Patents by Inventor Ernest Allen

Ernest Allen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6629309
    Abstract: A structure for programming a memory cell on an integrated circuit provides access at multiple mask levels of the integrated circuit to each of the programming voltages which may be used to program the memory cell. In an embodiment, the structure includes a conductive signal path extending through multiple horizontally conductive layers of the integrated circuit from a programming voltage pad (or node) to an input of the memory cell. The conductive signal path includes portions selected from multiple alternate path portions formed within the multiple horizontally conductive layers through which the signal path extends. An embodiment of a method for making a mask includes selecting one of multiple configurations of the programming structure portion to be formed using the mask. A computer-usable carrier medium may include digital representations of the alternative configurations for a programming structure portion from which a programming structure pattern may be selected.
    Type: Grant
    Filed: June 27, 2001
    Date of Patent: September 30, 2003
    Assignee: LSI Logic Corporation
    Inventor: Ernest Allen, III
  • Patent number: 6597438
    Abstract: A portable or wearable cytometer that can be used at remote locations, such as in the field or at home. The flow cytometer of the present invention may help improve the healthcare of many weak, sick or elderly people by providing early detection of infection. By detecting the infection early, the infection may be more readily treatable. In military applications, the portable cytometer of the present invention may help save lives by providing early detection of infection due to biological agents.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: July 22, 2003
    Assignee: Honeywell International Inc.
    Inventors: Cleopatra Cabuz, J. David Zook, James Allen Cox, Thomas Raymond Ohnstein, Ulrich Bonne, Eugen Loan Cabuz, Ernest Allen Satren, Aravind Padmanabhan, Teresa M. Marta
  • Patent number: 6382228
    Abstract: A fluid driving system for portable flow cytometers or other portable devices that accepts a less precise and less stable pressure source, and then adjusts the pressure in a closed-loop manner to maintain a constant, desired flow velocity. The fluid driving system may be used in portable or wearable cytometers for use in remote locations, such as at home or in the field.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: May 7, 2002
    Assignee: Honeywell International Inc.
    Inventors: Cleopatra Cabuz, J. David Zook, Thomas Raymond Ohnstein, Ulrich Bonne, Eugen Loan Cabuz, Ernest Allen Satren
  • Patent number: 6134703
    Abstract: A process for efficiently programming a programmable logic device (PLD) is provided. A basis set for a desired matrix of programming pattern ("pattern matrix") is a set of row patterns from which all the row patterns of the pattern matrix can be derived by applying a Boolean operation on two or more row patterns of the basis set. The disclosed process derives a minimal basis set, i.e., a set with the smallest number of row patterns among basis sets for the given pattern matrix.
    Type: Grant
    Filed: December 23, 1997
    Date of Patent: October 17, 2000
    Assignee: Lattice Semiconductor Corporation
    Inventor: Ernest Allen
  • Patent number: 5621312
    Abstract: A method and apparatus for checking the integrity of a device tester used in the manufacture of semiconductor devices. A device tester is used to exercise different aspects of a semiconductor device. The tester is programmed with appropriate control software that fully tests the electrical and functional characteristics of the semiconductor device.
    Type: Grant
    Filed: July 5, 1995
    Date of Patent: April 15, 1997
    Assignee: Altera Corporation
    Inventors: Alan Achor, Eric F. H. Chun, Ernest Allen
  • Patent number: 5608337
    Abstract: A method and apparatus for testing an integrated circuit device. An integrated circuit device undergoes testing in at least two different stages of the manufacturing process. At one stage, the semiconductor wafer containing multiple chip dice is probed by a probe tester that tests each of the dice individually. At another stage, after an individual chip die has been encapsulated in a package, a package tester tests and exercises the functions of the chip.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: March 4, 1997
    Assignee: Altera Corporation
    Inventors: Matthew C. Hendricks, Ernest Allen
  • Patent number: 5493519
    Abstract: A circuit that provides for digitally programmable high voltage drive, as well as fast current limiting capability for testing of integrated circuits. The circuit also provides for digitally programmable slew rate control for controlling the rise and fall times of an output voltage. Integrated circuits requiring low voltage and high voltage tests at different speeds and with different current limiting conditions, or low and high current forcing with different voltage clamp levels, or a mixture of the two can be tested in a single continuous test pattern using the circuit of the present invention.
    Type: Grant
    Filed: August 16, 1993
    Date of Patent: February 20, 1996
    Assignee: Altera Corporation
    Inventor: Ernest Allen, III
  • Patent number: D380686
    Type: Grant
    Filed: June 14, 1994
    Date of Patent: July 8, 1997
    Assignee: Castrol Limited
    Inventor: Michael Ernest Allen