Abstract: An apparatus for rolling a disk-like object on a surface includes a base which maintains the disk-like object vertical in its discharge position, a mean to control the direction of the disk-like object movement and a discharge mechanism which controls the initial speed of the rolling disk-like object. A collection apparatus is provided for catching the rolling disk-like object, reducing its speed gradually to a complete stop as it enters it. The collection apparatus is made to collect multiple rolling disks.

Abstract: An amplifier circuit having an amplifier chain comprising an input port and output port with a plurality of interconnected gain stages positioned in between. The output of one interconnected gain stage provides an input to the next stage within the amplifier chain. The output port coupled to the plurality of interconnected gain stages such that the amplifier circuit output is generated from any one or more of the interconnected gain stages.

Abstract: An amplifier circuit (200) having an amplifier chain comprising an input port (215) and an output port (235) with a plurality of interconnected gain stages (220-227) therebetween, where the output of one stage provides an input to the next stage within the amplifier chain, the output port (235) being operably coupled to the plurality of interconnected gain stages (220-227) such that the amplifier circuit output is generated from any one or more of the interconnected gain stages (220-227).

Abstract: Method and apparatus for optical inspection of a patterned article are presented. A region on the article is illuminated with incident light to produce light returned from the illuminated region. An image of the illuminated region is acquired and analyzed for determining the intensity distribution of light components scattered from the pattern of the illuminated region within a certain collection angular field located outside a solid angle of propagation of specularly reflected light. Based on the determined distribution, light components scattered from the illuminated region and propagating with at least one predetermined solid angle segment of the certain collection angle are collected and directed to a dark-field detection unit.

Abstract: A method for optical inspection of a surface includes selecting an apodization scheme in response to a characteristic of the surface, and applying an apodizer to apodize a beam of radiation in response to the selected apodization scheme. The apodized beam of radiation is directed to impinge on the surface, whereby a plurality of rays are scattered from the surface, and at least one of the scattered rays is detected, typically in order to detect a defect on the surface.