Patents by Inventor Erik Roelof Loopstra

Erik Roelof Loopstra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7193681
    Abstract: A lithographic projection apparatus is disclosed in which a liquid confinement system, which at least partly confines liquid to a space between the projection system and the substrate, is restricted in its movement in the direction of the optical axis of the apparatus by a stopper.
    Type: Grant
    Filed: September 22, 2004
    Date of Patent: March 20, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Christiaan Alexander Hoogendam, Erik Theodorus Maria Bijlaart, Erik Roelof Loopstra, Johannes Catharinus Hubertus Mulkens, Bob Streefkerk
  • Patent number: 7193232
    Abstract: A map of the surface of a substrate is generated at a measurement station. The substrate is then moved to where a space between a projection lens and the substrate is filled with a liquid. The substrate is then aligned using, for example, a transmission image sensor and, using the previous mapping, the substrate can be accurately exposed. Thus the mapping does not take place in a liquid environment.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: March 20, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Joeri Lof, Joannes Theodoor De Smit, Roelof Aeilko Siebrand Ritsema, Klaus Simon, Theodorus Marinus Modderman, Johannes Catharinus Hubertus Mulkens, Hendricus Johannes Maria Meijer, Erik Roelof Loopstra
  • Publication number: 20070040133
    Abstract: A map of the surface of a substrate is generated at a measurement station. The substrate is then moved to where a space between a projection lens and the substrate is filled with a liquid. The substrate is then aligned using, for example, a transmission image sensor and, using the previous mapping, the substrate can be accurately exposed. Thus the mapping does not take place in a liquid environment.
    Type: Application
    Filed: March 9, 2006
    Publication date: February 22, 2007
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Joeri Lof, Joannes De Smit, Roelof Aeilko Ritsema, Klaus Simon, Theodorus Modderman, Johannes Catharinus Mulkens, Hendricus Johannes Meijer, Erik Roelof Loopstra
  • Patent number: 7170586
    Abstract: A lithographic apparatus includes an illumination system configured to provide a beam of radiation, a support configured to support a patterning device, a substrate table and a projection system. Furthermore, the lithographic apparatus includes a plurality of EUV sources for providing EUV radiation to the illumination system and a distributor which is arranged to convert the EUV radiation from each of the EUV sources into an intermediate beam of radiation. The intermediate beam of radiation is directed from the distributor in a first direction by a mirror surface. The distributor may include a rotationally driven mirror arrangement, the axis of rotation being non-parallel to the mirror surface.
    Type: Grant
    Filed: January 20, 2006
    Date of Patent: January 30, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Vadim Yevgenyevich Banine, Levinus Pieter Bakker, Jeroen Jonkers, Erik Roelof Loopstra
  • Patent number: 7161659
    Abstract: The invention relates to a dual stage lithographic apparatus, wherein two substrate stages are constructed and arranged for mutual cooperation in order to perform a joint scan movement. The joint scan movement brings the lithographic apparatus from a first configuration, wherein immersion liquid is confined between a first substrate held by the first stage of the stages and a projection system of the apparatus, to a second configuration, wherein the immersion liquid is confined between a second substrate held by the second stage of the two stages and the projection system, such that during the joint scan movement the liquid is essentially confined within the space with respect to the projection system.
    Type: Grant
    Filed: May 24, 2005
    Date of Patent: January 9, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Marinus Aart Van Den Brink, Jozef Petrus Henricus Benschop, Erik Roelof Loopstra
  • Patent number: 7161267
    Abstract: A displacement apparatus comprising a first part and a second part, which can be displaced relative to each other in first and second different directions. The apparatus being suitable for use in a lithographic apparatus for positioning the mask holder with respect to the projection beam and for positioning the wafer substrate table with respect to the patterned beam. The first part comprises a first and second coil system in which an alternating current is provided by a power supply. The second part comprises a conductive platen which is disposed in a zone in which a magnetic field is induced when power is supplied to the coil systems. The coil system and platen are arranged with respect to each other so that when currents are passed through the coils, a magnetic field induced in the platen causes displacement between the platen and the coils in the first and second different directions.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: January 9, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Sven Antoin Johan Hol, Johan Cornelis Compter, Erik Roelof Loopstra, Patricia Vreugdewater
  • Patent number: 7119874
    Abstract: A lithographic projection apparatus wherein a liquid supply system provides a space between a projection system and a substrate with liquid. The liquid supply system comprises a member. A liquid seal is formed between the member and the substrate by a flow of liquid. In an embodiment, the liquid seal is formed by a flow of liquid from an inlet to an outlet of the member.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: October 10, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Henrikus Herman Marie Cox, Sjoerd Nicolaas Lambertus Donders, Christiaan Alexander Hoogendam, Aleksey Yurievich Kolesnychenko, Erik Roelof Loopstra, Helmar Van Santen
  • Patent number: 7116399
    Abstract: A lithographic projection apparatus contains a projection system configured to project a patterned beam of radiation onto a target portion of a substrate. The projection system contains one or more optically active mirrors and heat shields located to intercept heat radiation to or from the mirrors and/or their support. The heat shields are actively cooled and the mirrors and the heat shields and the mirrors are supported separately on a support frame to reduce vibration of the mirrors due to active cooling. The heat shields may include heat shields that intercept heat radiation to or from the support and/or respective heat shields for individual mirrors that intercept heat radiation to or from the mirrors.
