Patents by Inventor Espen Olsen
Espen Olsen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20140022429Abstract: An anti-eclipse circuit for an imager is formed from pixel circuitry over the same semiconductor substrate as the imaging pixels. More specifically, two adjacent pixel circuits are modified to form an amplifier. One input of the amplifier is adapted to receive a reset signal from one of the pixel circuits while another input is adapted to be set at a predetermined offset voltage from the output of the amplifier. The amplifier is preferably a unity gain amplifier, so that the output of the amplifier set to a voltage level equal to the predetermined offset from the voltage level of the reset signal. Accordingly, the anti-eclipse circuit outputs a reference voltage at predetermined level from the reset voltage of a pixel and does not need to be calibrated for fabrication related variances in reset voltages.Type: ApplicationFiled: September 26, 2013Publication date: January 23, 2014Applicant: MICRON TECHNOLOGY, INC.Inventor: Espen A. Olsen
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Publication number: 20140022368Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: ApplicationFiled: September 25, 2013Publication date: January 23, 2014Applicant: MICRON TECHNOLOGY, INC.Inventors: Alf Olsen, Espen A. Olsen, Jørgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Patent number: 8547462Abstract: An anti-eclipse circuit for an imager is formed from pixel circuitry over the same semiconductor substrate as the imaging pixels. More specifically, two adjacent pixel circuits are modified to form an amplifier. One input of the amplifier is adapted to receive a reset signal from one of the pixel circuits while another input is adapted to be set at a predetermined offset voltage from the output of the amplifier. The amplifier is preferably a unity gain amplifier, so that the output of the amplifier set to a voltage level equal to the predetermined offset from the voltage level of the reset signal. Accordingly, the anti-eclipse circuit outputs a reference voltage at predetermined level from the reset voltage of a pixel and does not need to be calibrated for fabrication related variances in reset voltages.Type: GrantFiled: February 17, 2011Date of Patent: October 1, 2013Assignee: Micron Technology, Inc.Inventor: Espen A. Olsen
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Patent number: 8547476Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: GrantFiled: February 23, 2012Date of Patent: October 1, 2013Assignee: Micron Technology, Inc.Inventors: Alf Olsen, Espen A. Olsen, Jorgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Patent number: 8540954Abstract: The present invention concerns carbon dioxide capture from waste gas, where metal oxides dissolved in salt melts are used as absorbents.Type: GrantFiled: May 28, 2010Date of Patent: September 24, 2013Assignee: Universitetet for Miljo-og Biovitenskap Institutt for Matematiske Realfag og TeknologiInventor: Espen Olsen
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Publication number: 20120154563Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: ApplicationFiled: February 23, 2012Publication date: June 21, 2012Inventors: Alf Olsen, Espen A. Olsen, Jorgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Publication number: 20120128559Abstract: The present invention concerns carbon dioxide capture from waste gas, where metal oxides dissolved in salt melts are used as absorbents.Type: ApplicationFiled: May 28, 2010Publication date: May 24, 2012Inventor: Espen Olsen
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Patent number: 8149326Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: GrantFiled: September 15, 2009Date of Patent: April 3, 2012Assignees: Micron Technology, Inc., Given Imaging, Ltd.Inventors: Alf Olsen, Espen A. Olsen, Jorgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Publication number: 20110133057Abstract: An anti-eclipse circuit for an imager is formed from pixel circuitry over the same semiconductor substrate as the imaging pixels. More specifically, two adjacent pixel circuits are modified to form an amplifier. One input of the amplifier is adapted to receive a reset signal from one of the pixel circuits while another input is adapted to be set at a predetermined offset voltage from the output of the amplifier. The amplifier is preferably a unity gain amplifier, so that the output of the amplifier set to a voltage level equal to the predetermined offset from the voltage level of the reset signal. Accordingly, the anti-eclipse circuit outputs a reference voltage at predetermined level from the reset voltage of a pixel and does not need to be calibrated for fabrication related variances in reset voltages.Type: ApplicationFiled: February 17, 2011Publication date: June 9, 2011Inventor: Espen A. Olsen
