Abstract: An integrated circuit (IC) chip including an array of asymmetrically distributed magnetic field sensing elements. Additionally, an integrated circuit (IC) chip includes a substrate, a sensing coil supported by the substrate and enclosing a portion of substrate, and a Hall effect sensor supported by the portion of the substrate enclosed by the sensing coil.

Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.

Abstract: An electronic device may include a device housing and a haptic actuator carried by the device housing and that includes a haptic actuator housing and a field member movable within the haptic actuator housing. The electronic device may also include a motion sensor carried by the device housing to sense motion of the field member, an audio sensor carried by the device housing to sense audio noise from the haptic actuator, and a controller coupled to the haptic actuator, the motion sensor, and the audio sensor. The controller may be configured to drive the haptic actuator based upon sensed motion of the field member and audio noise from the haptic actuator.

Abstract: Systems, methods, and computer readable media to resolve three dimensional spatial information of cameras used to construct 3D images. Various embodiments perform communication synchronization between a first image capture system and one or more other image capture systems and generate a first flash pulse that projects a light pattern into an environment. An image is captured that includes the light pattern and a modulated optical signal encoded with an identifier of one of the first image capture system and related-camera information. A second flash from another image capture systems may flash at a second time based on the communication synchronization. During the second flash, the first image capture system captures a second image of the environment. Based on the first and second images, the first image capture system determines the orientation of the second image capture system relative to the first image capture system.

Abstract: Described herein is a method for determining a higher order resonance mode frequency of a haptic actuator for an electronic device. The higher order resonance mode frequency may correspond to a frequency in which a mass of the haptic actuator exhibits undesired movement. The movement may cause the mass to collide or otherwise impact an enclosure of the haptic actuator. Once the higher order resonance mode frequency is determined, a delay or a polarity inversion may be added to one or more of a series of input waveforms to suppress or brake the undesired movement.

Abstract: Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.