Patents by Inventor Edward Bryner

Edward Bryner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180284796
    Abstract: A system includes an inspection robot having a plurality of input sensors, the plurality of input sensors distributed horizontally relative to an inspection surface and configured to provide inspection data of the inspection surface at selected horizontal positions; a controller, comprising: a position definition circuit structured to determine an inspection robot position of the inspection robot on the inspection surface; a data positioning circuit structured to interpret the inspection data, and to correlate the inspection data to the inspection robot position on the inspection surface; and wherein the data positioning circuit is further structured to determine position informed inspection data in response to the correlating of the inspection data with the inspection robot position.
    Type: Application
    Filed: June 4, 2018
    Publication date: October 4, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180284795
    Abstract: A system includes an inspection robot comprising a lead inspection sensor providing lead inspection data, and a trailing inspection sensor; a controller, comprising: an inspection data circuit structured to interpret the lead inspection data; a sensor configuration circuit structured to determine a trailing sensor configuration change for the trailing inspection sensor in response to the lead inspection data; and a sensor operation circuit structured to adjust a trailing sensor configuration for the trailing inspection sensor in response to the trailing sensor configuration change.
    Type: Application
    Filed: June 4, 2018
    Publication date: October 4, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180284794
    Abstract: A system includes an inspection robot having a plurality of input sensors comprising a plurality of magnetic induction sensors and configured to provide inspection data of an inspection surface, wherein the inspection data comprises electromagnetic (EM) induction data, and wherein the plurality of input sensors are distributed horizontally relative to the inspection surface; wherein at least a portion of the inspection surface comprises a ferrous substrate having a non-ferrous coating thereupon; a controller, comprising: an EM data circuit structured to interpret the EM induction data, and to determine a substrate distance value in response to the EM induction data; and a thickness processing circuit structured to determine a thickness value in response to the EM induction data, the thickness value comprising a thickness of the non-ferrous coating.
    Type: Application
    Filed: June 4, 2018
    Publication date: October 4, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275675
    Abstract: A system includes an inspection robot having an input sensor comprising a laser profiler and a plurality of wheels structured to engage a curved portion of an inspection surface, wherein the laser profiler is configured to provide laser profiler data of the inspection surface; a controller, comprising: a profiler data circuit structured to interpret the laser profiler data; determine a feature of interest is present at a location of the inspection surface in response to the laser profiler data; and wherein the feature of interest comprises a shape description of the inspection surface at the location of the feature of interest.
    Type: Application
    Filed: June 4, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275673
    Abstract: A system includes an apparatus for performing an inspection on an inspection surface with an inspection robot, the apparatus comprising: a controller configured to: interpret inspection data comprising sensed information from a location on an inspection surface; determine a feature of interest is present at the location of the inspection surface in response to the inspection data, and in response to determining the feature of interest is present at the location of the inspection surface, capture image information from the location on the inspection surface, and correlate the captured image information with the inspection data corresponding to the location of the inspection surface.
    Type: Application
    Filed: May 25, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275671
    Abstract: A system includes an inspection robot for performing an inspection on an inspection surface with an inspection robot, the apparatus comprising a position definition circuit structured to determine an inspection robot position on the inspection surface; a data positioning circuit structured to interpret inspection data, and to correlate the inspection data to the inspection robot position on the inspection surface; and wherein the data positioning circuit is further structured to determine position informed inspection data in response to the correlating of the inspection data with the inspection robot position.
    Type: Application
    Filed: May 24, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275672
    Abstract: A system includes an inspection robot having a plurality of acoustic sensors coupleable to an inspection surface through a couplant chamber defining a delay line therebetween; the plurality of acoustic sensors configured to provide raw acoustic data; a controller, comprising: an acoustic data circuit structured to interpret the raw acoustic data; a thickness processing circuit structured to determine a primary mode value and a primary mode score value in response to the raw acoustic data; and wherein the thickness processing circuit is further structured to determine a thickness value in response to the primary mode value and the primary mode score value.
    Type: Application
    Filed: May 24, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275674
    Abstract: A system includes an inspection robot comprising a plurality of payloads; a plurality of arms, wherein each of the plurality of arms is pivotally mounted to one of the plurality of payloads; a plurality of sleds, wherein each sled is mounted to one of the plurality of arms; a plurality of inspection sensors, each of the inspection sensors coupled to one of the plurality of sleds such that each sensor is operationally couplable to an inspection surface; and wherein the plurality of sleds are horizontally distributed on the inspection surface at selected horizontal positions, and wherein each of the arms is horizontally moveable relative to the corresponding payload.
    Type: Application
    Filed: May 25, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180275670
    Abstract: A system includes an inspection robot having a number of payloads, a number of arms mounted to the payloads, and a number of sleds mounted to the arms, where the sleds comprise an upper portion coupled to a replaceable lower portion, the replaceable lower portion having a bottom surface shaped to accommodate an inspection surface; and an inspection sensor coupled to the upper portion of the one of the plurality of sleds such that the sensor is operationally couplable to the inspection surface.
    Type: Application
    Filed: May 24, 2018
    Publication date: September 27, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180267554
    Abstract: A system includes an inspection robot, comprising a plurality of wheels that engage an inspection surface; a plurality of sensors positioned to interrogate the inspection surface; and wherein the plurality of wheels each comprise a first magnetic hub coupled to a second magnetic hub, and wherein the plurality of wheels further define a channel between the magnetic hubs.
    Type: Application
    Filed: May 24, 2018
    Publication date: September 20, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin
  • Publication number: 20180181136
    Abstract: A system includes an inspection robot having a number of payloads, a number of arms mounted to the payloads, and a number of sleds mounted to the arms. The system includes a number of sensors, each mounted to a corresponding sled, such that the sensor is operationally coupleable to an inspection surface in contact with a bottom surface of the corresponding sled. A couplant chamber is provided within at least two of the sleds, the couplant chamber between a transducer of a sensor and the inspection surface. The system includes a biasing member for each of the arms, where the biasing member provides a down force on the corresponding sled.
    Type: Application
    Filed: December 22, 2017
    Publication date: June 28, 2018
    Inventors: Mark Loosararian, Joshua Moore, Yizhu Gu, Kevin Low, Edward Bryner, Logan MacKenzie, Ian Miller, Alvin Chou, Todd Joslin