Patents by Inventor Debaleena Das

Debaleena Das has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220383264
    Abstract: Systems and methods that can provide verifications and grades corresponding to items represented within ecommerce platforms such as online resume generation, online product marketplace, and online social media platforms. Evaluations of items such as skills, products, users, topics, and characteristics of users and items, contribute to verifications and grades that can be displayed in a user-friendly and understandable manner, employing graphic indicators. Contributions to the verifications and grades can be weighted according to grader profiles and item classification.
    Type: Application
    Filed: August 4, 2022
    Publication date: December 1, 2022
    Inventor: Debaleena Das
  • Patent number: 11210637
    Abstract: A system and method associated with online resume generation which can provide skill verification of assertions contained within a resume and associated systems and methods to display the information in a user-friendly and understandable manner. Some embodiments can comprise reviews associated with the verification process to provide a confidence level indicator associated with both the review and the asserted skill in the resume.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: December 28, 2021
    Assignee: Stem-Away, Inc.
    Inventor: Debaleena Das
  • Patent number: 10579464
    Abstract: Provided are an apparatus and method to store data from a cache line at locations having errors in a sparing directory. In response to a write operation having write data for locations in one of the cache lines, the write data for a location in the cache line having an error is written to an entry in a sparing directory including an address of the cache line.
    Type: Grant
    Filed: March 5, 2018
    Date of Patent: March 3, 2020
    Assignee: INTEL CORPORATION
    Inventors: Debaleena Das, Rajat Agarwal, Brian S. Morris
  • Patent number: 10552643
    Abstract: A method performed by a memory controller is described. The method includes, during boot up, issuing a command to a memory to cause the memory to zero out its content. The method also includes bypassing a descrambler when reading from a location in the memory that has not had its zeroed out content written over the scrambled data. The method also includes processing read data with the descrambler when reading from a location in the memory that has had its zeroed out content written over with scrambled data.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: February 4, 2020
    Assignee: Intel Corporation
    Inventors: John V. Lovelace, Sreenivas Mandava, Debaleena Das
  • Patent number: 10496473
    Abstract: Error correction in a memory subsystem includes a memory device generating internal check bits after performing internal error detection and correction, and providing the internal check bits to the memory controller. The memory device performs internal error detection to detect errors in read data in response to a read request from the memory controller. The memory device selectively performs internal error correction if an error is detected in the read data. The memory device generates check bits indicating an error vector for the read data after performing internal error detection and correction, and provides the check bits with the read data to the memory controller in response to the read request. The memory controller can apply the check bits for error correction external to the memory device.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: December 3, 2019
    Assignee: Intel Corporation
    Inventors: Debaleena Das, Bill Nale, Kuljit S. Bains, John B. Halbert
  • Publication number: 20190325398
    Abstract: A system and method associated with online resume generation which can provide skill verification of assertions contained within a resume and associated systems and methods to display the information in a user-friendly and understandable manner. Some embodiments can comprise reviews associated with the verification process to provide a confidence level indicator associated with both the review and the asserted skill in the resume.
    Type: Application
    Filed: April 24, 2019
    Publication date: October 24, 2019
    Inventor: Debaleena Das
  • Publication number: 20180196709
    Abstract: Provided are an apparatus and method to store data from a cache line at locations having errors in a sparing directory. In response to a write operation having write data for locations in one of the cache lines, the write data for a location in the cache line having an error is written to an entry in a sparing directory including an address of the cache line.
    Type: Application
    Filed: March 5, 2018
    Publication date: July 12, 2018
    Inventors: Debaleena DAS, Rajat AGARWAL, Brian S. MORRIS
  • Publication number: 20180181336
    Abstract: A method performed by a memory controller is described. The method includes, during boot up, issuing a command to a memory to cause the memory to zero out its content. The method also includes bypassing a descrambler when reading from a location in the memory that has not had its zeroed out content written over the scrambled data. The method also includes processing read data with the descrambler when reading from a location in the memory that has had its zeroed out content written over with scrambled data.
