Abstract: An integrated circuit package may include a semiconductor die on a first side of the integrated circuit package, a first ball grid array (BGA) connection on the first side of the integrated circuit package, and a second BGA connection on a second side of the integrated circuit package. The integrated circuit package may include one or more traces that route data from the first BGA connection and the second BGA connection.

Abstract: A central processing unit (CPU) may be directly coupled to an accelerator dual in-line memory module (DIMM) card that is plugged into a DIMM slot. The CPU may include a master memory controller that sends requests or offloads tasks to the accelerator DIMM card via a low-latency double data rate (DDR) interface. The acceleration DIMM card may include a slave memory controller for translating the received requests, a decoder for decoding the translated requests, control circuitry for orchestrating the data flow within the DIMM card, hardware acceleration resources that can be dynamically programmed to support a wide variety of custom functions, and input-output components for interfacing with various types of non-volatile and/or volatile memory and for connecting with other types of storage and processing devices.

Abstract: An integrated circuit device may include a first network on chip (NOC) circuit configured to receive a set of data and transfer the set of data to a first node of the first NOC circuitry. The first node is configured to transfer the set of data to a second NOC circuit of an additional integrated circuit device separate from the integrated circuit device.

Abstract: An IC, operable at a first clock phase, includes first and second IOs and a PLL. The PLL includes a control circuit, an input to receive a first clock signal, an output to output a second clock signal, and a first detector to generate a first phase difference signal from the first and second clock signals. The IC includes a second phase detector that is coupled to the PLL's output to receive the second clock signal and is coupled to the first IO to receive a third clock single from a second IC, which is operable at a second clock phase. The second detector generates a second phase difference signal from the second and third clock signals. If the PLL uses the second phase difference signal to generate the second clock signal, then the second clock signal is synchronized with the third clock signal for synchronous data transfer.

Abstract: A method of handling integrated circuit dies with defects is provided. After forming a plurality of dies on one or more silicon wafers, test equipment may be used to identify defects on the dies and to create corresponding defect maps. The defect maps can be combined to form an aggregate defect map. Circuit design tools may create keep-out zones from the aggregate defect map and run learning experiments on each die, while respecting the keep-out zones, to compute design metrics. The circuit design tools may further create larger keep-out zones and run additional learning experiments on each die while respecting the larger keep-out zones to compute additional design metrics. The dies can be binned into different Stock Keeping Units (SKUs) based on one or more of the computed design metrics. Circuit design tools automatically respect the keep-out regions for these dies to program them correctly in the field.

Abstract: An IC includes first, second, and third IOs, and a multiplexer that includes first and second inputs, and an output. The IC includes first and second transmitters respectively having an output coupled to the first IO and an output coupled to the second IO. A clock generator is coupled between the output and an input of the first transmitter and between the output and an input of the second transmitter. The first input may receive a clock signal generated by the first clock generator and the second clock input is coupled to the third IO and may receive a clock signal via the third IO element from another IC. An IC includes a programmable fabric, k*n wires coupled to and extending from the fabric, n TDMs, and n IO blocks. Each TDM includes k inputs coupled to k wires and an output coupled to one of the IO blocks.

Abstract: Technologies for hardening encryption operations are disclosed. In some embodiments, the technologies harden encryption operations typically performed by kernel mode programs with a secure enclave that may run in user mode and/or in a pre-boot context. In some embodiments, the technologies leverage a shared buffer and a proxy to enable the use of a secure enclave hosted in user mode to perform encryption operations. In additional embodiments, the technologies utilize one or more pre-boot applications to enable the use of a secure enclave in a pre-boot phase, e.g., so as to enable the use of a secure enclave to decrypt data that may be needed to boot a computing device.

Abstract: Technologies for hardening encryption operations are disclosed. In some embodiments, the technologies harden encryption operations typically performed by kernel mode programs with a secure enclave that may run in user mode and/or in a pre-boot context. In some embodiments, the technologies leverage a shared buffer and a proxy to enable the use of a secure enclave hosted in user mode to perform encryption operations. In additional embodiments, the technologies utilize one or more pre-boot applications to enable the use of a secure enclave in a pre-boot phase, e.g., so as to enable the use of a secure enclave to decrypt data that may be needed to boot a computing device.