Abstract: Semiconductor device fabrication systems and methods are provided. In an example, a semiconductor device fabrication system includes a semiconductor fabrication tool. Further, the semiconductor device fabrication system includes wireless sensors associated with the semiconductor fabrication tool. The wireless sensors measure process parameters of the fabrication tool and transmit wireless signals. The semiconductor device fabrication system also includes a sensor controller configured to identify the wireless sensors associated with the semiconductor fabrication tool and to receive the wireless signals from the wireless sensors. The semiconductor device fabrication system further includes a tool controller including a receiver for receiving data from the sensor controller. The tool controller is configured to sequentially assign system variable identifiers (SVID) to the data from the sensor controller, and to contextualize the data in data packets.

Abstract: Semiconductor device fabrication systems and methods are provided. In an example, a semiconductor device fabrication system includes a semiconductor fabrication tool. Further, the semiconductor device fabrication system includes wireless sensors associated with the semiconductor fabrication tool. The wireless sensors measure process parameters of the fabrication tool and transmit wireless signals. The semiconductor device fabrication system also includes a sensor controller configured to identify the wireless sensors associated with the semiconductor fabrication tool and to receive the wireless signals from the wireless sensors. The semiconductor device fabrication system further includes a tool controller including a receiver for receiving data from the sensor controller. The tool controller is configured to sequentially assign system variable identifiers (SVID) to the data from the sensor controller, and to contextualize the data in data packets.

Abstract: Methods for continuously producing HIPR silicone in water emulsions are disclosed. The methods use low shear devices, and thus the temperature of the emulsions is kept low, while enhanced particle size and viscosity are obtained.

Abstract: A method of identifying a workpiece in the course of its manufacture, in which the workpiece carrying an existing identification marking is supplied to an apparatus in which it is to be subject to a process that removes or obscures the marking, the marking is machine-read after the workpiece has been placed in the apparatus but before the process begins, data from the reading is put in store, and at the end of the process the identification is re-marked on the workpiece in accordance with the stored data while the workpiece is retained in a predetermined position in the apparatus.

Abstract: Apparatus for indicating the profile of a workpiece comprises a probe driven in mutually perpendicular axes to follow the workpiece profile, and means provided to display the movements of the probe as an indication of the workpiece profile. A control system associated with the probe and its driving means ensures that the probe is driven at an optimum rate.

Abstract: A measuring instrument of the caliper type which can be extended out, by means of extension pieces, to cover a wide range of linear dimensions. A mechanical scale gives the most significant figures of the measurement and the scale indicates a different range to match each extension piece employed. An electrical circuit gives the least significant figures of the measurement and the figures are presented together so that they can be read as a composite reading.