Abstract: A method for providing an improved active pixel sensor cell having a soft-saturation circuit. The method includes providing a pixel node and a photodiode coupled to the pixel node. The photodiode receives light and converts the light into an electrical signal representative of light. A soft-saturation circuit for selectively affecting the electrical signal at the pixel node based on the electrical signal at the pixel node based on the electrical signal at the pixel node is also provided.

Abstract: CMOS pixel sensors have been of interest as replacements for CCD's in imaging applications. Such devices promise lower power and simpler system level design through fewer power supply voltages and higher functional integration. It is difficult and cost ineffective to utilize images to test active pixel sensors. Here, a method and apparatus for electrical testing of CMOS pixel sensors is described which involves electrically writing a pattern into the CMOS pixel sensors for the detection of adjacent cell shorts or stuck at faults as well as verification of read-channel circuit functionality and performance. The invention provides for an electrical testing of CMOS pixel array that is simple, time efficient and cost effective for use in, for example, production.

Abstract: A random number generator using, for example, a voltage controlled oscillator (VCO) which receives a noise input and at least one differential oscillator. The differential oscillator(s) provided oscillator signals to a differential sense amplifier which is sampled under control of the VCO.

Abstract: An image sensor having a well-to-substrate diode as the photodetector. In a preferred embodiment, a modern salicided (CMOS) process is utilized to manufacture the image sensor. The field oxide region above the diode junction is transparent to visible light, thus allowing the photodiode competitive quantum efficiency as compared to devices having source/drain diffusion-to-substrate photodiodes fabricated on a non-salicided process. The photodiode can be integrated as part of a sensor array with digital circuitry using a relatively unmodified digital CMOS process. Furthermore, the structure allows the optical properties of the photodiode to be engineered by modifying the well without deleterious effects, to approximate a first order, on the characteristics of a FET built in another identical well.

Abstract: A circuit that includes at least two driver circuits. Each driver circuit receives analog information and drives a value related to the analog information to an analog bus. Each driver circuit also includes a select transistor to pass the value related to the analog information to the analog bus when the driver circuit is selected. The select transistor includes a source and a bulk. Each driver circuit further includes a bulk potential control circuit (BPCC) to couple the bulk to the source when the driver circuit is selected and to couple the bulk to a voltage supply when the driver circuit is not selected.

Abstract: A random number generator using a single, slow, voltage controlled oscillator which receives a noise input and a plurality of high frequency ring oscillators. The ring oscillators are sampled under control of the slow oscillator. A circuit is used between the output of each of the ring oscillators and its respective D-type latch to assure that the sampling is unbiased, that is, that there will be near even distribution of 1s and 0s in the random numbers.

Abstract: A connector clip, particularly useful in testing a dual in-line packaged (DIP) integrated circuit (IC), comprising a plurality of connector elements which are in contact with and serve to extend corresponding terminals of the IC, wherein at least one connector element includes a resistance which prevents damage to the IC or such other circuit in the event that connector elements are inadvertently short-circuited.