Abstract: During end-to-end training of a Deep Neural Network (DNN), a differentiable estimator subnetwork is operated to estimate a functionality of an external software application. Then, during inference by the trained DNN, the differentiable estimator subnetwork is replaced with the functionality of the external software application, by enabling API communication between the DNN and the external software application.

Abstract: Systems and methods of optimizing wafer transport and metrology measurements in a fab are provided. Methods comprise deriving and updating dynamic sampling plans that provide wafer-specific measurement sites and conditions, deriving optimized wafer measurement paths for metrology measurements of the wafers that correspond to the dynamic sampling plan, managing FOUP (Front Opening Unified Pod) transport through the fab, transporting wafers to measurement tools while providing the dynamic sampling plans and the wafer measurement paths to the respective measurement tools before or as the FOUPs with the respective wafers are transported thereto, and carrying out metrology and/or inspection measurements of the respective wafers by the respective measurement tools according to the derived wafer measurement paths.

Abstract: There is provided a system and method of a method of detecting a local shape deviation of a structural element in a semiconductor specimen, comprising: obtaining an image comprising an image representation of the structural element; extracting, from the image, an actual contour of the image representation; estimating a reference contour of the image representation indicative of a standard shape of the structural element, wherein the reference contour is estimated based on a Fourier descriptor representative of the reference contour, the Fourier descriptor being estimated using an optimization method based on a loss function specifically selected to be insensitive to local shape deviation of the actual contour; and performing one or more measurements representative of one or more differences between the actual contour and the reference contour, the measurements indicative of whether a local shape deviation is present in the structural element.

Abstract: An imaging system is provided that includes a gantry, at least five detector units mounted to the gantry, a corresponding collimator for each of the detector units, at least one processing unit, and a controller. Each collimator has septa defining plural bores for each pixel of at least some of a plurality of pixels of the detector unit. A corresponding interior septum of the collimator is disposed above an internal portion of a corresponding pixel of the at least some of the plurality of pixels. The at least one processing unit is configured to obtain object information corresponding to the object to be imaged. The controller is configured to control an independent rotational movement of each the detector units used to acquire scanning information by detecting emissions from the object, wherein the controller rotates each of the detector units at a corresponding sweep rate.

Abstract: Disclosed are methods, systems and devices for storing states in a memory in support of applications residing in a trusted execution environment (TEE). In an implementation, one or more memory devices accessible by a memory controller may be shared between and/or among processes in an untrusted execution environment (UEE) and a TEE.

Abstract: A method and apparatus for enhancing reliability of a data storage device. The storage device controller is configured to convert a typical UBER-type event to an MTBF (FFR) event by converting a data error event into a drive functional failure. In this context, the converted error is not counted as an UBER type event for purposes of determining the reliability of the storage device.

Abstract: The invention relates to a method for the preparation of 2-aminobiphenyls, key intermediates in the preparation of compounds of interest in the agrochemical industry. The process comprises reacting an ortho-substituted aniline and a phenylboro derivative in the presence of a base and a palladium catalyst, said palladium catalyst comprising a palladium source and a biphenyl phosphine ligand of formula (III) or a salt thereof.

Abstract: A method for authenticating an integrated circuit is provided. At an intellectual property facility, a random encryption key and a number of random input vectors are generated. For each input vector, the input vector is encrypted, based on the encryption key, to generate a corresponding output vector, and the input vector and the corresponding output vector are formed into an authentication vector pair. The encryption key is embedded into hardware description language instructions that define an integrated circuit that includes a cryptography engine. A number of authentication vector pairs is transmitted, via a secure communication link, to a semiconductor assembly and test facility. An input vector of an authentication vector pair is presented to the integrated circuit, which encrypts the input vector using the embedded encryption key. If the result matches the output vector of the authentication vector pair, the integrated circuit is determined to be authentic.

Abstract: Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.

Abstract: A method for evaluation of electrical propagation in the heart includes receiving a pacing signal applied to a heart of a patient, the pacing signal including a sequence of normal and shorter, abnormal, pacing stimuli. A responsive cardiac signal is received, that is sensed by electrodes at a location in the heart and on the body surface of the patient. A model response is found and annotated from evoked potentials caused by the normal pacing stimuli. A correlation is made between the model response along the different signal sections to find and calculate a normal and decremental time delays between the pacing stimuli and respectively resulting evoked potentials at a tissue location. A time difference is calculated, between the normal time delay and the decremental time delay. An EP map of at least a portion of the heart is presented to a user, with a graphical indication of the time difference presented at the tissue location.

