Abstract: A method for creating a correction function for improving the accuracy of a GPS device collects multiple time samples at multiple known locations wherein each time sample consists of GPS coordinates and associated satellite data from multiple satellites. The satellite data includes or permits determination of (i) satellite azimuth and elevation of an associated satellite, (ii) Signal-to-Noise Ratio of a received signal from the associated satellite, and optionally (iii) pseudo-range. For each time sample a respective error between the known location and the corresponding GPS coordinates is computed and an error correction function is created as a function of the respective GPS coordinates and the satellite data by applying deep learning/machine learning techniques to the multiple time samples.

Abstract: A method for creating a correction function for improving the accuracy of a GPS device collects multiple time samples at multiple known locations wherein each time sample consists of GPS coordinates and associated satellite data from multiple satellites. The satellite data includes or permits determination of (i) satellite azimuth and elevation of an associated satellite, (ii) Signal-to-Noise Ratio of a received signal from the associated satellite, and optionally (iii) pseudo-range. For each time sample a respective error between the known location and the corresponding GPS coordinates is computed and an error correction function is created as a function of the respective GPS coordinates and the satellite data by applying deep learning/machine learning techniques to the multiple time samples.

Abstract: A detachable spectacles-mounted augmented reality (AR) device and clip-on unit wherein the device has a housing (31) configured for detachably supporting the clip-on unit, an exit window (30) and an entrance window (30?) in the housing through which the user observes a scene, a communications interface (71, 74) for coupling to a hand-held device, and a camera (37) inside the housing for imaging the scene observed by the user through a camera window (36) and configured to convey an image of the scene to the hand-held device. A line-of-sight guide unit (39) displays at least one marker at the user's field of view for directing a line of sight of the user toward a designated feature in the scene, and optics (40) within the housing projects the marker at a distance for superimposing on to the scene viewed by the user.

Abstract: A hands-free pedestrian navigation method includes mounting on a user's head (i) a display for projecting a visual image in front of the user's gaze, and (ii) an IMU, obtaining from a GPS unit carried by the user an approximate user location for locating the user in a computerized map. Confirmation is obtained from the user that the user's gaze is directed to a specified landmark in sight of the user and azimuth is computed between the user location and the landmark location extracted from the computerized map. Vocal prompts are provided and ancillary visual prompts are projected on the display to navigate the pedestrian. In a system, the user wears a head-mounted device containing the IMU and display and carries a GPS unit and a portable computing device coupled to the device and GPS unit and programmed to carry out the method.

Abstract: A method for improving accuracy of a raw GPS positioning of an untargeted pedestrian device wherein the pedestrian device receives from a nearby vehicle device a message containing a calculated offset between a raw GPS location of the vehicle and a corrected location of the vehicle, the message being received as a direct consequence of the pedestrian device and the vehicle device coming into mutual communication range without a need for pairing between the two devices. The calculated offset is applied to the raw GPS positioning of the pedestrian device to obtain a more accurate location of the pedestrian device.

Abstract: A detachable spectacles-mounted augmented reality (AR) device and clip-on unit wherein the device has a housing (31) configured for detachably supporting the clip-on unit, an exit window (30) and an entrance window (30?) in the housing through which the user observes a scene, a communications interface (71, 74) for coupling to a hand-held device, and a camera (37) inside the housing for imaging the scene observed by the user through a camera window (36) and configured to convey an image of the scene to the hand-held device. A line-of-sight guide unit (39) displays at least one marker at the user's field of view for directing a line of sight of the user toward a designated feature in the scene, and optics (40) within the housing projects the marker at a distance for superimposing on to the scene viewed by the user.

Abstract: Accessories and methods are disclosed for projecting content generated by a hand-held device (100) on reality. An accessory (2) includes a housing (102) configured for mechanically attaching to the hand-held device, and viewing optics (108) within the housing configured to project an image of content generated by the hand-held device on reality via a see through display (23). In some applications, the hand-held device is a smartphone.

Abstract: Accessories and methods are disclosed for projecting content generated by a hand-held device (100) on reality. An accessory (2) includes a housing (102) configured for mechanically attaching to the hand-held device, and viewing optics (108) within the housing configured to project an image of content generated by the hand-held device on reality via a see through display (23). In some applications, the hand-held device is a smartphone.

Abstract: A method of manufacturing a waveguide within a substrate by local modification of material structure under high power density laser radiation applied from the mostly distant side of the substrate.

Abstract: The invention provides a method and printer for printing an image that comprises at least one group of highly dense shapes, the method including: (i) determining multiple intermediate schemes such as to allow printing corresponding intermediate images on an object; wherein at least one intermediate scheme comprises directing at least one interference pattern toward at least one location corresponding to at least one group of highly dense shapes; (ii) generating an array of light entities in response to an intermediate scheme; (iii) directing the array of light entities towards the object to form the intermediate image; and (iv) moving the object relative to the light entities while repeating the steps of generating and directing to expose the object with the image.

Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.

Abstract: An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.

Abstract: An inspection system can support operation in multiple states. For instance, when inspecting an article, such as a semiconductor wafer, the tool can switch between imaging multiple locations using respective detectors to another operating state wherein multiple detectors operating in multiple imaging modes inspect a single location. An inspection system may combine the use of multiple detectors for multiple locations and the use of multiple viewing angles or modes for the same locations and thereby achieve high throughput. The different imaging modes can comprise, for example, different collection angles, polarizations, different spectral bands, different attenuations, different focal positions relative to the wafer, and other different types of imaging.

Abstract: A method and apparatus for inspecting the surface of articles, such as chips and wafers, for defects, includes a first phase of optically examining the complete surface of the article inspected at a relatively high speed and with a relatively low spatial resolution, and a second phase of optically examining with a relatively high spatial resolution only the suspected locations for the presence or absence of a defect therein.

Abstract: An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.

Abstract: Apparatus and techniques for automated optical inspection (AOI) utilizing image scanning modules with multiple objectives for each camera are provided. A scanning mechanism includes optical components to sequentially steer optical signals from each of the multiple objectives to the corresponding camera.

Abstract: An inspection system can support operation in multiple states. For instance, when inspecting an article, such as a semiconductor wafer, the tool can switch between imaging multiple locations using respective detectors to another operating state wherein multiple detectors operating in multiple imaging modes inspect a single location. An inspection system may combine the use of multiple detectors for multiple locations and the use of multiple viewing angles or modes for the same locations and thereby achieve high throughput. The different imaging modes can comprise, for example, different collection angles, polarizations, different spectral bands, different attenuations, different focal positions relative to the wafer, and other different types of imaging.

Abstract: A method and apparatus for inspecting the surface of articles, such as chips and wafers, for defects, includes a first phase of optically examining the complete surface of the article inspected at a relatively high speed and with a relatively low spatial resolution, and a second phase of optically examining with a relatively high spatial resolution only the suspected locations for the presence or absence of a defect therein.

Abstract: A method for writing a master image on a substrate includes dividing the master image into a matrix of frames, each frame including an array of pixels defining a respective frame image in a respective frame position within the master image. An electron beam is scanned in a raster pattern over the substrate, while shaping the electron beam responsively to the respective frame image of each of the frames as the electron beam is scanned over the respective frame position, so that in each frame, the electron beam simultaneously writes a multiplicity of the pixels onto the substrate.

Abstract: A method and system for defect localization including (i) receiving a test structure that includes at least one conductor that is at least partially covered by an electro-optically active material; (ii) providing an electrical signal to the conductor, so as to charge at least a portion of the conductor; and (iii) imaging the test structure to locate a defect.