Abstract: A system and apparatus generates a time-stamp to identify and record the time of an event such as an edge received in a data signal or clock signal. A set of strobe pulses can be generated by routing an external clock signal to delay elements with incrementally increasing delay values. A data signal or device under test clock signal can be applied to the input to each of a set of latches which are clocked by the strobe pulses. The set of latches can thereby capture a series of samples of the data signal or clock signal. The series of samples can be encoded as an edge time within a clock cycle. A clock cycle counter can be added to the edge time to generate the time stamp.

Abstract: A semiconductor device tester includes a parametric measurement unit (PMU) driver circuit that provides a DC test signal for testing a semiconductor device, and a feedback circuit that senses the DC test signal at an output of the PMU driver circuit and sends the sensed DC test signal to an input of the PMU driver circuit for compensating the DC test signal.

Abstract: A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.

Abstract: In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.

Abstract: In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.

Abstract: An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit configured to provide current to the device.

Abstract: A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.

Abstract: A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a semiconductor device. A driver circuit is capable of providing a version of the DC test signal and a version of the AC test signal to the semiconductor device.

Abstract: Circuitry for use in testing a device includes a first measurement unit to apply a forced voltage to the device, and a second measurement unit having functionality that is disabled. The second measurement unit includes a sense path to receive a sensed voltage from the device, where the sense path connects to the first measurement unit through the second measurement unit. The first measurement unit adjusts the forced voltage based on the sensed voltage.

Abstract: In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt. In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.

Abstract: The present invention relates to active substances in particulate form, to methods for preparing them, to formulations containing them and to uses of such substances and formulations. A preferred embodiment is directed to particulate suspensions having improved flocculation behaviour in a suspension vehicle, such as a hydrofluoroalkane propellant used in metered dose inhalers.

Abstract: The invention describes a method for selecting host cell mutants which are resistant to expression system toxicity, comprising the steps of growing an expression system comprising host cells transformed with an expression vector, inducing the expression system such that a toxic effect is observed, and selecting viable cells in which the expression vector continues to function. Cells thus obtained are useful for the expression of polypeptide gene products in microorganisms.