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Patent number: 7916186Abstract: An anti-eclipse circuit for an imager is formed from pixel circuitry over the same semiconductor substrate as the imaging pixels. More specifically, two adjacent pixel circuits are modified to form an amplifier. One input of the amplifier is adapted to receive a reset signal from one of the pixel circuits while another input is adapted to be set at a predetermined offset voltage from the output of the amplifier. The amplifier is preferably a unity gain amplifier, so that the output of the amplifier set to a voltage level equal to the predetermined offset from the voltage level of the reset signal. Accordingly, the anti-eclipse circuit outputs a reference voltage at predetermined level from the reset voltage of a pixel and does not need to be calibrated for fabrication related variances in reset voltages.Type: GrantFiled: April 7, 2005Date of Patent: March 29, 2011Assignee: Micron Technology, Inc.Inventor: Espen A. Olsen
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Patent number: 7872676Abstract: Methods, devices, and systems for offset compensation in an amplifier are disclosed, wherein the amplifier inputs may be exposed to large loads from an array of pixel columns coupled in parallel. During a sampling phase, an amplifier offset may be sampled by selectively coupling a first amplifier output to a first amplifier input and a second amplifier output to a second amplifier input. During a portion of the sampling phase, the first amplifier output may be buffered to a first storage element. During a different portion of the sampling phase, the second amplifier output may be buffered to a second storage element. To sense the pixel columns during an amplification phase, the first storage element and the second storage element are coupled to the first and second amplifier inputs, respectively, with the result that the amplifier offset is canceled from the amplifier output.Type: GrantFiled: July 13, 2007Date of Patent: January 18, 2011Assignee: Micron Technology, Inc.Inventors: Espen A. Olsen, Chiajen M. Lee, Christopher Zeleznik
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Patent number: 7782383Abstract: Methods and circuits for reducing noise for a passive pixel sensor (PPS) array of an image sensor are described. A noise reduction circuit includes a noise reduction integrator circuit configured to detect a potential voltage of a column line of the PPS array and generate a potential voltage substantially equal to the potential voltage of the column line. The noise reduction circuit also includes a conductor line oriented longitudinally along the column line and configured to receive the generated potential voltage from the noise reduction integrator circuit. The conductor line is placed at a potential voltage that is the same as the potential voltage of the column line. A parasitic capacitance formed between the conductor line and the column line is substantially reduced.Type: GrantFiled: June 18, 2007Date of Patent: August 24, 2010Assignee: Aptina Imaging CorporationInventors: Alf Olsen, Espen A Olsen
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Publication number: 20100073512Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: ApplicationFiled: September 15, 2009Publication date: March 25, 2010Inventors: Alf Olsen, Espen A. Olsen, Jorgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Patent number: 7667176Abstract: The apparatus and method provide a readout technique and circuit for increasing or maintaining dynamic range of an image sensor. The readout technique and circuit process each pixel individually based on the magnitude of the readout signal. The circuit includes a gain amplifier amplifying the readout analog signal, a level detection circuit for determining the signal's magnitude, a second gain amplifier applying a gain based on the signal magnitude and an analog-to-digital converter digitizing the signal and a circuit for multiplying or dividing the signal. The method and circuit allow for a lower signal-to-noise ratio while increasing the dynamic range of the imager.Type: GrantFiled: April 4, 2007Date of Patent: February 23, 2010Assignee: Aptina Imaging CorporationInventors: Espen A. Olsen, Jorgen Moholt
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Patent number: 7605852Abstract: An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.Type: GrantFiled: May 17, 2004Date of Patent: October 20, 2009Assignees: Micron Technology, Inc., Given Imaging Ltd.Inventors: Alf Olsen, Espen A. Olsen, Jorgen Moholt, Steinar Iversen, Dov Avni, Arkady Glukhovsky