    Type: Application
    Filed: December 28, 2016
    Publication date: June 28, 2018
    Inventors: John V. LOVELACE, Sreenivas MANDAVA, Debaleena DAS
  • Patent number: 9910728
    Abstract: Provided are an apparatus and method to store data from a cache line at locations having errors in a sparing directory. In response to a write operation having write data for locations in one of the cache lines, the write data for a location in the cache line having an error is written to an entry in a sparing directory including an address of the cache line.
    Type: Grant
    Filed: December 23, 2015
    Date of Patent: March 6, 2018
    Assignee: INTEL CORPORATION
    Inventors: Debaleena Das, Rajat Agarwal, Brian S. Morris
  • Patent number: 9904591
    Abstract: Techniques and mechanisms to provide selective access to data error information by a memory controller. In an embodiment, a memory device stores a first value representing a baseline number of data errors determined prior to operation of the memory device with the memory controller. Error detection logic of the memory device determines a current count of data errors, and calculates a second value representing a difference between the count of data errors and the baseline number of data errors. The memory device provides the second value to the memory controller, which is unable to identify that the second value is a relative error count. In another embodiment, the memory controller is restricted from retrieving the baseline number of data errors.
    Type: Grant
    Filed: October 20, 2015
    Date of Patent: February 27, 2018
    Assignee: Intel Corporation
    Inventors: John B. Halbert, Kuljit S. Bains, Debaleena Das, Bill Nale
  • Publication number: 20180024878
    Abstract: Error correction in a memory subsystem includes a memory device generating internal check bits after performing internal error detection and correction, and providing the internal check bits to the memory controller. The memory device performs internal error detection to detect errors in read data in response to a read request from the memory controller. The memory device selectively performs internal error correction if an error is detected in the read data. The memory device generates check bits indicating an error vector for the read data after performing internal error detection and correction, and provides the check bits with the read data to the memory controller in response to the read request. The memory controller can apply the check bits for error correction external to the memory device.
    Type: Application
    Filed: October 3, 2017
    Publication date: January 25, 2018
    Inventors: Debaleena DAS, Bill NALE, Kuljit S. BAINS, John B. HALBERT
  • Patent number: 9811420
    Abstract: Error correction in a memory subsystem includes a memory device generating internal check bits after performing internal error detection and correction, and providing the internal check bits to the memory controller. The memory device performs internal error detection to detect errors in read data in response to a read request from the memory controller. The memory device selectively performs internal error correction if an error is detected in the read data. The memory device generates check bits indicating an error vector for the read data after performing internal error detection and correction, and provides the check bits with the read data to the memory controller in response to the read request. The memory controller can apply the check bits for error correction external to the memory device.
    Type: Grant
    Filed: March 27, 2015
    Date of Patent: November 7, 2017
    Assignee: Intel Corporation
    Inventors: Debaleena Das, Bill Nale, Kuljit S Bains, John B Halbert
  • Patent number: 9760435
    Abstract: Provided are an apparatus and method for generating common locator bits to locate a device or column error during error correction operation for a memory subsystem having memory modules, each including a plurality of memory devices. Error detection logic generates common locator bits from device bits in a plurality of memory devices in one of the memory modules. The error detection logic uses the common locator bits to locate a column across at least two of the memory devices having an error when there is a column error and to locate a memory device in the devices having an error when there is a device error. A same of the common locator bits are used to locate both one of the columns and the memory devices having errors. Error correction is performed on the located memory device or column having the error.
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: September 12, 2017
    Assignee: INTEL CORPORATION
    Inventor: Debaleena Das
  • Patent number: 9697094
    Abstract: Memory subsystem error management enables dynamically changing lockstep partnerships. A memory subsystem has a lockstep partnership relationship between a first memory portion and a second memory portion to spread error correction over the pair of memory resources. The lockstep partnership can be preconfigured. In response to detecting a hard error in the lockstep partnership, the memory subsystem can cancel or reverse the lockstep partnership between the first memory portion and the second memory portion and create or set a new lockstep partnership. The detected error can be a second hard error in the lockstep partnership. The memory subsystem can create new lockstep partnerships between the first memory portion and a third memory portion as lockstep partners and between the second memory portion and a fourth memory portion as lockstep partners. The memory subsystem can also be configured to change the granularity of the lockstep partnership when changing partnerships.
