshold that is replaced with a second logic state threshold by a controller. The first and second logic states respectively corresponding to a predicted resistance shift that is based upon an operating temperature profile.

Abstract: Method and apparatus for managing data in a memory. In accordance with some embodiments, a non-volatile (NV) buffer is adapted to store input write data having a selected logical address. A write circuit is adapted to transfer a copy of the input write data to an NV main memory while retaining the stored input write data in the NV buffer. A verify circuit is adapted to perform a verify operation at the conclusion of a predetermined elapsed time interval to verify successful transfer of the copy of the input write data to the NV main memory. The input write data are retained in the NV buffer until successful transfer is verified.

Abstract: A memory controller receives memory access requests from a host terminal, the memory access requests from the host terminal including one or both of host read requests and host write requests. The memory controller generates memory access requests. Priorities are assigned to the memory access requests. The memory access requests are segregated to memory unit queues of at least one set of memory unit queues, the set of memory unit queues associated with a memory unit. Each memory access request is sent to the memory unit according to a priority and an assigned memory unit queue of the memory access request.

Abstract: Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.