Abstract: A lightwall instrument for photographic purposes includes a supporting frame, a light source, a diffuser wall, and one or more shading walls. The position of the light source is adjustable. The shape of the diffuser wall is selectively changed for different effects. The present invention provides a convenient and flexible lightwall instrument for better effect of photographs or films. The light generated by the lightwall instrument is soft, even, and saturated. The effects are highly adjustable. The operation is easy.

Abstract: An album includes a front cover panel, a back cover panel, and a spine panel extending between the front and the back cover panels edge-to-edge. A folding arrangement, which couples between a last album page and the back cover panel, includes a flexible sheet having two longitudinal edges coupling at an outer side of last album page and an inner side of the back cover panel to retain the last album page being overlapped on the back cover panel in a slidably movable manner. When the album is folded at an opened position, the front cover panel, the spine panel, and the back cover panel are aligned to form a planer backing for providing a completely plane on the surface of the album.

Abstract: One embodiment of the invention includes a system for overriding an operation of an electronic device. The system includes an override hardware logic that is communicatively coupled with a monitoring system. The monitoring system can output an electronic command signal in response to a detected point of failure associated with the system. In response to receiving the electronic command signal, the override hardware logic can override the operation performed by the electronic device in order to compensate for the detected point of failure.

Abstract: A system and method using inverse-vector processing to iterate through a loop of three steps: set a guide direction, invert opposite vectors, and average vectors to update the guide direction, for smoothing seismic amplitude data. The inverse-vector method can overcome instabilities where the traditional structure-tensor approach fails. The inverse-vector smoothing is simple to implement and more computational efficient. The resultant dips and azimuths are spatially consistent and thus more interpretable and suitable for calculation of curvature and other dip based attributes.

Abstract: A method and system for reliability similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, and determining a first reliability associated with the first plurality of semiconductor devices. The first reliability is represented by at least a first probability density function. Additionally, the method includes determining a second reliability associated with the second plurality of semiconductor devices. The second reliability is represented by at least a second probability density function. Moreover, the method includes processing information associated with the first probability density function and the second probability density function, and determining a numerical number based on at least information associated with the first probability density function and the second probability density function.

Abstract: A system and method use 2D and 3D numerical gradient operators for reducing anisotropic inaccuracies in digital image processing. Enhanced isotropic operators are derived by first parameterizing corresponding numerical operators, followed by determining the parameters for the operators by matching analytical gradients with numerical gradients, which produces generic frequency-independent operators. The system and method also optimize the design of operators for use at any given frequency range needed for any special purpose application.

Abstract: A system and method using inverse-vector processing to iterate through a loop of three steps: set a guide direction, invert opposite vectors, and average vectors to update the guide direction, for smoothing seismic amplitude data. The inverse-vector method can overcome instabilities where the traditional structure-tensor approach fails. The inverse-vector smoothing is simple to implement and more computational efficient. The resultant dips and azimuths are spatially consistent and thus more interpretable and suitable for calculation of curvature and other dip based attributes.

Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.

Abstract: A system and method for using a single shared buffer to service multiple destinations for a telecommunications switch is disclosed. Upon receiving a cell of data to be sent to a destination, an interface stores the cell in a shared buffer. The address of the cell in the buffer is stored in a queue array. The address of the buffer address in the queue array is stored in a head array and a tail array. A threshold register tracks the global threshold for the total number of cells in the shared buffer and a destination threshold for each destination. The buffer can broadcast a data cell to a single location or send the same cell to multiple locations.

Abstract: A method and system for interfacing to an electronic device is disclosed. A service provider may receive a request from the electronic device to determine whether any of the specified mobile terminals may be within a specified range of the electronic device. The range may be a default value and/or specified by a user of the electronic device. The service provider may communicate to the electronic device whether any of the specified mobile terminals may be within the specified range. If so, the service provider may communicate information regarding the location of the mobile terminals within range. The service provider may also communicate to the electronic device a map on which the mobile terminals may be placed.

Abstract: A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.

Abstract: Virtual local area network (VLAN) identifications (VIDs) used in a local area network (LAN) are identified. The LAN is connected to a connection-oriented wide area network (WAN). Each VLAN supports multiple priorities. For each VID, each of the priorities is mapped to a service type available in the WAN. Virtual connections (VCs) are set up based using a combination of the VID and the mapping of the priorities to the service types.

Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.

Abstract: A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.

Abstract: A method and system for reliability similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, and determining a first reliability associated with the first plurality of semiconductor devices. The first reliability is represented by at least a first probability density function. Additionally, the method includes determining a second reliability associated with the second plurality of semiconductor devices. The second reliability is represented by at least a second probability density function. Moreover, the method includes processing information associated with the first probability density function and the second probability density function, and determining a numerical number based on at least information associated with the first probability density function and the second probability density function.

Abstract: A network with mobile devices supports localization and customization. A mobile device performs localization and customization using update packages retrieved from a SIM/Smart card in the mobile device or downloaded from a content server or a DM server. This facilitates localization of mobile devices using SIM/Smart cards that are manufactured for a location/locale/country with a different language/culture from the place where it is used the first time.

Abstract: A method and system for calibrating a plurality of measurement systems. The method includes obtaining a first plurality of calibration standards. The first plurality of calibration standards is associated with a plurality of predetermined values. Additionally, the method includes measuring the first plurality of calibration standards by a plurality of measurement systems to obtain a first plurality of measured values, processing information associated with the first plurality of measured values, and selecting a first measurement system from the plurality of measurement systems based on at least information associated with the first plurality of measured values. Moreover, the method includes calibrating the first measurement system with the first plurality of calibration standards, obtaining a second plurality of calibration standards, and measuring the second plurality of calibration standards by the first measurement system to obtain a second plurality of measured values.

Abstract: A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, and obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices. Additionally, the method includes performing a first statistical analysis, determining a first statistical distribution, performing a second statistical analysis, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.

Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.

Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.