    Type: Grant
    Filed: March 28, 2015
    Date of Patent: July 4, 2017
    Assignee: Intel Corporation
    Inventors: Debaleena Das, George H Huang, Jing Ling, Reza E Daftari, Meera Ganesan
  • Publication number: 20170185473
    Abstract: Provided are an apparatus and method to store data from a cache line at locations having errors in a sparing directory. In response to a write operation having write data for locations in one of the cache lines, the write data for a location in the cache line having an error is written to an entry in a sparing directory including an address of the cache line.
    Type: Application
    Filed: December 23, 2015
    Publication date: June 29, 2017
    Inventors: Debaleena Das, Rajat Agarwal, Brian S. Morris
  • Patent number: 9691505
    Abstract: Error correction in a memory subsystem includes determining whether an error is a transient error or a persistent error, and adjusting an approach to ECC (error checking and correction) based on error type. The type of error can be determined by a built in self-test. If the error is a persistent error, the memory controller can perform in erasure mode, including correcting an erasure for an identified error location prior to applying an ECC correction algorithm. Otherwise, if the error is transient, the memory controller can perform standard full ECC correction by applying the ECC correction algorithm.
    Type: Grant
    Filed: March 27, 2015
    Date of Patent: June 27, 2017
    Assignee: Intel Corporation
    Inventors: Debaleena Das, Rajat Agarwal
  • Publication number: 20170109230
    Abstract: Provided are an apparatus and method for generating common locator bits to locate a device or column error during error correction operation for a memory subsystem having memory modules, each including a plurality of memory devices. Error detection logic generates common locator bits from device bits in a plurality of memory devices in one of the memory modules. The error detection logic uses the common locator bits to locate a column across at least two of the memory devices having an error when there is a column error and to locate a memory device in the devices having an error when there is a device error. A same of the common locator bits are used to locate both one of the columns and the memory devices having errors. Error correction is performed on the located memory device or column having the error.
    Type: Application
    Filed: October 14, 2015
    Publication date: April 20, 2017
    Inventor: Debaleena DAS
  • Patent number: 9613722
    Abstract: An apparatus and method are described for performing forward and reverse memory sparing operations. For example, one embodiment of a processor comprises memory sparing logic to perform a first forward memory sparing operation at a first level of granularity in response to detecting a memory failure; the memory sparing logic to perform a reverse memory sparing operation in response to a determination of an improved sparing state having a second level of granularity; and the memory sparing logic to responsively perform a second forward memory sparing operation at the second level of granularity.
    Type: Grant
    Filed: September 26, 2014
    Date of Patent: April 4, 2017
    Assignee: Intel Corporation
    Inventors: George H. Huang, Debaleena Das, Brian S. Morris, Rajat Agarwal
  • Publication number: 20160284424
    Abstract: Error correction in a memory subsystem includes determining whether an error is a transient error or a persistent error, and adjusting an approach to ECC (error checking and correction) based on error type. The type of error can be determined by a built in self-test. If the error is a persistent error, the memory controller can perform in erasure mode, including correcting an erasure for an identified error location prior to applying an ECC correction algorithm. Otherwise, if the error is transient, the memory controller can perform standard full ECC correction by applying the ECC correction algorithm.
    Type: Application
    Filed: March 27, 2015
    Publication date: September 29, 2016
    Inventors: Debaleena Das, Rajat Agarwal
  • Publication number: 20160283318
    Abstract: Error correction in a memory subsystem includes a memory device generating internal check bits after performing internal error detection and correction, and providing the internal check bits to the memory controller. The memory device performs internal error detection to detect errors in read data in response to a read request from the memory controller. The memory device selectively performs internal error correction if an error is detected in the read data. The memory device generates check bits indicating an error vector for the read data after performing internal error detection and correction, and provides the check bits with the read data to the memory controller in response to the read request. The memory controller can apply the check bits for error correction external to the memory device.
    Type: Application
    Filed: March 27, 2015
    Publication date: September 29, 2016
    Inventors: Debaleena Das, Bill Nale, Kuljit S. Bains, John B. Halbert