Abstract: A comparator apparatus for comparing a first and a second voltage input includes a pair of cross-coupled inverter devices, including a pull up device and a pull down device, with output nodes defined between the pull up and pull down devices. A first switching device is coupled to the first input and a second switching device is coupled to the second input, with control circuitry configured for selective switching between a reset mode and a compare mode. In the reset mode, the first and second voltage inputs are coupled to respective output nodes so as to develop a differential signal thereacross, and the pull down devices in each inverter are isolated from the pull up devices. In the compare mode, the voltage inputs are isolated from the output nodes, and the pull down devices in each inverter are coupled to the pull up devices to latch the output nodes.

Abstract: An inverting circuit comprises a first inverter in a main path having a first input and a common ouput. A second inverter receives the first input and is coupled with a first voltage controlled pass gate to the common output. A third inverter couples a second input to the common output using a second voltage controlled pass gate. A fourth inverter couples the second input to the common output using the first voltage controlled pass gate. A ring oscillator is formed using a number N of the inverting circuits with each common output coupled to the first inputs forming a main ring of a ring oscillator. The second inputs are coupled to feed-forward signals from selected outputs. The resulting signals at the common outputs are an interpolation of the first and second input signals modulated by a control voltage coupled to the first and second pass gates.

Abstract: A method and apparatus for determining data signal jitter via asynchronous sampling provides a low cost and production-integrable mechanism for measuring data signal jitter. The data signal is edge-detected and sampled by a sampling clock of unrelated frequency the sampled values are collected in a histogram according to a folding of the samples around a timebase. The timebase is determined by sweeping to detect a minimum jitter for the folded data. The histogram for the correct estimated timebase period is representative of the probability density function of the location of data signal edges and the jitter characteristics are determined by the width and shape of the density function peaks. Frequency drift can be corrected by adjusting the timebase used to fold the data across the sample set.

Abstract: A sequence of K voltage samples of a transmitted data signal is generated by sampling, digitizing, and storing voltage samples of the data signal with an imbedded sample clock on an IC having an unknown period TS. The K voltage samples are plotted against a time base of K sequential times TB[K] normalized so all samples fall within one cycle of the data clock used to generate the data signal or a unit time of 1. The time base is generated by estimating the sample clock period TSE to be some multiple of 1/P where P is greater than K. Eye diagrams are analyzed for time jitter wherein only the minimum value of jitter is saved. TSE is incremented by 1/P until TS is greater than one half the data clock period. The eye diagram at the TSE with the minimum time jitter is used to analyze the data channels.

Abstract: A method and apparatus for fail-safe and restartable system clock generation provides recovery from failures due to incorrect clock generator settings or from marginal clock distribution components. Clock failure is detected at a point along the clock distribution path between the output of the clock generator and the downstream circuits. If a clock failure is detected, a second clock, which may be the clock generator reference clock, is used to operate the downstream circuits. The clock generator, which may be a phase-lock loop, is then restarted, either with a predetermined loop filter voltage at which downstream circuits are guaranteed to operate, or with a divider setting on the output of the clock generator that reduces the frequency so that downstream circuits are guaranteed to operate. Parameters of the clock generator can thereby be reset and operating conditions determined before restoring the output of the clock generator to the downstream circuits.

Abstract: A method and apparatus for determining jitter and pulse width from clock signal comparisons provides a low cost and production-integrable mechanism for measuring a clock signal with a reference clock, both of unknown frequency. The measured clock signal is sampled at transitions of a reference clock and the sampled values are collected in a histogram according to a folding of the samples around a timebase which is either swept to detect a minimum jitter for the folded data or is obtained from direct frequency analysis for the sample set. The histogram for the correct estimated period is statistically analyzed to yield the pulse width, which is the difference between the peaks of the probability density function and jitter, which corresponds to width of the density function peaks. Frequency drift is corrected by adjusting the timebase used to fold the data across the sample set.

Abstract: A pseudo Set/Reset latch circuit is configured with modified NOR or NAND gates wherein one of the series pull-up devices or pull-down devices is removed. A minimum of three pseudo Set/Reset latches may be coupled as a ring oscillator generating an output and a non-skewed complementary output. Additionally, feed-forward inverting stages may be coupled in parallel with inverting paths in the ring oscillator primary path to further increase the frequency range of the ring oscillator. The pseudo Set/Reset latch circuits and the feed-forward inverting stages may be configured with voltage controlled devices that alter the delay of the stages as a means for varying the frequency of the ring oscillator either by varying the current drive of the circuitry driving the output of the latch stages or by varying the conductance of devices coupling between the latch stages. Feedforward inverting stages may comprise pseudo latches or inverter gates.