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Patent number: 7535281Abstract: A charge pump and method converts an input voltage to a boosted voltage having a magnitude or polarity that is different from that of the input voltage. The input voltage is adjusted so that it has a relatively large magnitude until the boosted voltage approaches a target voltage. Therefore, the charge pump and method can more quickly charge a capacitive load. The magnitude of the input voltage may be proportional to the difference between the magnitude of a reference voltage and the magnitude of the boosted voltage. The magnitude of the input voltage may alternatively be substantially equal to the magnitude of a supply voltage until the magnitude of the boosted voltage is within a predetermined range of the target voltage, at which point it may be proportional to the difference between the magnitude of a reference voltage and the magnitude of the boosted voltage.Type: GrantFiled: September 29, 2006Date of Patent: May 19, 2009Assignee: Micron Technology, Inc.Inventor: Espen Olsen
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Publication number: 20090073297Abstract: Methods for forming conductors and global bus configurations for reducing an interference signal from electromagnetic interference (EMI) source are provided. First and second conductor lines are formed on an integrated circuit in a twisted pair configuration. A differential amplifier is formed on the integrated circuit and coupled to each of the first and second conductor lines. The first and second signals are respectively transmitted through the first and second conductor lines and are modified by the interference signal. The modified first and second signals are differentially amplified by the differential amplifier so that the interference signal is substantially cancelled.Type: ApplicationFiled: September 17, 2007Publication date: March 19, 2009Applicant: Micron Technology, Inc.Inventors: Taehee Cho, Jeffrey Gleason, Espen Olsen, Kwang-bo (Austin) Cho, Suat Utku Ay
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Publication number: 20090046181Abstract: A method for performing successive approximation analog-to-digital conversions in an imaging device. Analog-to-digital converters connected to the columns of pixels in the imager are initially grouped. Depending on the column or group the analog-to-digital converter is associated with, a different respective portion of a digital code corresponding to the analog pixel signals input from the respective column undergoes conversion in a manner that substantially reduces capacitive loading within each analog-to-digital converter.Type: ApplicationFiled: August 14, 2007Publication date: February 19, 2009Inventors: Espen A. Olsen, Sanjayan Vinayagamoorthy
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Publication number: 20090015692Abstract: Methods, devices, and systems for offset compensation in an amplifier are disclosed, wherein the amplifier inputs may be exposed to large loads from an array of pixel columns coupled in parallel. During a sampling phase, an amplifier offset may be sampled by selectively coupling a first amplifier output to a first amplifier input and a second amplifier output to a second amplifier input. During a portion of the sampling phase, the first amplifier output may be buffered to a first storage element. During a different portion of the sampling phase, the second amplifier output may be buffered to a second storage element. To sense the pixel columns during an amplification phase, the first storage element and the second storage element are coupled to the first and second amplifier inputs, respectively, with the result that the amplifier offset is canceled from the amplifier output.Type: ApplicationFiled: July 13, 2007Publication date: January 15, 2009Applicant: MICRON TECHNOLOGY, INC.Inventors: Espen A. Olsen, Chiajen M. Lee, Christopher Zeleznik
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Publication number: 20080309800Abstract: Methods and circuits for reducing noise for a passive pixel sensor (PPS) array of an image sensor are described. A noise reduction circuit includes a noise reduction integrator circuit configured to detect a potential voltage of a column line of the PPS array and generate a potential voltage substantially equal to the potential voltage of the column line. The noise reduction circuit also includes a conductor line oriented longitudinally along the column line and configured to receive the generated potential voltage from the noise reduction integrator circuit. The conductor line is placed at a potential voltage that is the same as the potential voltage of the column line. A parasitic capacitance formed between the conductor line and the column line is substantially reduced.Type: ApplicationFiled: June 18, 2007Publication date: December 18, 2008Applicant: MICRON TECHNOLOGY, INC.Inventors: Alf Olsen, Espen A Olsen