Abstract: A phase locked loop in an imaging system is used to generate signals on one of eight equal phase steps within a clock period. The phase locked loop outputs eight clock phases, or four clock phases and their complements, each running at the pixel rate, eliminating the need for higher speed circuitry. According to one embodiment, the phase locked loop employs an oscillator with three inverting stages and one non-inverting stage. The output of each stage is shifted in phase 45 degrees from the previous one, in terms of pixel clock rate. Differential stages are employed so that the delay of the inverting and non-inverting stage are the same. According to the present invention, the output of the last stage is swapped onto the input of the first stage, making it non-inverting without path delay, permitting oscillation with each stage's output remaining at 45 degrees of the previous stage's phase.

Abstract: An image processor system for a charge coupled device (CCD) or CMOS imaging system includes a correlated double sample and variable gain (CDSVGA) circuit for receiving data from a CCD system and an automatic gain control (AGC) circuit which first controls gain by adjusting said CCD system and then for yet a higher gain level makes gain adjustments in said CDSVGA circuit AND a digital gain circuit to produce a combined target gain level. A processing system for an imager device includes a camera system for producing an imager signal, a correlated double sample (CDS) circuit for receiving data from an imager, a variable gain amplifier (VGA), an analog-to-digital converter (ADC) coupled to said CDS circuit, a digital gain circuit (DGC) coupled to said ADC, and an automatic gain control (AGC) circuit coupled to said DGC for controlling the CDS circuit and the DGC.

Abstract: A digital-to-analog converter having series-connected transistors forming high impedance current sources for respective segmented resistor strings. A series transistor forming a current sink for one resistor string presents a high output impedance by utilizing a negative feedback amplifier. The effects of a headroom resistor and an offset resistor in one resistor string are negated by configuring an output amplifier with appropriate gain resistors. A highly accurate D/A conversion can be achieved by utilizing all resistors of the main and sub-resistor strings with the same value.

Abstract: An digital-to-analog converter having main DAC resistor strings and sub-DAC resistor strings for converting MSB and LSB portions of a digital word into corresponding analog voltages. The main DAC resistor strings are driven by constant current sources to improve the linearity of the conversion process. The constant current sources present a high impedance to the main DAC resistor strings, thereby providing a more linear change in resistance during the conversion process, and reducing second-order harmonic nonlinearity.

Abstract: A digital-to-analog converter (DAC) employs a main DAC resistor string and a sub-resistor string formed in a semiconductor material. A main DAC conversion circuit is formed with a headroom resistor in series with the main DAC resistor string. The headroom resistor provides an operating voltage for current drivers in the sub-resistor string. The headroom resistor is formed adjacent to the main DAC resistor string in the semiconductor material to provide street effect compensation thereto. In practice, the main DAC resistor string is formed as two sets of resistor strings. The headroom resistor is formed as a first resistor string adjacent one main DAC resistor string set, and as a second resistor string adjacent the other main DAC resistor string set. The plural resistors of the headroom resistor strings have resistor values equal to the plural resistors of the respective main DAC resistor string sets.

Abstract: A digital-to-analog converter having series-connected transistors forming high impedance current sources for respective segmented resistor strings. A series transistor forming a current sink for one resistor string presents a high output impedance by utilizing a negative feedback amplifier. The effects of a headroom resistor and an offset resistor in one resistor string are negated by configuring an output amplifier with appropriate gain resistors. A highly accurate D/A conversion can be achieved by utilizing all resistors of the main and sub-resistor strings with the same value.

Abstract: An analog-to-digital converter having a digital-to-analog converter section for converting a Z-bit digital word. The digital-to-analog converter section includes an MSB portion for receiving a predetermined portion of the upper most significant bits, M bits, of the digital word and providing a monotonic division, VINC, of a reference voltage to provide a first analog voltage. A SubDAC portion is provided for receiving the remaining portion of the digital word, N bits, and providing a monotonic division of the voltage VINC to provide a second analog voltage. A summing device sums the first analog voltage with the second analog voltage to provide an analog output voltage with an M+N bit resolution, Z=M+N.

Abstract: A high voltage input pad and method for accepting electrostatic discharge (ESD) surges without damage to an input semiconductor amplifier. The protection system includes a metal gate, transistor, and n-well resistors which provide ESD protection. Protection is further provided against large voltages coupled to an amplifier by connecting an input bipolar junction transistor to the negative input connection of the amplifier. Negative surges are directed to ground with an anode grounded diode connected at its cathode to the negative input connection of the amplifier.

Abstract: A high voltage input pad and method for accepting electrostatic discharge (ESD) surges without damage to an input semiconductor amplifier. The protection system includes a metal gate transistor, and n-well resistors which provide ESD protection. Protection is further provided against large voltages coupled to an amplifier by connecting an input bipolar junction transistor to the negative input connection of the amplifier. Negative surges are directed to ground with an anode grounded diode connected at its cathode to the negative input connection of the amplifier.

Abstract: A method and circuitry for time-sharing a digitally-programmable capacitive element, particularly in conjunction with a switched-capacitor filter circuit. The method includes: selecting a first capacitance value for the capacitive element; initializing the charge on the capacitive element; connecting the capacitive element to first preselected nodes of an electronic circuit; disconnecting the capacitive element from the first preselected nodes of after any charge transfer has substantially been completed; changing the capacitance of the capacitive element to a new desired value; initializing the charge on the capacitive element; and then connecting the capacitive element to other preselected nodes of the electronic circuit. A biquad switched-capacitor filter circuit is configured to use such method in its operation.

Abstract: A dual-tone multi-frequency (DTMF) tone generator circuit (10) produces selected frequency row and column tones which are combined to generate a DTMF signal. Key board scan circuits (42, 44) scan a conventional push-button telephone key board to produce row and column input signals. Row and column fundamental rate signals are generated by fundamental counters (48,76) from a reference signal derived from an external crystal (12). Row and column integration rate signals are generated by integrator counters (50,78) also derived from the reference signal. Specialized row and column clock control signals (SLOPE RATE, SLOPE SIGN, AUTO ZERO) are produced by clock generators (58,82). Row and column integrators (64,92) integrate reference signals to produce discrete voltage steps at the rate of the row and column integration rate signals to produce row and column signals made up of a plurality of segments for each cycle of the signal.

Abstract: A dual-tone multi-frequency (DTMF) tone generator circuit (10) produces selected frequency row and column tones which are combined to generate a DTMF signal. Key board scan circuits (42,44) scan a conventional push-button telephone key board to produce row and column input signals. Row and column fundamental rate signals are generated by fundamental counters (48,76) from a reference signal derived from an external crystal (12). Row and column integration rate signals are generated by integrator counters (50,78) also derived from the reference signal. Specialized row and column clock control signals (SLOPE RATE, SLOPE SIGN, AUTO ZERO) are produced by clock generators (58,82). Row and column integrators (64,92) integrate reference signals to produce discrete voltage steps at the rate of the row and column integration rate signals to produce row and column signals made up of a plurality of segments for each cycle of the signal.