Abstract: An insulator for an electrical connector that comprises a back shell, metal shell, EMI band, and the insulator. The insulator features alternating contact cavities and air dielectric cavities. The air dielectric cavities reduce the effective dielectric constant of the connector, which allows high-speed data to be transmitted while maintaining impedance, thereby preserving signal fidelity.

Abstract: A low-profile, right angle connector assembly comprises six cable connectors and six board-mount connectors housed within a PCIe bracket and EMI shell. The PCIe bracket and EMI shell are braced to a low profile PCIe card. Each board-mount connector is designed to receive a cable connector and allows for the transmission and processing of high-speed data with lower latency. A removable latch mounted on the cable connectors helps ensure the cable connectors remain physically connected to the board-mount connectors. The removable latch may be replaced as needed for breakage and wear and tear.

Abstract: An electrical connector comprises a plurality of wafers within a housing. Each wafer comprises a dovetail that corresponds to a dovetail-receiving groove on the interior side wall of the housing. The coupling of the dovetail and the groove work to stabilize the housing by biasing the side wall inwardly and preventing it from bowing out. Each wafer also comprises an epoxy shoulder to create an epoxy track that can be filled with epoxy to create a seal that secures adjacent wafers to each other and also prevents debris and moisture from entering the housing.

Abstract: An insulator for an electrical connector that comprises a back shell, metal shell, EMI band, and the insulator. The insulator features alternating contact cavities and air dielectric cavities. The air dielectric cavities reduce the effective dielectric constant of the connector, which allows high-speed data to be transmitted while maintaining impedance, thereby preserving signal fidelity.

Abstract: A low-profile, right angle connector assembly comprises six cable connectors and six board-mount connectors housed within a PCIe bracket and EMI shell. The PCIe bracket and EMI shell are braced to a low profile PCIe card. Each board-mount connector is designed to receive a cable connector and allows for the transmission and processing of high-speed data with lower latency.

Abstract: A low-profile, right angle connector assembly comprises six cable connectors and six board-mount connectors housed within a PCIe bracket and EMI shell. The PCIe bracket and EMI shell are braced to a low profile PCIe card. Each board-mount connector is designed to receive a cable connector and allows for the transmission and processing of high-speed data with lower latency.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips. An alignment assembly for aligning a probe with respect to a device to be tested includes a first alignment block, a second alignment block, and an alignment piece connecting the first alignment block and the second alignment block. The first alignment block and the second alignment block are arranged to be attached to the device to be tested to align the probe with respect to the device to be tested.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

Abstract: A connector includes a connector body, a plurality of compression coaxial contacts disposed in the connector body, and a plurality of coaxial cables connected to corresponding ones of the plurality of compression coaxial contacts. The connector body includes a conductive elastomeric ground plane.

Abstract: A probe tip for attaching to a device to be tested includes a flexible circuit board, at least one contact pad arranged to be able to be attached to at least one contact of a probe tip connector, at least one electrical component having first and second ends, and at least one test pad arranged to be able to be attached to the device to be tested. The at least one contact pad is connected to the first end of the at least one electrical component, and the at least one test pad is connected to the second end of the at least one electrical component. Each of the electrical components of the probe tip is connected to at least one contact pad and is connected to at least one test pad.

Abstract: A connector includes a connector body, a plurality of compression coaxial contacts disposed in the connector body, and a plurality of coaxial cables connected to corresponding ones of the plurality of compression coaxial contacts. The connector body includes a conductive elastomeric ground plane.

Abstract: A high-density connector assembly includes a frame, at least one sub-assembly connected to the frame, at least one connector connected to the at least one sub-assembly, a plurality of contacts disposed in the connector, a circuit board disposed in the connector; and a plurality of cables. Each of the plurality of cables is connected to a corresponding one of the plurality of contacts. At least one of the plurality of contacts has a bifurcated tip.

Abstract: A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

Abstract: A cable includes a number of wires. Each of the wires has a number of signal conductors encompassed by a dielectric sheath, and the sheath is encompassed by a conductive shield. The wires are arranged side-by-side in a row at an end of each wire, where a termination element is connected. The termination element has opposed major faces, with an array of first contacts on a first face, and an array of second contacts on the opposed face, each of the first contact being electrically connected to a corresponding second contact. Each of the signal conductors of the wire elements is connected to a corresponding one of the first contacts. The signal conductors may be a pair of wires arranged in parallel, so that all signal conductors are in a common plane.

Abstract: A cable includes a number of wires. Each of the wires has a number of signal conductors encompassed by a dielectric sheath, and the sheath is encompassed by a conductive shield. The wires are arranged side-by-side in a row at an end of each wire, where a termination element is connected. The termination element has opposed major faces, with an array of first contacts on a first face, and an array of second contacts on the opposed face, each of the first contact being electrically connected to a corresponding second contact. Each of the signal conductors of the wire elements is connected to a corresponding one of the first contacts. The signal conductors may be a pair of wires arranged in parallel, so that all signal conductors are in a common plane.