Abstract: The present disclosure relates to a system and technique for a system for detecting fluorescing particles on a target comprising a viewing device configured to view the target and a light subsystem configured to illuminate the target, wherein the target includes a fluorescing particle that effectuates the fluorescent feedback second wavelength. In one example, no additional fluorescing agent or additive, other than the fluorescing particle, is added to the target. A passive cooling subsystem is configured to prevent overheating of the system without expending additional energy resources. The system includes a filter in operative communication with the viewing device having a selected filter wavelength configured to allow light to pass that is greater than the first wavelength and at least one non-transitory computer readable storage medium having instructions encoded thereon.

Abstract: A system for securely storing semiconductor die and devices employing a waffle pack lid configured to mate with a waffle pack tray. The lid body has an interior surface with a cavity including a shock absorbing layer. There is at least one electrostatic dissipative layer comprising attached to the shock absorbing layer such that the electrostatic dissipative layer seals the compartments on the waffle pack tray.

Abstract: The present disclosure relates to a system and technique for a system for detecting fluorescing particles on a target comprising a viewing device configured to view the target and a light subsystem configured to illuminate the target, wherein the target includes a fluorescing particle that effectuates the fluorescent feedback second wavelength. In one example, no additional fluorescing agent or additive, other than the fluorescing particle, is added to the target. A passive cooling subsystem is configured to prevent overheating of the system without expending additional energy resources. The system includes a filter in operative communication with the viewing device having a selected filter wavelength configured to allow light to pass that is greater than the first wavelength and at least one non-transitory computer readable storage medium having instructions encoded thereon.

Abstract: The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.

Abstract: The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.