Abstract: A photoluminescence measurement system can include an optical source.

Abstract: Described herein is a method and apparatus for measuring the thickness of a deposited semiconductor material. A colorimeter has an optical source that illuminates a portion of a deposited semiconductor material with optical radiation, a sensor that collects and measures color information related to reflected radiation from the deposited semiconductor material, and a processor that receives the color information related to the reflected radiation from the sensor and calculates a thickness of the semiconductor material. The processor may control a semiconductor material deposition apparatus.

Abstract: A flux monitor system includes a light source and a sensor.

Abstract: A flux monitor system includes a light source and a sensor.

Abstract: A method and apparatus for depositing a film on a substrate includes introducing a vaporizable material from a source positioned above a substrate. The vaporizable material is vaporized and directed as an vapor feed stream from the source, away from the substrate. The vapor feed stream is redirected as a plume from a redirector, towards the substrate and deposited as a film on the substrate.

Abstract: This invention relates to temperature-corrected photoluminescence spectroscopy which may be applied to semiconductors and, in particular, photovoltaic films.

Abstract: Under one aspect, a nonplanar photovoltaic module having a length includes: (a) an elongated nonplanar substrate; and (b) a plurality of solar cells disposed on the elongated nonplanar substrate, wherein each solar cell in the plurality of solar cells is defined by (i) a plurality of grooves around the nonplanar photovoltaic module and (ii) a groove along the length of the photovoltaic module. In some embodiments, each groove of the plurality of grooves about the photovoltaic module, independently, has a repeating pattern, a non-repeating pattern, or is helical. In some embodiments, the module further includes a patterned conductor providing serial electrical communication between adjacent solar cells. In some embodiments, portions of the patterned conductor providing serial electrical communication between adjacent solar cells are within a groove of the plurality of grooves about the photovoltaic module.

Abstract: A particle detector for evaporation flux is disclosed. The particle detector includes a light source and at least one reflective surface.

Abstract: A method and apparatus for determining grain size of a surface. A light source is directed at the surface. Reflected light from the surface is detected. A peak surface grain wavelength is determined from the reflected light. The peak surface grain wavelength is converted to a grain size. Grain size of a semiconductor surface is used as a feedback input to control a manufacturing process.

Abstract: An improved deposition source configuration in a process chamber can reduce the overheating in a thin film deposition system.

Abstract: Under one aspect, a nonplanar photovoltaic module having a length includes: (a) an elongated nonplanar substrate; and (b) a plurality of solar cells disposed on the elongated nonplanar substrate, wherein each solar cell in the plurality of solar cells is defined by (i) a plurality of grooves around the nonplanar photovoltaic module and (ii) a groove along the length of the photovoltaic module. In some embodiments, each groove of the plurality of grooves about the photovoltaic module, independently, has a repeating pattern, a non-repeating pattern, or is helical. In some embodiments, the module further includes a patterned conductor providing serial electrical communication between adjacent solar cells. In some embodiments, portions of the patterned conductor providing serial electrical communication between adjacent solar cells are within a groove of the plurality of grooves about the photovoltaic module.

Abstract: Apparatus, systems, and methods for forming a photovoltaic cell from a common layer on a substrate are provided. A first pass is made with a first laser beam over an area on the common layer. The first pass forms a groove in the common layer. The first pass forms within the common layer a first edge and a second edge. The first edge is separated from the second edge by the groove. The groove provides a first level of electrical isolation between the first edge and the second edge. A second pass is made with a second laser beam over approximately the same area on the common layer. The second pass provides a second level of electrical isolation between the first edge and the second edge. The second level of electrical isolation is greater than the first level of electrical isolation.

Abstract: Puzzles characterized by colored pieced with unique shapes. The unique shapes of the pieces include more than one polygonal shape. The pieces can be jointly assembled into a tiling configuration in various ways allowing for large number of solutions. The puzzle pieces are placed on a flat board with a frame which matches the edges of the various pieces. The puzzle pieces can be jointly assembled to the frame. The object of the puzzle is to fill the board with all the pieces while following specific color restriction rule and predefined starting point.

Abstract: A pumping and valve control device can be used in an atomic layer deposition system.

Abstract: A vapor deposition process can be used to create layers within a photovoltaic module.

Abstract: A metrology system for analyzing a semiconductor device on a substrate can include a metrology sensor.

Abstract: A scribing system comprising a mounting mechanism, stylus, and force generating mechanism is provided. The mounting mechanism is configured to rotate an elongated object in such a manner that the object is subjected to a bow effect wherein a middle portion of the object bends relative to the end portions of the object. The stylus is for scribing the object at a position x along the long dimension of the object while the mounting mechanism rotates the object. The force generating mechanism is connected to the stylus so that the stylus applies the same constant force to the elongated object regardless of the position x along the long dimension of the object that the stylus is positioned, while the mounting mechanism rotates the object and thereby subjects the object to the bow effect, thereby scribing the object.

Abstract: A photoluminescence measurement system can include an optical source.

Abstract: A deposition system includes a load lock chamber for receiving a substrate and exposing a substrate to a load lock temperature and load lock pressure suitable to prepare a substrate for subsequent low-pressure and high-temperature processing or for ambient temperature and pressure conditions.

Abstract: A selenium deposition system can improve the selenium vapor distribution.