Abstract: There is provided a system and method of performing a measurement with respect to an epitaxy formed in a finFET, the epitaxy being separated with at least one adjacent epitaxy by at least one HK fin. The method comprises obtaining an image of the epitaxy and the at least one HK fin, and a gray level (GL) profile indicative of GL distribution of the image; detecting edges of the at least one HK fin; determining two inflection points of the GL profile within an area of interest in the image; performing a critical dimension (CD) measurement between the two inflection points; determining whether to apply correction to the CD measurement based on a GL ratio indicative of a relative position between the epitaxy and the at least one HK fin; and applying correction to the CD measurement upon the GL ratio meeting a predetermined criterion.

Abstract: A system for evaluating a treatment for a mental or physiological condition. The system includes a sensor configured to measure eye movements of a user, a processor, and a memory. The memory includes instructions, which, when executed by the processor, cause the system to: identify a task; prior to the treatment and while the user performs the task, measure the eye movements of the user with the sensor; while the user is under an effect of the treatment and while the user performs the task, measure eye movements of the user with the sensor; determine a difference between the eye movements of the user prior to and after the treatment based on a trained machine learning model; determine a measure of an efficacy of the treatment based on the determined difference in the measured eye movements of the user; and display a recommended a course of treatment based on the determined measure of efficacy.

Abstract: There is provided a system and method of generating a metrology recipe usable for examining a semiconductor specimen, comprising: obtaining a first image set comprising a plurality of first images captured by an examination tool, obtaining a second image set comprising a plurality of second images, wherein each second image is simulated based on at least one first image, wherein each second image is associated with ground truth data; performing a first test on the first image set and a second test on the second image set in accordance with a metrology recipe configured with a first parameter set, and determining, in response to a predetermined criterion not being met, to select a second parameter set, configure the metrology recipe with the second parameter set, and repeat the first test and the second test in accordance with the metrology recipe configured with the second parameter set.

Abstract: The present disclosure provides a system for punting. The present disclosure further provides a method for preventing or minimizing printing defects in a printing process.

Abstract: Information technology service management records in a service level target database table may include aggregating, at a predetermined elapsed time, a plurality of actions performed on each of a plurality of ITSM records since a prior update of an SLT database. Service level target tracking may further include identifying a portion of the plurality of aggregated actions that are applicable to an SLT database table entry corresponding to an ITSM record of the plurality of ITSM records. Service level target tracking may also include compressing, in a single operation, the portion of the plurality of aggregated actions.

Abstract: There is provided a system and method of performing a measurement with respect to an epitaxy formed in a finFET, the epitaxy being separated with at least one adjacent epitaxy by at least one HK fin. The method comprises obtaining an image of the epitaxy and the at least one HK fin, and a gray level (GL) profile indicative of GL distribution of the image; detecting edges of the at least one HK fin; determining two inflection points of the GL profile within an area of interest in the image; performing a critical dimension (CD) measurement between the two inflection points; determining whether to apply correction to the CD measurement based on a GL ratio indicative of a relative position between the epitaxy and the at least one HK fin; and applying correction to the CD measurement upon the GL ratio meeting a predetermined criterion.

Abstract: A plant comprising a genome having an introgression which comprises a polynucleotide sequence encoding a polypeptide having a terpene synthase activity or a transporter activity, the introgression comprising allelic variation(s) as compared to a genome of a recurrent parent of the plant, is disclosed. Organisms comprising a genome having been genetically modified to express a polypeptide having a terpene synthase activity or a transporter activity are also disclosed. Methods of modulating terpene synthesis or transport of metabolites in organisms, methods of producing plants having a terpene synthase activity of interest, having a terpene profile of interest or having a transporter activity of interest are disclosed. Methods of producing a terpene of interest are also disclosed.

Abstract: The present disclosure relates to an electrophotographic printing method comprising electrophotographically printing a liquid electrophotographic composition onto a substrate. The liquid electrophotographic composition comprises a charge adjuvant and a copolymer of a) ethylene and b) methacrylic acid and/or acrylic acid, wherein 80 to 95 weight % of the units of said copolymer are derived from ethylene. The printed substrate is then subjected to electron beam (EB) radiation.

Abstract: There is provided a system and method of generating a metrology recipe usable for examining a semiconductor specimen, comprising: obtaining a first image set comprising a plurality of first images captured by an examination tool, obtaining a second image set comprising a plurality of second images, wherein each second image is simulated based on at least one first image, wherein each second image is associated with ground truth data; performing a first test on the first image set and a second test on the second image set in accordance with a metrology recipe configured with a first parameter set, and determining, in response to a predetermined criterion not being met, to select a second parameter set, configure the metrology recipe with the second parameter set, and repeat the first test and the second test in accordance with the metrology recipe configured with the second parameter set.

Abstract: Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.