    Type: Grant
    Filed: May 13, 2004
    Date of Patent: October 3, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Wilhelmus Josephus Box, Antonius Johannes Josephus Van Dijsseldonk, Dominicus Jacobus Petrus Adrianus Franken, Martinus Hendrikus Antonius Leenders, Erik Roelof Loopstra, Josephus Jacobus Smits, Marc Wilhelmus Maria Van Der Wijst
  • Patent number: 7110081
    Abstract: In a lithographic projection apparatus, there is provided a liquid supply system comprising a container at least partly defining a space between the projection system and the substrate, the container having a selectively openable and closeable aperture therein, and a closure configured to selectively close and open the aperture. In an embodiment, the shutter may comprise a channel in a surface of the shutter facing the aperture and/or the shutter may be displaced from the liquid supply system when connected to the liquid supply system. Further, in a lithographic apparatus, there is provided a liquid supply system configured to provide a liquid, through which the beam is to be projected, in a space between a projection system and a substrate and a controller configured to control application to the projection system of a force related to a weight transfer attributable to a member of the liquid supply system.
    Type: Grant
    Filed: April 26, 2004
    Date of Patent: September 19, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Christian Alexander Hoogendam, Sjoerd Nicolaas Lambertus Donders, Hans Jansen, Jacobus Johannus Leonardus Hendricus Verspay, Antonius Theodorus Anna Maria Derksen, Joeri Lof, Erik Roelof Loopstra, Johannes Catharinus Hubertus Mulkens, Alexander Straaijer, Bob Streefkerk
  • Patent number: 7110086
    Abstract: A movable stage system capable of operating in a lithographic apparatus, is presented. The movable stage system includes a base, a platform that is movable relative to the base, a balance mass that is movable relative to the base and is configured to compensate for forces generated by a movement of the platform, and a drive mechanism configured to move the platform and the balance mass relative to the base. The drive mechanism comprises at least one belt transmission that couples the platform and the balance mass such that when the platform moves along a direction, the balance mass is moved in an at least partially opposite direction, and a driving device configured to mechanically engage the balance mass or the platform to directly drive the platform or the balance mass.
    Type: Grant
    Filed: June 10, 2004
    Date of Patent: September 19, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Erik Roelof Loopstra, Robert-Han Munnig Schmidt
  • Patent number: 7110083
    Abstract: A lithographic projection apparatus is disclosed. The apparatus includes an illumination system for providing a beam of radiation used to irradiate a patterning device, and a first support that supports the patterning device. The patterning device capable of patterning the beam of radiation. The apparatus also includes a second support that supports a substrate, a projection system for projecting the patterned beam of radiation onto a target portion of the substrate, and a projection system positioning module that controls at least one of a position and an orientation of the projection system based on at least one of a velocity and an acceleration of the projection system.
    Type: Grant
    Filed: November 19, 2003
    Date of Patent: September 19, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Erik Roelof Loopstra, Dominicus Jacobus Petrus Adrianus Franken
  • Patent number: 7105955
    Abstract: A coil assembly has at least two coils which are arranged in a common plane, and partially overlap in crossover sections of the coils. The crossover sections have a reduced height, which results in a reduced total height of the coil assembly. This leads to a more compact coil assembly, and hence to better dynamic characteristics of a positioning device in which the coil assembly is applied.
    Type: Grant
    Filed: April 16, 2004
    Date of Patent: September 12, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Johannes Petrus Martinus Bernardus Vermeulen, Henricus Wilhelmus Aloysius Janssen, Erik Roelof Loopstra
  • Patent number: 7095485
    Abstract: A linear motor having a high driving force, high efficiency and low normal force comprises two opposed magnet tracks and an armature comprising three open coil sets. The linear motor may be used to drive a stage, such as, for example, a mask or wafer stage, in a lithographic apparatus.
    Type: Grant
    Filed: March 11, 2004
    Date of Patent: August 22, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Sven Antoin Johan Hol, Johan Cornelis Compter, Erik Roelof Loopstra, Patricia Vreugdewater
  • Patent number: 7075620
    Abstract: A lithographic projection apparatus includes a radiation system for providing a projection beam of radiation having a wavelength ?1 smaller than 50 nm; a support structure for supporting patterning structure, the patterning structure serving to pattern the projection beam according to a desired pattern; a substrate table for holding a substrate; and a projection system for projecting the patterned beam onto a target portion of the substrate. The apparatus further includes a radiation sensor which is located so as to be able to receive radiation out of the projection beam, said sensor comprising a radiation-sensitive material which converts incident radiation of wavelength ?1 into secondary radiation; and sensing means capable of detecting said secondary radiation emerging from said layer.
