Patents by Inventor Dieter Michel

Dieter Michel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4778273
    Abstract: In a photoelectric measuring arrangement two grids operating as a scale and a scanning plate are built up of several component phase grids which define periodic graduations having differing grid constants. The periodic signals of differing periodicity arising through diffraction are optically or electrically summed.
    Type: Grant
    Filed: October 19, 1987
    Date of Patent: October 18, 1988
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Dieter Michel
  • Patent number: 4766310
    Abstract: A position measuring instrument, comprising a scanning grid, a scale grid and an illumination unit, is used to produce two sets of diffracted partial light rays. The scanning grid defines a grid constant and is formed by two scanning fields, constructed as phase grids, offset to one another in the measuring direction by 1/4 of the grid constant. The phase grids have a slat-to-furrow width ratio that deviates from a 1:1 ratio. The scale grid has the same grid constant as the scanning grid but has a slat-to-furrow ratio of 1:1. The grids cooperate with the illumination unit to produce diffracted partial light rays of several orders. An oppositely deflecting prism is allocated to each scanning field. A first and second set of diffracted partial light rays are generated, wherein the second set is opposite in phase to the first set. A photodetector is allocated to each respective selected order of the two sets of light rays to produce corresponding electrical signals.
    Type: Grant
    Filed: November 19, 1986
    Date of Patent: August 23, 1988
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Dieter Michel
  • Patent number: 4677293
    Abstract: A photoelectric measuring system includes a graduation field in the form of a phase grid. An outer field is provided for the graduation field, and this outer field is likewise formed as a phase grid. The phase grids of the graduation field and the outer field have different grid constants, so that the diffraction images generated by them impinge in different places on an array of photodetectors which are circuited together antiparallel to one another. In this way a push-pull signal is generated which can be reliably evaluated and is well suited for use as a reference signal.
    Type: Grant
    Filed: April 29, 1985
    Date of Patent: June 30, 1987
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Dieter Michel
  • Patent number: 4512083
    Abstract: A measuring system for measuring the relative position of two objects, which includes a transducer for converting a mechanical input into an analog electrical signal, is provided with a trigger stage and a reference signal stage. An analog electrical signal generated by the transducer is applied to one input of the trigger stage and to the input of the reference signal stage. The reference signal stage operates to generate a reference signal which is dependent upon the analog signal and is applied to the second input of the trigger stage. The trigger stage generates a trigger signal at its output in response to a change in the analog signal resulting from a change in the mechanical input magnitude.
    Type: Grant
    Filed: January 13, 1984
    Date of Patent: April 23, 1985
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Walter Schmitt, Dieter Michel
  • Patent number: 4505580
    Abstract: A method and apparatus for generating exposure masks is disclosed which markedly reduces the number of required process steps. A plurality of recording originals are successively reproduced in reduced form on a photosensitive recording substrate. These reduced size images are adjusted and placed in registry with respect to one another by means of a computer. In order to achieve this desired result, the computer calculates from the prescribed desired coordinate values and the measured actual coordinate values of index marks included on the recording original, an angle .DELTA..phi. through which the recording original must be rotated to achieve the desired orientation. The computer then acts to determine the corrected actual coordinate values of the diagonal intersection point and from these the coordinate values at which the recording substrate is to be positioned to achieve the desired in registry reproduction of the reduced size image of the recording original.
    Type: Grant
    Filed: October 21, 1982
    Date of Patent: March 19, 1985
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Dieter Michel
  • Patent number: 4253020
    Abstract: An apparatus for detecting the passage of a moving object such as a truncated stern projectile includes a laser light screen, a photo sensor, and a signal processor. The intensity signal produced by the photo sensor is processed to generate an output pulse at the instant when the first time derivative of the intensity is greatest. For truncated stern projectiles this occurs when the projectile exits the light screen.
    Type: Grant
    Filed: December 4, 1978
    Date of Patent: February 24, 1981
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Dieter Michel, Walter Schmitt
  • Patent number: 4155647
    Abstract: An optical apparatus, particularly suited for use in a ballistic measurement device, including a laser generating a laser beam, an optical means for expanding the laser beam in a plane, and an optical element, positioned between the laser and the optical means, for dividing the laser beam into a plurality of beams of substantially identical intensity so that a substantially uniform brightness results over the entire angle of divergence of the laser beam.
    Type: Grant
    Filed: February 24, 1977
    Date of Patent: May 22, 1979
    Assignee: Firma Dr. Johannes Heidenhain GmbH
    Inventor: Dieter Michel