    Type: Grant
    Filed: April 8, 2004
    Date of Patent: July 11, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Jan Evert Van Der Werf, Mark Kroon, Wilhelmus Cornelis Keur, Vadim Yevgenyevich Banine, Hans Van Der Laan, Johannes Hubertus Josephina Moors, Erik Roelof Loopstra
  • Patent number: 7075616
    Abstract: In a lithographic projection apparatus, a liquid supply system provides liquid in a space between the final element of the projection system and the substrate of the lithographic projection apparatus. A shutter member is provided to contain liquid in the liquid supply system during, for example, substrate exchange.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: July 11, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Antonius Theodorus Anna Maria Derksen, Sjoerd Nicolaas Lambertus Donders, Christiaan Alexander Hoogendam, Joeri Lof, Erik Roelof Loopstra, Jeroen Johannes Sophia Maria Mertens, Johannes Catharinus Hubertus Mulkens, Timotheus Franciscus Sengers, Alexander Straaijer, Bob Streefkerk
  • Patent number: 7049592
    Abstract: A lithographic apparatus includes a projection system mounted on a reference frame, which in turn is mounted on a base which supports the apparatus. Vibrations and displacement errors in the base are filtered through two sets of isolation mounts operatively between the base and reference frame and between the reference frame and a projection frame of the projection system and therefore disturbance of the projection system is reduced.
    Type: Grant
    Filed: July 9, 2003
    Date of Patent: May 23, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Dominicus Jacobus Petrus Adrianus Franken, Erik Roelof Loopstra, Pertrus Rutgerus Bartray, Marc Wilhelmus Maria Van Der Wijst, Michael Jozefa Mathijs Renkens, Gerard Van Schothorst, Johan Juliana Dries
  • Patent number: 7030963
    Abstract: A lithographic apparatus includes an illumination system configured to provide a beam of radiation, a support configured to support a patterning device, a substrate table and a projection system. Furthermore, the lithographic apparatus includes a plurality of EUV sources for providing EUV radiation to the illumination system and a distributor which is arranged to convert the EUV radiation from each of the EUV sources into an intermediate beam of radiation. The intermediate beam of radiation is directed from the distributor in a first direction by a mirror surface. The distributor may include a rotationally driven mirror arrangement, the axis of rotation being non-parallel to the mirror surface.
    Type: Grant
    Filed: May 3, 2004
    Date of Patent: April 18, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Vadim Yevgenyevich Banine, Levinus Pieter Bakker, Jeroen Jonkers, Erik Roelof Loopstra
  • Patent number: 6967756
    Abstract: A lithographic projection apparatus includes an active reflector in a radiation system providing a projection beam of radiation and/or in a projection system. The active reflector includes a body member, a reflective multilayer and at least one actuator controllable to adjust the surface figure of the reflecting multilayer, wherein the actuator exerts a substantial force component in a direction parallel to the surface figure of said reflective multilayer. The actuator may be operative to apply torques to said reflector.
    Type: Grant
    Filed: April 30, 2004
    Date of Patent: November 22, 2005
    Assignee: ASML Netherlands B.V.
    Inventors: Antonius Johannes Josephus Van Dijsseldonk, Erik Roelof Loopstra, Dominicus Jacobus Petrus Adrianus Franken
  • Patent number: 6952253
    Abstract: In a lithographic projection apparatus, a structure surrounds a space between the projection system and a substrate table of the lithographic projection apparatus. A gas seal is formed between said structure and the surface of said substrate to contain liquid in the space.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: October 4, 2005
    Assignee: ASML Netherlands B.V.
    Inventors: Joeri Lof, Antonius Theodorus Anna Maria Derksen, Christiaan Alexander Hoogendam, Aleksey Kolesnychenko, Erik Roelof Loopstra, Theodorus Marinus Modderman, Johannes Catharinus Hubertus Mulkens, Roelof Aeilko Siebrand Ritsema, Klaus Simon, Joannes Theodoor De Smit, Alexander Straaijer, Bob Streefkerk, Helmar Van Santen
  • Patent number: 6927403
    Abstract: There is provided an illumination system for wavelengths of ?193 nm. The illumination system includes an object plane, a plane conjugated to the object plane, a first collector between the object plane and the conjugated plane, and a second collector after the conjugated plane. The first collector focuses a beam bundle of rays from the object plane in the conjugated plane. At least one of the first and second collectors includes a mirror shell. The rays strike the mirror shell at an angle of incidence of less than 20° relative to a surface tangent of the mirror shell.
    Type: Grant
    Filed: August 9, 2002
    Date of Patent: August 9, 2005
    Assignees: Carl Zeiss SMT AG, ASML Lithography B.V.
    Inventors: Wolfgang Singer, Martin Antoni, Johannes Wangler, Wilhelm Egle, Vadim Yevgenyevich Banine, Erik Roelof Loopstra